Electromagnetic pulse welding of Al/Cu dissimilar materials: Microstructure and tensile properties
The aim of this study was to characterize detailed interfacial microstructures and evaluate tensile properties of Al6061-to-Cu dissimilar welded joints via electromagnetic pulse welding (EMPW) at different discharge voltages. The EMPWed joints consisted of annular weld zone and central non-weld zone...
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Veröffentlicht in: | Materials science & engineering. A, Structural materials : properties, microstructure and processing Structural materials : properties, microstructure and processing, 2020-08, Vol.792, p.139842, Article 139842 |
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container_title | Materials science & engineering. A, Structural materials : properties, microstructure and processing |
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creator | Wang, P.Q. Chen, D.L. Ran, Y. Yan, Y.Q. She, X.W. Peng, H. Jiang, X.Q. |
description | The aim of this study was to characterize detailed interfacial microstructures and evaluate tensile properties of Al6061-to-Cu dissimilar welded joints via electromagnetic pulse welding (EMPW) at different discharge voltages. The EMPWed joints consisted of annular weld zone and central non-weld zone. The outer and inner regions of annular weld zone exhibited mainly diffusion bonding and mechanical interlocking, respectively, representing a well-bonded interface. Distinctive discontinuous “droplet-like” pseudo-eutectic (α-Al + Al2Cu) particles or patches were observed to eject in the adjacent transition region in the non-weld zone. The highly non-equilibrium eutectic-like liquid or slurry at the Al/Cu interface was formed due to the ultra-high strain rate experienced by the interface and the ensuing instant temperature rise beyond the eutectic temperature of Al–Cu system, when the high-velocity flyer Al sheet crashed into the fixed Cu sheet driven by the Lorentz force during EMPW. The interfacial diffusion layer was thin in the order of 1–2 μm. The higher the discharge voltage was, the more obvious the interfacial diffusion layer and mechanical interlocking were, with “wave-like” and “inverted hook-like” interfacial characteristics observed. While interfacial failure occurred during the tensile lap shear tests for the joints made at a discharge voltage of 12 kV, the failure loads were still significantly higher than those specified in the AWS D17.2 standard. The EMPWed joints made at 14 kV and 16 kV remained intact and only base metal failure occurred, with the tensile lap shear failure loads reaching over twice those specified in the AWS D17.2 standard. Thus the well-bonded robust Al/Cu dissimilar welds were successfully achieved via EMPW. |
doi_str_mv | 10.1016/j.msea.2020.139842 |
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The EMPWed joints consisted of annular weld zone and central non-weld zone. The outer and inner regions of annular weld zone exhibited mainly diffusion bonding and mechanical interlocking, respectively, representing a well-bonded interface. Distinctive discontinuous “droplet-like” pseudo-eutectic (α-Al + Al2Cu) particles or patches were observed to eject in the adjacent transition region in the non-weld zone. The highly non-equilibrium eutectic-like liquid or slurry at the Al/Cu interface was formed due to the ultra-high strain rate experienced by the interface and the ensuing instant temperature rise beyond the eutectic temperature of Al–Cu system, when the high-velocity flyer Al sheet crashed into the fixed Cu sheet driven by the Lorentz force during EMPW. The interfacial diffusion layer was thin in the order of 1–2 μm. The higher the discharge voltage was, the more obvious the interfacial diffusion layer and mechanical interlocking were, with “wave-like” and “inverted hook-like” interfacial characteristics observed. While interfacial failure occurred during the tensile lap shear tests for the joints made at a discharge voltage of 12 kV, the failure loads were still significantly higher than those specified in the AWS D17.2 standard. The EMPWed joints made at 14 kV and 16 kV remained intact and only base metal failure occurred, with the tensile lap shear failure loads reaching over twice those specified in the AWS D17.2 standard. Thus the well-bonded robust Al/Cu dissimilar welds were successfully achieved via EMPW.</description><identifier>ISSN: 0921-5093</identifier><identifier>EISSN: 1873-4936</identifier><identifier>DOI: 10.1016/j.msea.2020.139842</identifier><language>eng</language><publisher>Lausanne: Elsevier B.V</publisher><subject>Al/Cu dissimilar joint ; Aluminum base alloys ; Base metal ; Copper ; Diffusion layers ; Discharge ; Dissimilar material joining ; Dissimilar materials ; Effective bonding area ; Electric potential ; Electromagnetic pulse welding ; Eutectic temperature ; Failure ; High strain rate ; Interfacial microstructure ; Locking ; Lorentz force ; Shear tests ; Tensile lap shear failure load ; Tensile properties ; Voltage ; Welded joints ; Welding</subject><ispartof>Materials science & engineering. A, Structural materials : properties, microstructure and processing, 2020-08, Vol.792, p.139842, Article 139842</ispartof><rights>2020 Elsevier B.V.</rights><rights>Copyright Elsevier BV Aug 5, 2020</rights><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c394t-23caf7d69f347b760eb226179a90db6e1e5ef76ae5a296830201258d2861108d3</citedby><cites>FETCH-LOGICAL-c394t-23caf7d69f347b760eb226179a90db6e1e5ef76ae5a296830201258d2861108d3</cites></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://dx.doi.org/10.1016/j.msea.2020.139842$$EHTML$$P50$$Gelsevier$$H</linktohtml><link.rule.ids>314,777,781,3537,27905,27906,45976</link.rule.ids></links><search><creatorcontrib>Wang, P.Q.</creatorcontrib><creatorcontrib>Chen, D.L.</creatorcontrib><creatorcontrib>Ran, Y.</creatorcontrib><creatorcontrib>Yan, Y.Q.</creatorcontrib><creatorcontrib>She, X.W.</creatorcontrib><creatorcontrib>Peng, H.</creatorcontrib><creatorcontrib>Jiang, X.Q.</creatorcontrib><title>Electromagnetic pulse welding of Al/Cu dissimilar materials: Microstructure and tensile properties</title><title>Materials science & engineering. A, Structural materials : properties, microstructure and processing</title><description>The aim of this study was to characterize detailed interfacial microstructures and evaluate tensile properties of Al6061-to-Cu dissimilar welded joints via electromagnetic pulse welding (EMPW) at different discharge voltages. The EMPWed joints consisted of annular weld zone and central non-weld zone. The outer and inner regions of annular weld zone exhibited mainly diffusion bonding and mechanical interlocking, respectively, representing a well-bonded interface. Distinctive discontinuous “droplet-like” pseudo-eutectic (α-Al + Al2Cu) particles or patches were observed to eject in the adjacent transition region in the non-weld zone. The highly non-equilibrium eutectic-like liquid or slurry at the Al/Cu interface was formed due to the ultra-high strain rate experienced by the interface and the ensuing instant temperature rise beyond the eutectic temperature of Al–Cu system, when the high-velocity flyer Al sheet crashed into the fixed Cu sheet driven by the Lorentz force during EMPW. The interfacial diffusion layer was thin in the order of 1–2 μm. The higher the discharge voltage was, the more obvious the interfacial diffusion layer and mechanical interlocking were, with “wave-like” and “inverted hook-like” interfacial characteristics observed. While interfacial failure occurred during the tensile lap shear tests for the joints made at a discharge voltage of 12 kV, the failure loads were still significantly higher than those specified in the AWS D17.2 standard. The EMPWed joints made at 14 kV and 16 kV remained intact and only base metal failure occurred, with the tensile lap shear failure loads reaching over twice those specified in the AWS D17.2 standard. Thus the well-bonded robust Al/Cu dissimilar welds were successfully achieved via EMPW.</description><subject>Al/Cu dissimilar joint</subject><subject>Aluminum base alloys</subject><subject>Base metal</subject><subject>Copper</subject><subject>Diffusion layers</subject><subject>Discharge</subject><subject>Dissimilar material joining</subject><subject>Dissimilar materials</subject><subject>Effective bonding area</subject><subject>Electric potential</subject><subject>Electromagnetic pulse welding</subject><subject>Eutectic temperature</subject><subject>Failure</subject><subject>High strain rate</subject><subject>Interfacial microstructure</subject><subject>Locking</subject><subject>Lorentz force</subject><subject>Shear tests</subject><subject>Tensile lap shear failure load</subject><subject>Tensile properties</subject><subject>Voltage</subject><subject>Welded joints</subject><subject>Welding</subject><issn>0921-5093</issn><issn>1873-4936</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2020</creationdate><recordtype>article</recordtype><recordid>eNp9kEtLxDAUhYMoOI7-AVcB153Jo00bcTMM4wNG3Og6pM3tkNKXSar4702pa1cXLufcc-6H0C0lG0qo2DabzoPeMMLigssiZWdoRYucJ6nk4hytiGQ0yYjkl-jK-4YQQlOSrVB5aKEKbuj0qYdgKzxOrQf8Da2x_QkPNd612_2EjfXedrbVDnc6gLO69ff41VZu8MFNVZgcYN0bHKD3tgU8umEEFyz4a3RRRzXc_M01-ng8vO-fk-Pb08t-d0wqLtOQMF7pOjdC1jzNy1wQKBkTNJdaElMKoJBBnQsNmWZSFDy-SllWGFYISklh-BrdLXdj9OcEPqhmmFwfIxVLBckLkTEeVWxRzc29g1qNznba_ShK1MxSNWpmqWaWamEZTQ-LCWL_LwtO-cpCX4GxLuJTZrD_2X8BORx9lA</recordid><startdate>20200805</startdate><enddate>20200805</enddate><creator>Wang, P.Q.</creator><creator>Chen, D.L.</creator><creator>Ran, Y.</creator><creator>Yan, Y.Q.</creator><creator>She, X.W.</creator><creator>Peng, H.</creator><creator>Jiang, X.Q.</creator><general>Elsevier B.V</general><general>Elsevier BV</general><scope>AAYXX</scope><scope>CITATION</scope><scope>7SR</scope><scope>8BQ</scope><scope>8FD</scope><scope>JG9</scope></search><sort><creationdate>20200805</creationdate><title>Electromagnetic pulse welding of Al/Cu dissimilar materials: Microstructure and tensile properties</title><author>Wang, P.Q. ; Chen, D.L. ; Ran, Y. ; Yan, Y.Q. ; She, X.W. ; Peng, H. ; Jiang, X.Q.</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c394t-23caf7d69f347b760eb226179a90db6e1e5ef76ae5a296830201258d2861108d3</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2020</creationdate><topic>Al/Cu dissimilar joint</topic><topic>Aluminum base alloys</topic><topic>Base metal</topic><topic>Copper</topic><topic>Diffusion layers</topic><topic>Discharge</topic><topic>Dissimilar material joining</topic><topic>Dissimilar materials</topic><topic>Effective bonding area</topic><topic>Electric potential</topic><topic>Electromagnetic pulse welding</topic><topic>Eutectic temperature</topic><topic>Failure</topic><topic>High strain rate</topic><topic>Interfacial microstructure</topic><topic>Locking</topic><topic>Lorentz force</topic><topic>Shear tests</topic><topic>Tensile lap shear failure load</topic><topic>Tensile properties</topic><topic>Voltage</topic><topic>Welded joints</topic><topic>Welding</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Wang, P.Q.</creatorcontrib><creatorcontrib>Chen, D.L.</creatorcontrib><creatorcontrib>Ran, Y.</creatorcontrib><creatorcontrib>Yan, Y.Q.</creatorcontrib><creatorcontrib>She, X.W.</creatorcontrib><creatorcontrib>Peng, H.</creatorcontrib><creatorcontrib>Jiang, X.Q.</creatorcontrib><collection>CrossRef</collection><collection>Engineered Materials Abstracts</collection><collection>METADEX</collection><collection>Technology Research Database</collection><collection>Materials Research Database</collection><jtitle>Materials science & engineering. A, Structural materials : properties, microstructure and processing</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Wang, P.Q.</au><au>Chen, D.L.</au><au>Ran, Y.</au><au>Yan, Y.Q.</au><au>She, X.W.</au><au>Peng, H.</au><au>Jiang, X.Q.</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Electromagnetic pulse welding of Al/Cu dissimilar materials: Microstructure and tensile properties</atitle><jtitle>Materials science & engineering. A, Structural materials : properties, microstructure and processing</jtitle><date>2020-08-05</date><risdate>2020</risdate><volume>792</volume><spage>139842</spage><pages>139842-</pages><artnum>139842</artnum><issn>0921-5093</issn><eissn>1873-4936</eissn><abstract>The aim of this study was to characterize detailed interfacial microstructures and evaluate tensile properties of Al6061-to-Cu dissimilar welded joints via electromagnetic pulse welding (EMPW) at different discharge voltages. The EMPWed joints consisted of annular weld zone and central non-weld zone. The outer and inner regions of annular weld zone exhibited mainly diffusion bonding and mechanical interlocking, respectively, representing a well-bonded interface. Distinctive discontinuous “droplet-like” pseudo-eutectic (α-Al + Al2Cu) particles or patches were observed to eject in the adjacent transition region in the non-weld zone. The highly non-equilibrium eutectic-like liquid or slurry at the Al/Cu interface was formed due to the ultra-high strain rate experienced by the interface and the ensuing instant temperature rise beyond the eutectic temperature of Al–Cu system, when the high-velocity flyer Al sheet crashed into the fixed Cu sheet driven by the Lorentz force during EMPW. The interfacial diffusion layer was thin in the order of 1–2 μm. The higher the discharge voltage was, the more obvious the interfacial diffusion layer and mechanical interlocking were, with “wave-like” and “inverted hook-like” interfacial characteristics observed. While interfacial failure occurred during the tensile lap shear tests for the joints made at a discharge voltage of 12 kV, the failure loads were still significantly higher than those specified in the AWS D17.2 standard. The EMPWed joints made at 14 kV and 16 kV remained intact and only base metal failure occurred, with the tensile lap shear failure loads reaching over twice those specified in the AWS D17.2 standard. Thus the well-bonded robust Al/Cu dissimilar welds were successfully achieved via EMPW.</abstract><cop>Lausanne</cop><pub>Elsevier B.V</pub><doi>10.1016/j.msea.2020.139842</doi></addata></record> |
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subjects | Al/Cu dissimilar joint Aluminum base alloys Base metal Copper Diffusion layers Discharge Dissimilar material joining Dissimilar materials Effective bonding area Electric potential Electromagnetic pulse welding Eutectic temperature Failure High strain rate Interfacial microstructure Locking Lorentz force Shear tests Tensile lap shear failure load Tensile properties Voltage Welded joints Welding |
title | Electromagnetic pulse welding of Al/Cu dissimilar materials: Microstructure and tensile properties |
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