Three-dimensional Analysis of Materials at Multiple Length Scales
Gespeichert in:
| Veröffentlicht in: | Microscopy and microanalysis 2020-08, Vol.26 (S2), p.1680-1682 |
|---|---|
| Hauptverfasser: | , , , , , , , , , |
| Format: | Artikel |
| Sprache: | eng |
| Schlagworte: | |
| Online-Zugang: | Volltext |
| Tags: |
Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
|
| container_end_page | 1682 |
|---|---|
| container_issue | S2 |
| container_start_page | 1680 |
| container_title | Microscopy and microanalysis |
| container_volume | 26 |
| creator | Sugar, Joshua Bartelt, Norm Robinson, David Antoun, Bonnie Marchi, Chris San Smith, Thale Alleman, Coleman Ding, Hanping Ding, Dong Vitale, Suzy |
| description | |
| doi_str_mv | 10.1017/S1431927620018954 |
| format | Article |
| fullrecord | <record><control><sourceid>proquest_cross</sourceid><recordid>TN_cdi_proquest_journals_2465677629</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><cupid>10_1017_S1431927620018954</cupid><sourcerecordid>2465677629</sourcerecordid><originalsourceid>FETCH-LOGICAL-c2274-c8869b08e7d06960bfb35addba8211ea2b03badd082a1ab6ff1e4d23233ad2a23</originalsourceid><addsrcrecordid>eNp1UMtOwzAQtBBIlMIHcLPEObBrJ05yrCpeUioOLefIjjetq7Qpdnro3-PSShwQl33OjHaHsXuERwTMn-aYSixFrgQAFmWWXrBRHGVJgZhd_tSYHPfX7CaENQBIyNWITRYrT5RYt6FtcP1Wd3wSwyG4wPuWz_RA3ukucD3w2b4b3K4jXtF2Oaz4vNEdhVt21UYA3Z3zmH2-PC-mb0n18fo-nVRJI0SeJk1RqNJAQbkFVSowrZGZttboQiCSFgakiT0UQqM2qm2RUiukkFJboYUcs4eT7s73X3sKQ73u9z7eGmqRqkzl8fcyovCEanwfgqe23nm30f5QI9RHp-o_TkWOPHP0xnhnl_Qr_T_rG2-KagE</addsrcrecordid><sourcetype>Aggregation Database</sourcetype><iscdi>true</iscdi><recordtype>article</recordtype><pqid>2465677629</pqid></control><display><type>article</type><title>Three-dimensional Analysis of Materials at Multiple Length Scales</title><source>Cambridge University Press Journals Complete</source><creator>Sugar, Joshua ; Bartelt, Norm ; Robinson, David ; Antoun, Bonnie ; Marchi, Chris San ; Smith, Thale ; Alleman, Coleman ; Ding, Hanping ; Ding, Dong ; Vitale, Suzy</creator><creatorcontrib>Sugar, Joshua ; Bartelt, Norm ; Robinson, David ; Antoun, Bonnie ; Marchi, Chris San ; Smith, Thale ; Alleman, Coleman ; Ding, Hanping ; Ding, Dong ; Vitale, Suzy</creatorcontrib><identifier>ISSN: 1431-9276</identifier><identifier>EISSN: 1435-8115</identifier><identifier>DOI: 10.1017/S1431927620018954</identifier><language>eng</language><publisher>New York, USA: Cambridge University Press</publisher><subject>Dimensional analysis ; FIB-SEM Technology and Electron Tomography for Materials Science and Engineering ; Mathematical analysis ; Three dimensional analysis</subject><ispartof>Microscopy and microanalysis, 2020-08, Vol.26 (S2), p.1680-1682</ispartof><rights>Copyright © Microscopy Society of America 2020</rights><lds50>peer_reviewed</lds50><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed><cites>FETCH-LOGICAL-c2274-c8869b08e7d06960bfb35addba8211ea2b03badd082a1ab6ff1e4d23233ad2a23</cites></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://www.cambridge.org/core/product/identifier/S1431927620018954/type/journal_article$$EHTML$$P50$$Gcambridge$$H</linktohtml><link.rule.ids>164,314,780,784,27924,27925,55628</link.rule.ids></links><search><creatorcontrib>Sugar, Joshua</creatorcontrib><creatorcontrib>Bartelt, Norm</creatorcontrib><creatorcontrib>Robinson, David</creatorcontrib><creatorcontrib>Antoun, Bonnie</creatorcontrib><creatorcontrib>Marchi, Chris San</creatorcontrib><creatorcontrib>Smith, Thale</creatorcontrib><creatorcontrib>Alleman, Coleman</creatorcontrib><creatorcontrib>Ding, Hanping</creatorcontrib><creatorcontrib>Ding, Dong</creatorcontrib><creatorcontrib>Vitale, Suzy</creatorcontrib><title>Three-dimensional Analysis of Materials at Multiple Length Scales</title><title>Microscopy and microanalysis</title><addtitle>Microsc Microanal</addtitle><subject>Dimensional analysis</subject><subject>FIB-SEM Technology and Electron Tomography for Materials Science and Engineering</subject><subject>Mathematical analysis</subject><subject>Three dimensional analysis</subject><issn>1431-9276</issn><issn>1435-8115</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2020</creationdate><recordtype>article</recordtype><sourceid>ABUWG</sourceid><sourceid>AFKRA</sourceid><sourceid>AZQEC</sourceid><sourceid>BENPR</sourceid><sourceid>CCPQU</sourceid><sourceid>DWQXO</sourceid><sourceid>GNUQQ</sourceid><recordid>eNp1UMtOwzAQtBBIlMIHcLPEObBrJ05yrCpeUioOLefIjjetq7Qpdnro3-PSShwQl33OjHaHsXuERwTMn-aYSixFrgQAFmWWXrBRHGVJgZhd_tSYHPfX7CaENQBIyNWITRYrT5RYt6FtcP1Wd3wSwyG4wPuWz_RA3ukucD3w2b4b3K4jXtF2Oaz4vNEdhVt21UYA3Z3zmH2-PC-mb0n18fo-nVRJI0SeJk1RqNJAQbkFVSowrZGZttboQiCSFgakiT0UQqM2qm2RUiukkFJboYUcs4eT7s73X3sKQ73u9z7eGmqRqkzl8fcyovCEanwfgqe23nm30f5QI9RHp-o_TkWOPHP0xnhnl_Qr_T_rG2-KagE</recordid><startdate>20200801</startdate><enddate>20200801</enddate><creator>Sugar, Joshua</creator><creator>Bartelt, Norm</creator><creator>Robinson, David</creator><creator>Antoun, Bonnie</creator><creator>Marchi, Chris San</creator><creator>Smith, Thale</creator><creator>Alleman, Coleman</creator><creator>Ding, Hanping</creator><creator>Ding, Dong</creator><creator>Vitale, Suzy</creator><general>Cambridge University Press</general><general>Oxford University Press</general><scope>AAYXX</scope><scope>CITATION</scope><scope>3V.</scope><scope>7QO</scope><scope>7RV</scope><scope>7TK</scope><scope>7X7</scope><scope>7XB</scope><scope>88E</scope><scope>8FD</scope><scope>8FE</scope><scope>8FG</scope><scope>8FH</scope><scope>8FI</scope><scope>8FJ</scope><scope>8FK</scope><scope>ABUWG</scope><scope>AFKRA</scope><scope>ARAPS</scope><scope>AZQEC</scope><scope>BBNVY</scope><scope>BENPR</scope><scope>BGLVJ</scope><scope>BHPHI</scope><scope>CCPQU</scope><scope>DWQXO</scope><scope>FR3</scope><scope>FYUFA</scope><scope>GHDGH</scope><scope>GNUQQ</scope><scope>HCIFZ</scope><scope>K9.</scope><scope>KB0</scope><scope>LK8</scope><scope>M0S</scope><scope>M1P</scope><scope>M7P</scope><scope>NAPCQ</scope><scope>P5Z</scope><scope>P62</scope><scope>P64</scope><scope>PQEST</scope><scope>PQQKQ</scope><scope>PQUKI</scope><scope>PRINS</scope></search><sort><creationdate>20200801</creationdate><title>Three-dimensional Analysis of Materials at Multiple Length Scales</title><author>Sugar, Joshua ; Bartelt, Norm ; Robinson, David ; Antoun, Bonnie ; Marchi, Chris San ; Smith, Thale ; Alleman, Coleman ; Ding, Hanping ; Ding, Dong ; Vitale, Suzy</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c2274-c8869b08e7d06960bfb35addba8211ea2b03badd082a1ab6ff1e4d23233ad2a23</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2020</creationdate><topic>Dimensional analysis</topic><topic>FIB-SEM Technology and Electron Tomography for Materials Science and Engineering</topic><topic>Mathematical analysis</topic><topic>Three dimensional analysis</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Sugar, Joshua</creatorcontrib><creatorcontrib>Bartelt, Norm</creatorcontrib><creatorcontrib>Robinson, David</creatorcontrib><creatorcontrib>Antoun, Bonnie</creatorcontrib><creatorcontrib>Marchi, Chris San</creatorcontrib><creatorcontrib>Smith, Thale</creatorcontrib><creatorcontrib>Alleman, Coleman</creatorcontrib><creatorcontrib>Ding, Hanping</creatorcontrib><creatorcontrib>Ding, Dong</creatorcontrib><creatorcontrib>Vitale, Suzy</creatorcontrib><collection>CrossRef</collection><collection>ProQuest Central (Corporate)</collection><collection>Biotechnology Research Abstracts</collection><collection>Nursing & Allied Health Database</collection><collection>Neurosciences Abstracts</collection><collection>Health & Medical Collection</collection><collection>ProQuest Central (purchase pre-March 2016)</collection><collection>Medical Database (Alumni Edition)</collection><collection>Technology Research Database</collection><collection>ProQuest SciTech Collection</collection><collection>ProQuest Technology Collection</collection><collection>ProQuest Natural Science Collection</collection><collection>Hospital Premium Collection</collection><collection>Hospital Premium Collection (Alumni Edition)</collection><collection>ProQuest Central (Alumni) (purchase pre-March 2016)</collection><collection>ProQuest Central (Alumni Edition)</collection><collection>ProQuest Central UK/Ireland</collection><collection>Advanced Technologies & Aerospace Collection</collection><collection>ProQuest Central Essentials</collection><collection>Biological Science Collection</collection><collection>ProQuest Central</collection><collection>Technology Collection</collection><collection>Natural Science Collection</collection><collection>ProQuest One Community College</collection><collection>ProQuest Central Korea</collection><collection>Engineering Research Database</collection><collection>Health Research Premium Collection</collection><collection>Health Research Premium Collection (Alumni)</collection><collection>ProQuest Central Student</collection><collection>SciTech Premium Collection</collection><collection>ProQuest Health & Medical Complete (Alumni)</collection><collection>Nursing & Allied Health Database (Alumni Edition)</collection><collection>ProQuest Biological Science Collection</collection><collection>Health & Medical Collection (Alumni Edition)</collection><collection>Medical Database</collection><collection>Biological Science Database</collection><collection>Nursing & Allied Health Premium</collection><collection>Advanced Technologies & Aerospace Database</collection><collection>ProQuest Advanced Technologies & Aerospace Collection</collection><collection>Biotechnology and BioEngineering Abstracts</collection><collection>ProQuest One Academic Eastern Edition (DO NOT USE)</collection><collection>ProQuest One Academic</collection><collection>ProQuest One Academic UKI Edition</collection><collection>ProQuest Central China</collection><jtitle>Microscopy and microanalysis</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Sugar, Joshua</au><au>Bartelt, Norm</au><au>Robinson, David</au><au>Antoun, Bonnie</au><au>Marchi, Chris San</au><au>Smith, Thale</au><au>Alleman, Coleman</au><au>Ding, Hanping</au><au>Ding, Dong</au><au>Vitale, Suzy</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Three-dimensional Analysis of Materials at Multiple Length Scales</atitle><jtitle>Microscopy and microanalysis</jtitle><addtitle>Microsc Microanal</addtitle><date>2020-08-01</date><risdate>2020</risdate><volume>26</volume><issue>S2</issue><spage>1680</spage><epage>1682</epage><pages>1680-1682</pages><issn>1431-9276</issn><eissn>1435-8115</eissn><cop>New York, USA</cop><pub>Cambridge University Press</pub><doi>10.1017/S1431927620018954</doi><tpages>3</tpages><oa>free_for_read</oa></addata></record> |
| fulltext | fulltext |
| identifier | ISSN: 1431-9276 |
| ispartof | Microscopy and microanalysis, 2020-08, Vol.26 (S2), p.1680-1682 |
| issn | 1431-9276 1435-8115 |
| language | eng |
| recordid | cdi_proquest_journals_2465677629 |
| source | Cambridge University Press Journals Complete |
| subjects | Dimensional analysis FIB-SEM Technology and Electron Tomography for Materials Science and Engineering Mathematical analysis Three dimensional analysis |
| title | Three-dimensional Analysis of Materials at Multiple Length Scales |
| url | https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2024-12-30T21%3A56%3A01IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-proquest_cross&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.genre=article&rft.atitle=Three-dimensional%20Analysis%20of%20Materials%20at%20Multiple%20Length%20Scales&rft.jtitle=Microscopy%20and%20microanalysis&rft.au=Sugar,%20Joshua&rft.date=2020-08-01&rft.volume=26&rft.issue=S2&rft.spage=1680&rft.epage=1682&rft.pages=1680-1682&rft.issn=1431-9276&rft.eissn=1435-8115&rft_id=info:doi/10.1017/S1431927620018954&rft_dat=%3Cproquest_cross%3E2465677629%3C/proquest_cross%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_pqid=2465677629&rft_id=info:pmid/&rft_cupid=10_1017_S1431927620018954&rfr_iscdi=true |