Defect structure of TiS3 single crystals with different resistivity

A defect structure of single-crystal whiskers TiS 3 with different resistivity has been studied by the high resolution scanning transmission electron microscopy. The whiskers crystallize in one monoclinic lattice, but in two variants, A and B. The high-resistivity whiskers crystallize according to t...

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Veröffentlicht in:	Journal of materials science 2021, Vol.56 (3), p.2150-2162
Hauptverfasser:	Trunkin, I. N., Gorlova, I. G., Bolotina, N. B., Bondarenko, V. I., Chesnokov, Y. M., Vasiliev, A. L.
Format:	Artikel
Sprache:	eng
Schlagworte:	Characterization and Evaluation of Materials Chemical Routes to Materials Chemistry and Materials Science Classical Mechanics Crystal defects Crystal structure Crystallography and Scattering Methods Crystals Density Electrical resistivity Lattice vacancies Materials Science Monoclinic lattice Polymer Sciences Scanning transmission electron microscopy Single crystals Solid Mechanics Temperature dependence Twin boundaries Twinning
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