A Multi-Loop Slew-Rate-Enhanced NMOS LDO Handling 1-A-Load-Current Step With Fast Transient for 5G Applications
Compact low dropout (LDO) with high current handling capability and superior transient response is gaining increasing attention for the battery-powered 5G mobile applications. In this article, a new multiple-loop design technique for fast-transient response LDO regulator design has been proposed and...
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Veröffentlicht in: | IEEE journal of solid-state circuits 2020-11, Vol.55 (11), p.3076-3086 |
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creator | Li, Kan Yang, Chuanshi Guo, Ting Zheng, Yuanjin |
description | Compact low dropout (LDO) with high current handling capability and superior transient response is gaining increasing attention for the battery-powered 5G mobile applications. In this article, a new multiple-loop design technique for fast-transient response LDO regulator design has been proposed and successfully implemented in a 0.13- \mu \text{m} SOI CMOS process for portable smartphone and tablet PC applications. Its supply current capacity is more than 1 A, and its output voltage is from 1.2 to 1.8 V. The proposed LDO features a 10-mV undershoot and overshoot with 1-A/100-ns load current on a 1- \mu \text{F} output capacitor. This superior transient performance is achieved by embodying a novel frequency compensation scheme without penalty of dc loop gain drop in large load current conditions. The dc loop gain is 60 dB and constant regardless of the fact that the load current varies from 0 to 1 A. This contributes to a small load regulation and line regulation of 0.6 \mu \text{V} /A and 0.23 mV/V, respectively. The LDO consumes 35- \mu \text{A} quiescent current in the mission mode and 5 \mu \text{A} in the standby mode. The LDO silicon size is 325 \mu \text{m}\,\,\times 106 \mu \text{m} . |
doi_str_mv | 10.1109/JSSC.2020.3005789 |
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In this article, a new multiple-loop design technique for fast-transient response LDO regulator design has been proposed and successfully implemented in a 0.13-<inline-formula> <tex-math notation="LaTeX">\mu \text{m} </tex-math></inline-formula> SOI CMOS process for portable smartphone and tablet PC applications. Its supply current capacity is more than 1 A, and its output voltage is from 1.2 to 1.8 V. The proposed LDO features a 10-mV undershoot and overshoot with 1-A/100-ns load current on a 1-<inline-formula> <tex-math notation="LaTeX">\mu \text{F} </tex-math></inline-formula> output capacitor. This superior transient performance is achieved by embodying a novel frequency compensation scheme without penalty of dc loop gain drop in large load current conditions. The dc loop gain is 60 dB and constant regardless of the fact that the load current varies from 0 to 1 A. This contributes to a small load regulation and line regulation of 0.6 <inline-formula> <tex-math notation="LaTeX">\mu \text{V} </tex-math></inline-formula>/A and 0.23 mV/V, respectively. The LDO consumes 35-<inline-formula> <tex-math notation="LaTeX">\mu \text{A} </tex-math></inline-formula> quiescent current in the mission mode and 5 <inline-formula> <tex-math notation="LaTeX">\mu \text{A} </tex-math></inline-formula> in the standby mode. The LDO silicon size is 325 <inline-formula> <tex-math notation="LaTeX">\mu \text{m}\,\,\times </tex-math></inline-formula> 106 <inline-formula> <tex-math notation="LaTeX">\mu \text{m} </tex-math></inline-formula>.]]></description><identifier>ISSN: 0018-9200</identifier><identifier>EISSN: 1558-173X</identifier><identifier>DOI: 10.1109/JSSC.2020.3005789</identifier><identifier>CODEN: IJSCBC</identifier><language>eng</language><publisher>New York: IEEE</publisher><subject>5G mobile communication ; Applications programs ; Bandwidth ; CMOS ; Fast transient ; Feedback loop ; loop stability ; low dropout regulator ; Metal oxide semiconductors ; Mobile computing ; MOS devices ; multi-loop compensation ; Regulation ; Slew rate ; slew rate (SR) ; Stability analysis ; Transient analysis ; Transient performance ; Transient response</subject><ispartof>IEEE journal of solid-state circuits, 2020-11, Vol.55 (11), p.3076-3086</ispartof><rights>Copyright The Institute of Electrical and Electronics Engineers, Inc. (IEEE) 2020</rights><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c293t-b2fac4a53c61db39f5891bc430b1d8d36f33706dc61953222cd4aabcb98138403</citedby><cites>FETCH-LOGICAL-c293t-b2fac4a53c61db39f5891bc430b1d8d36f33706dc61953222cd4aabcb98138403</cites><orcidid>0000-0002-7853-7479 ; 0000-0001-5985-3671 ; 0000-0003-0811-4216 ; 0000-0002-5768-367X</orcidid></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://ieeexplore.ieee.org/document/9138461$$EHTML$$P50$$Gieee$$H</linktohtml><link.rule.ids>314,780,784,796,27924,27925,54758</link.rule.ids><linktorsrc>$$Uhttps://ieeexplore.ieee.org/document/9138461$$EView_record_in_IEEE$$FView_record_in_$$GIEEE</linktorsrc></links><search><creatorcontrib>Li, Kan</creatorcontrib><creatorcontrib>Yang, Chuanshi</creatorcontrib><creatorcontrib>Guo, Ting</creatorcontrib><creatorcontrib>Zheng, Yuanjin</creatorcontrib><title>A Multi-Loop Slew-Rate-Enhanced NMOS LDO Handling 1-A-Load-Current Step With Fast Transient for 5G Applications</title><title>IEEE journal of solid-state circuits</title><addtitle>JSSC</addtitle><description><![CDATA[Compact low dropout (LDO) with high current handling capability and superior transient response is gaining increasing attention for the battery-powered 5G mobile applications. In this article, a new multiple-loop design technique for fast-transient response LDO regulator design has been proposed and successfully implemented in a 0.13-<inline-formula> <tex-math notation="LaTeX">\mu \text{m} </tex-math></inline-formula> SOI CMOS process for portable smartphone and tablet PC applications. Its supply current capacity is more than 1 A, and its output voltage is from 1.2 to 1.8 V. The proposed LDO features a 10-mV undershoot and overshoot with 1-A/100-ns load current on a 1-<inline-formula> <tex-math notation="LaTeX">\mu \text{F} </tex-math></inline-formula> output capacitor. This superior transient performance is achieved by embodying a novel frequency compensation scheme without penalty of dc loop gain drop in large load current conditions. The dc loop gain is 60 dB and constant regardless of the fact that the load current varies from 0 to 1 A. This contributes to a small load regulation and line regulation of 0.6 <inline-formula> <tex-math notation="LaTeX">\mu \text{V} </tex-math></inline-formula>/A and 0.23 mV/V, respectively. The LDO consumes 35-<inline-formula> <tex-math notation="LaTeX">\mu \text{A} </tex-math></inline-formula> quiescent current in the mission mode and 5 <inline-formula> <tex-math notation="LaTeX">\mu \text{A} </tex-math></inline-formula> in the standby mode. The LDO silicon size is 325 <inline-formula> <tex-math notation="LaTeX">\mu \text{m}\,\,\times </tex-math></inline-formula> 106 <inline-formula> <tex-math notation="LaTeX">\mu \text{m} </tex-math></inline-formula>.]]></description><subject>5G mobile communication</subject><subject>Applications programs</subject><subject>Bandwidth</subject><subject>CMOS</subject><subject>Fast transient</subject><subject>Feedback loop</subject><subject>loop stability</subject><subject>low dropout regulator</subject><subject>Metal oxide semiconductors</subject><subject>Mobile computing</subject><subject>MOS devices</subject><subject>multi-loop compensation</subject><subject>Regulation</subject><subject>Slew rate</subject><subject>slew rate (SR)</subject><subject>Stability analysis</subject><subject>Transient analysis</subject><subject>Transient performance</subject><subject>Transient response</subject><issn>0018-9200</issn><issn>1558-173X</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2020</creationdate><recordtype>article</recordtype><sourceid>RIE</sourceid><recordid>eNo9kF1LwzAUhoMoOKc_QLwJeJ2Zz7a5LHUfyubATvSupGnqOmpbkxTx39uy4dXh8D7vOfAAcEvwjBAsH57TNJlRTPGMYSzCSJ6BCREiQiRkH-dggjGJkKQYX4Ir5w7DynlEJqCN4aavfYXWbdvBtDY_6FV5g-bNXjXaFPBls03h-nELV6op6qr5hATFA60KlPTWmsbD1JsOvld-DxfKebizqnHVGJSthWIJ466rK6181TbuGlyUqnbm5jSn4G0x3yUrtN4un5J4jTSVzKOclkpzJZgOSJEzWYpIklxzhnNSRAULSsZCHBRDLAWjlOqCK5XrXEaERRyzKbg_3u1s-90b57ND29tmeJlRLjgPcRgGA0WOlLatc9aUWWerL2V_M4Kz0Ws2es1Gr9nJ69C5O3YqY8w_L8e3AWF_h8Bxxg</recordid><startdate>20201101</startdate><enddate>20201101</enddate><creator>Li, Kan</creator><creator>Yang, Chuanshi</creator><creator>Guo, Ting</creator><creator>Zheng, Yuanjin</creator><general>IEEE</general><general>The Institute of Electrical and Electronics Engineers, Inc. (IEEE)</general><scope>97E</scope><scope>RIA</scope><scope>RIE</scope><scope>AAYXX</scope><scope>CITATION</scope><scope>7SP</scope><scope>8FD</scope><scope>L7M</scope><orcidid>https://orcid.org/0000-0002-7853-7479</orcidid><orcidid>https://orcid.org/0000-0001-5985-3671</orcidid><orcidid>https://orcid.org/0000-0003-0811-4216</orcidid><orcidid>https://orcid.org/0000-0002-5768-367X</orcidid></search><sort><creationdate>20201101</creationdate><title>A Multi-Loop Slew-Rate-Enhanced NMOS LDO Handling 1-A-Load-Current Step With Fast Transient for 5G Applications</title><author>Li, Kan ; Yang, Chuanshi ; Guo, Ting ; Zheng, Yuanjin</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c293t-b2fac4a53c61db39f5891bc430b1d8d36f33706dc61953222cd4aabcb98138403</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2020</creationdate><topic>5G mobile communication</topic><topic>Applications programs</topic><topic>Bandwidth</topic><topic>CMOS</topic><topic>Fast transient</topic><topic>Feedback loop</topic><topic>loop stability</topic><topic>low dropout regulator</topic><topic>Metal oxide semiconductors</topic><topic>Mobile computing</topic><topic>MOS devices</topic><topic>multi-loop compensation</topic><topic>Regulation</topic><topic>Slew rate</topic><topic>slew rate (SR)</topic><topic>Stability analysis</topic><topic>Transient analysis</topic><topic>Transient performance</topic><topic>Transient response</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Li, Kan</creatorcontrib><creatorcontrib>Yang, Chuanshi</creatorcontrib><creatorcontrib>Guo, Ting</creatorcontrib><creatorcontrib>Zheng, Yuanjin</creatorcontrib><collection>IEEE All-Society Periodicals Package (ASPP) 2005-present</collection><collection>IEEE All-Society Periodicals Package (ASPP) 1998-Present</collection><collection>IEEE Electronic Library (IEL)</collection><collection>CrossRef</collection><collection>Electronics & Communications Abstracts</collection><collection>Technology Research Database</collection><collection>Advanced Technologies Database with Aerospace</collection><jtitle>IEEE journal of solid-state circuits</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>Li, Kan</au><au>Yang, Chuanshi</au><au>Guo, Ting</au><au>Zheng, Yuanjin</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>A Multi-Loop Slew-Rate-Enhanced NMOS LDO Handling 1-A-Load-Current Step With Fast Transient for 5G Applications</atitle><jtitle>IEEE journal of solid-state circuits</jtitle><stitle>JSSC</stitle><date>2020-11-01</date><risdate>2020</risdate><volume>55</volume><issue>11</issue><spage>3076</spage><epage>3086</epage><pages>3076-3086</pages><issn>0018-9200</issn><eissn>1558-173X</eissn><coden>IJSCBC</coden><abstract><![CDATA[Compact low dropout (LDO) with high current handling capability and superior transient response is gaining increasing attention for the battery-powered 5G mobile applications. In this article, a new multiple-loop design technique for fast-transient response LDO regulator design has been proposed and successfully implemented in a 0.13-<inline-formula> <tex-math notation="LaTeX">\mu \text{m} </tex-math></inline-formula> SOI CMOS process for portable smartphone and tablet PC applications. Its supply current capacity is more than 1 A, and its output voltage is from 1.2 to 1.8 V. The proposed LDO features a 10-mV undershoot and overshoot with 1-A/100-ns load current on a 1-<inline-formula> <tex-math notation="LaTeX">\mu \text{F} </tex-math></inline-formula> output capacitor. This superior transient performance is achieved by embodying a novel frequency compensation scheme without penalty of dc loop gain drop in large load current conditions. The dc loop gain is 60 dB and constant regardless of the fact that the load current varies from 0 to 1 A. This contributes to a small load regulation and line regulation of 0.6 <inline-formula> <tex-math notation="LaTeX">\mu \text{V} </tex-math></inline-formula>/A and 0.23 mV/V, respectively. The LDO consumes 35-<inline-formula> <tex-math notation="LaTeX">\mu \text{A} </tex-math></inline-formula> quiescent current in the mission mode and 5 <inline-formula> <tex-math notation="LaTeX">\mu \text{A} </tex-math></inline-formula> in the standby mode. The LDO silicon size is 325 <inline-formula> <tex-math notation="LaTeX">\mu \text{m}\,\,\times </tex-math></inline-formula> 106 <inline-formula> <tex-math notation="LaTeX">\mu \text{m} </tex-math></inline-formula>.]]></abstract><cop>New York</cop><pub>IEEE</pub><doi>10.1109/JSSC.2020.3005789</doi><tpages>11</tpages><orcidid>https://orcid.org/0000-0002-7853-7479</orcidid><orcidid>https://orcid.org/0000-0001-5985-3671</orcidid><orcidid>https://orcid.org/0000-0003-0811-4216</orcidid><orcidid>https://orcid.org/0000-0002-5768-367X</orcidid></addata></record> |
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subjects | 5G mobile communication Applications programs Bandwidth CMOS Fast transient Feedback loop loop stability low dropout regulator Metal oxide semiconductors Mobile computing MOS devices multi-loop compensation Regulation Slew rate slew rate (SR) Stability analysis Transient analysis Transient performance Transient response |
title | A Multi-Loop Slew-Rate-Enhanced NMOS LDO Handling 1-A-Load-Current Step With Fast Transient for 5G Applications |
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