FPGA-Based Reliable Fault Secure Design for Protection against Single and Multiple Soft Errors

Field programmable gate arrays (FPGAs) are increasingly used in industry (e.g., biomedical, space, and automotive industries). FPGAs are subjected to single, as well as multiple event upsets (SEUs and MEUs), due to the continuous shrinking of transistor dimensions. These upsets inevitably decrease s...

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Veröffentlicht in:	Electronics (Basel) 2020-12, Vol.9 (12), p.2064
Hauptverfasser:	Shaker, Manar N., Hussien, Ahmed, Alkady, Gehad I., Amer, Hassanein H., Adly, Ihab
Format:	Artikel
Sprache:	eng
Schlagworte:	Design Embedded systems Error correction & detection Error detection and recovery Failure Fault tolerance Field programmable gate arrays Reconfiguration Redundancy Soft errors System reliability Transistors
Online-Zugang:	Volltext
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