A New Attribute Control Chart Using Multiple Dependent State Repetitive Sampling

In this paper, a new attribute control chart using multiple-dependent state repetitive sampling is designed. The operational procedure and structure of the proposed control chart is given. The required measures to determine the average run length for in-control and out-of-control processes are given...

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Veröffentlicht in:	IEEE access 2017, Vol.5, p.6192-6197
Hauptverfasser:	Aldosari, Mansour Sattam, Aslam, Muhammad, Chi-Hyuck Jun
Format:	Artikel
Sprache:	eng
Schlagworte:	Aerospace electronics average run length binomial distribution Control chart Control charts Data models Electronic mail Length measurement multiple dependent state repetitive sampling Parameter sensitivity Process control Sampling
Online-Zugang:	Volltext
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