Contactless measurement of sheet resistance and mobility of inversion charge carriers on photovoltaic wafers

A new application of the differential junction photovoltage (diff-JPV) measurement technique is introduced. The technique's capability to determine the sheet resistance of charge carriers in inversion layers Rs,inv for silicon wafers coated by different dielectrics is investigated. The dielectr...

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Veröffentlicht in:	Solar energy materials and solar cells 2020-12, Vol.218, p.110766, Article 110766
Hauptverfasser:	Korsós, Ferenc, László, Géza, Tüttő, Péter, Dubois, Sebastien, Enjalbert, Nicolas, Kis-Szabó, Krisztián, Tóth, Attila
Format:	Artikel
Sprache:	eng
Schlagworte:	Carrier mobility Current carriers Dielectrics Electrical resistivity Fabrication Fixed charges Inversion Inversion layer Inversion layers Junction photovoltage Measurement techniques Mobility Morphology Photovoltaic cells Photovoltaics Production lines Sheet resistance Silicon wafers Solar cells Surface charge Wafers
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