Gallium nitride formation in liquid metal sonication
With growing research interest in liquid metals, such as Ga and Ga-based alloys, understanding their behaviours at reduced dimensions is becoming of more fundamental significance, especially for exploiting their properties in a variety of applications. Mechanical sonication is a common technique use...
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Veröffentlicht in: | Journal of materials chemistry. C, Materials for optical and electronic devices Materials for optical and electronic devices, 2020-12, Vol.8 (46), p.16593-1662 |
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Hauptverfasser: | , , , , , , , , , |
Format: | Artikel |
Sprache: | eng |
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Zusammenfassung: | With growing research interest in liquid metals, such as Ga and Ga-based alloys, understanding their behaviours at reduced dimensions is becoming of more fundamental significance, especially for exploiting their properties in a variety of applications. Mechanical sonication is a common technique used for micronising bulk liquid metals into smaller sized particles. One distinct characteristic of Ga and Ga-based liquid metal alloy particles, micronised
via
sonication, is the formation of native oxygen species such as GaOOH and Ga
2
O
3
. However, the nitridation of these particles has not been reported. In this work, we demonstrate a room temperature nitridation process during the micronisation of eutectic Ga-In alloy (EGaIn). Characterisations reveal that the sonication in the N-containing precursors of PVP and N
2
results in the formation of GaN within the GaOOH crystallites that separate themselves from the bulk of EGaIn during sonication. As a model example of the applicability of such particles, low-detection-limit biosensing by photoluminescence of the obtained particles is demonstrated. The work shows a room temperature pathway for the creation of GaN that can be further investigated, expanded upon, and implemented for different future applications.
This work presents the room temperature nitridation of gallium-based liquid metal alloy particles during sonication. |
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ISSN: | 2050-7526 2050-7534 |
DOI: | 10.1039/d0tc04302h |