TEM analysis of whiskers formation over tin-plated films

Whiskers grown from tin films plated on brass plates were examined by transmission electron microscopy. After plating, the tin film, which was held at 323 K for five days, was composed of an amorphous phase and spherical β-Sn particles. The amorphous phase formed immediately upon plating, while afte...

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Veröffentlicht in:	Materials chemistry and physics 2020-09, Vol.251, p.122985, Article 122985
Hauptverfasser:	Otsubo, Fumitaka, Era, Hidenori, Tsuru, Yutaka, Hirano, Shigeru
Format:	Artikel
Sprache:	eng
Schlagworte:	Brass plating Core shell structure Crystallization Crystals Deformation Fine oxide Oxide coatings Regeneration Single crystals Surface layers Tin Tin dioxide Tin plating Transmission electron microscopy Whisker
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