Electron Irradiation Effects and Defects Analysis of the Inverted Metamorphic Four-Junction Solar Cells

The degradation of inverted metamorphic four-junction (GaInP/GaAs/In 0.3 Ga 0.7 As/In 0.58 Ga 0.42 As, IMM4J) solar cells irradiated by 1-MeV electrons was investigated via their spectral responses and the characterization of their electrical properties. As in the case of traditional three-junction...

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Veröffentlicht in:IEEE journal of photovoltaics 2020-11, Vol.10 (6), p.1712-1720
Hauptverfasser: Zhang, Yanqing, Qi, Chunhua, Wang, Tianqi, Ma, Guoliang, Tsai, Hsu-Sheng, Liu, Chaoming, Zhou, Jiaming, Wei, Yidan, Li, Heyi, Xiao, Liyi, Ma, Yao, Wang, Duowei, Tang, Changxin, Li, Juncheng, Wu, Zhenlong, Huo, Mingxue
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container_issue 6
container_start_page 1712
container_title IEEE journal of photovoltaics
container_volume 10
creator Zhang, Yanqing
Qi, Chunhua
Wang, Tianqi
Ma, Guoliang
Tsai, Hsu-Sheng
Liu, Chaoming
Zhou, Jiaming
Wei, Yidan
Li, Heyi
Xiao, Liyi
Ma, Yao
Wang, Duowei
Tang, Changxin
Li, Juncheng
Wu, Zhenlong
Huo, Mingxue
description The degradation of inverted metamorphic four-junction (GaInP/GaAs/In 0.3 Ga 0.7 As/In 0.58 Ga 0.42 As, IMM4J) solar cells irradiated by 1-MeV electrons was investigated via their spectral responses and the characterization of their electrical properties. As in the case of traditional three-junction (TJ) GaInP/GaAs/Ge solar cells, the electrical properties ( I sc , V oc , and P max ) decrease with the logarithmic change of the electron fluence. The degradation of open-circuit voltage ( V oc ) is slightly more pronounced than that of I sc in IMM4J solar cells because of the sum rule for V oc and the limit rule for I sc . The spectral response analysis showed that an In 0.3 Ga 0.7 As subcell was the most damaged subcell in the irradiated IMM4J solar cell, but an In 0.58 Ga 0.42 As subcell had the lowest initial short-circuit current density (J sc ), which was maintained throughout the irradiation test. We therefore focused on the In 0.58 Ga 0.42 As subcell. Deep-level transient spectroscopy (DLTS) experiments were realized to study emission and capture processes in two special full configurations of In 0.58 Ga 0.42 As and In 0.3 Ga 0.7 As subcells of the IMM4J solar cell. DLTS measurements reveal a dominant electron trap at 0.52 eV below the conduction band (E c ) of In 0.58 Ga 0.42 As, and the electron trap gradually evolved into E c -0.46eV and E c -0.58eV after 1-MeV electron irradiation. Based on the first-principles calculation, E c -0.46 eV and E c -0.58 eV can be assigned as {\bf V}_{{\bf Ga}}^{\bf 0}/{\bf V}_{{\bf Ga}}^{{\rm{ - }}1} and {\bf V}_{{\bf In}}^{\bf 0}/{\bf V}_{{\bf In}}^{{\bf - 1}}, respectively. However, only one shallow level E c -0.03eV was observed within the bandgap of In 0.3 Ga 0.7 As after irradiation with DLTS detection. We summarize the issues faced for the space application of IMM4J solar cells by comparing the spectral responses of IMM3J, IMM4J, and TJ solar cells. Finally, the optimization of the design and fabrication of IMM solar cells are proposed.
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As in the case of traditional three-junction (TJ) GaInP/GaAs/Ge solar cells, the electrical properties ( I sc , V oc , and P max ) decrease with the logarithmic change of the electron fluence. The degradation of open-circuit voltage ( V oc ) is slightly more pronounced than that of I sc in IMM4J solar cells because of the sum rule for V oc and the limit rule for I sc . The spectral response analysis showed that an In 0.3 Ga 0.7 As subcell was the most damaged subcell in the irradiated IMM4J solar cell, but an In 0.58 Ga 0.42 As subcell had the lowest initial short-circuit current density (J sc ), which was maintained throughout the irradiation test. We therefore focused on the In 0.58 Ga 0.42 As subcell. Deep-level transient spectroscopy (DLTS) experiments were realized to study emission and capture processes in two special full configurations of In 0.58 Ga 0.42 As and In 0.3 Ga 0.7 As subcells of the IMM4J solar cell. DLTS measurements reveal a dominant electron trap at 0.52 eV below the conduction band (E c ) of In 0.58 Ga 0.42 As, and the electron trap gradually evolved into E c -0.46eV and E c -0.58eV after 1-MeV electron irradiation. Based on the first-principles calculation, E c -0.46 eV and E c -0.58 eV can be assigned as <inline-formula><tex-math notation="LaTeX">{\bf V}_{{\bf Ga}}^{\bf 0}/{\bf V}_{{\bf Ga}}^{{\rm{ - }}1}</tex-math></inline-formula> and <inline-formula><tex-math notation="LaTeX">{\bf V}_{{\bf In}}^{\bf 0}/{\bf V}_{{\bf In}}^{{\bf - 1}}</tex-math></inline-formula>, respectively. However, only one shallow level E c -0.03eV was observed within the bandgap of In 0.3 Ga 0.7 As after irradiation with DLTS detection. We summarize the issues faced for the space application of IMM4J solar cells by comparing the spectral responses of IMM3J, IMM4J, and TJ solar cells. Finally, the optimization of the design and fabrication of IMM solar cells are proposed.]]></description><identifier>ISSN: 2156-3381</identifier><identifier>EISSN: 2156-3403</identifier><identifier>DOI: 10.1109/JPHOTOV.2020.3025442</identifier><identifier>CODEN: IJPEG8</identifier><language>eng</language><publisher>Piscataway: IEEE</publisher><subject>Circuits ; Conduction bands ; Current measurement ; Deep level transient spectroscopy ; Defect analysis ; Degradation ; Design optimization ; Electrical properties ; electron beam ; Electron beams ; Electron irradiation ; Emission analysis ; First principles ; Fluence ; Gallium indium phosphide ; inverted metamorphic four-junction (IMM4J) solar cell ; irradiation effects ; Open circuit voltage ; Photovoltaic cells ; Photovoltaic systems ; Radiation damage ; Radiation effects ; Short circuit currents ; Solar cells ; Spectra ; Spectral sensitivity ; Sum rules</subject><ispartof>IEEE journal of photovoltaics, 2020-11, Vol.10 (6), p.1712-1720</ispartof><rights>Copyright The Institute of Electrical and Electronics Engineers, Inc. (IEEE) 2020</rights><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c299t-2c4698e532ef4831937e5a67fdf3d4b0412f8a97656d56b13c855063f65325233</citedby><cites>FETCH-LOGICAL-c299t-2c4698e532ef4831937e5a67fdf3d4b0412f8a97656d56b13c855063f65325233</cites><orcidid>0000-0002-6644-8081 ; 0000-0002-3039-9038 ; 0000-0003-1486-6377 ; 0000-0001-8839-5729 ; 0000-0002-7074-7957 ; 0000-0001-7038-6154</orcidid></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://ieeexplore.ieee.org/document/9212651$$EHTML$$P50$$Gieee$$H</linktohtml><link.rule.ids>314,776,780,792,27901,27902,54733</link.rule.ids><linktorsrc>$$Uhttps://ieeexplore.ieee.org/document/9212651$$EView_record_in_IEEE$$FView_record_in_$$GIEEE</linktorsrc></links><search><creatorcontrib>Zhang, Yanqing</creatorcontrib><creatorcontrib>Qi, Chunhua</creatorcontrib><creatorcontrib>Wang, Tianqi</creatorcontrib><creatorcontrib>Ma, Guoliang</creatorcontrib><creatorcontrib>Tsai, Hsu-Sheng</creatorcontrib><creatorcontrib>Liu, Chaoming</creatorcontrib><creatorcontrib>Zhou, Jiaming</creatorcontrib><creatorcontrib>Wei, Yidan</creatorcontrib><creatorcontrib>Li, Heyi</creatorcontrib><creatorcontrib>Xiao, Liyi</creatorcontrib><creatorcontrib>Ma, Yao</creatorcontrib><creatorcontrib>Wang, Duowei</creatorcontrib><creatorcontrib>Tang, Changxin</creatorcontrib><creatorcontrib>Li, Juncheng</creatorcontrib><creatorcontrib>Wu, Zhenlong</creatorcontrib><creatorcontrib>Huo, Mingxue</creatorcontrib><title>Electron Irradiation Effects and Defects Analysis of the Inverted Metamorphic Four-Junction Solar Cells</title><title>IEEE journal of photovoltaics</title><addtitle>JPHOTOV</addtitle><description><![CDATA[The degradation of inverted metamorphic four-junction (GaInP/GaAs/In 0.3 Ga 0.7 As/In 0.58 Ga 0.42 As, IMM4J) solar cells irradiated by 1-MeV electrons was investigated via their spectral responses and the characterization of their electrical properties. As in the case of traditional three-junction (TJ) GaInP/GaAs/Ge solar cells, the electrical properties ( I sc , V oc , and P max ) decrease with the logarithmic change of the electron fluence. The degradation of open-circuit voltage ( V oc ) is slightly more pronounced than that of I sc in IMM4J solar cells because of the sum rule for V oc and the limit rule for I sc . The spectral response analysis showed that an In 0.3 Ga 0.7 As subcell was the most damaged subcell in the irradiated IMM4J solar cell, but an In 0.58 Ga 0.42 As subcell had the lowest initial short-circuit current density (J sc ), which was maintained throughout the irradiation test. We therefore focused on the In 0.58 Ga 0.42 As subcell. Deep-level transient spectroscopy (DLTS) experiments were realized to study emission and capture processes in two special full configurations of In 0.58 Ga 0.42 As and In 0.3 Ga 0.7 As subcells of the IMM4J solar cell. DLTS measurements reveal a dominant electron trap at 0.52 eV below the conduction band (E c ) of In 0.58 Ga 0.42 As, and the electron trap gradually evolved into E c -0.46eV and E c -0.58eV after 1-MeV electron irradiation. Based on the first-principles calculation, E c -0.46 eV and E c -0.58 eV can be assigned as <inline-formula><tex-math notation="LaTeX">{\bf V}_{{\bf Ga}}^{\bf 0}/{\bf V}_{{\bf Ga}}^{{\rm{ - }}1}</tex-math></inline-formula> and <inline-formula><tex-math notation="LaTeX">{\bf V}_{{\bf In}}^{\bf 0}/{\bf V}_{{\bf In}}^{{\bf - 1}}</tex-math></inline-formula>, respectively. However, only one shallow level E c -0.03eV was observed within the bandgap of In 0.3 Ga 0.7 As after irradiation with DLTS detection. We summarize the issues faced for the space application of IMM4J solar cells by comparing the spectral responses of IMM3J, IMM4J, and TJ solar cells. Finally, the optimization of the design and fabrication of IMM solar cells are proposed.]]></description><subject>Circuits</subject><subject>Conduction bands</subject><subject>Current measurement</subject><subject>Deep level transient spectroscopy</subject><subject>Defect analysis</subject><subject>Degradation</subject><subject>Design optimization</subject><subject>Electrical properties</subject><subject>electron beam</subject><subject>Electron beams</subject><subject>Electron irradiation</subject><subject>Emission analysis</subject><subject>First principles</subject><subject>Fluence</subject><subject>Gallium indium phosphide</subject><subject>inverted metamorphic four-junction (IMM4J) solar cell</subject><subject>irradiation effects</subject><subject>Open circuit voltage</subject><subject>Photovoltaic cells</subject><subject>Photovoltaic systems</subject><subject>Radiation damage</subject><subject>Radiation effects</subject><subject>Short circuit currents</subject><subject>Solar cells</subject><subject>Spectra</subject><subject>Spectral sensitivity</subject><subject>Sum rules</subject><issn>2156-3381</issn><issn>2156-3403</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2020</creationdate><recordtype>article</recordtype><sourceid>RIE</sourceid><recordid>eNo9kE9PwkAQxTdGE4nyCfSwiefi_m_3SBAEgsFE9LpZ2lkpKS3uFhO-vYtF5zIvk_cmLz-E7ikZUEr04_x1ulwtPwaMMDLghEkh2AXqMSpVwgXhl3-aZ_Qa9UPYkjiKSKVED32OK8hb39R45r0tStuWUY-di9eAbV3gJ-j0sLbVMZQBNw63G8Cz-ht8CwV-gdbuGr_flDmeNAefzA91_vvmramsxyOoqnCLrpytAvTP-wa9T8ar0TRZLJ9no-EiyZnWbcJyoXQGkjNwIuNU8xSkVakrHC_EmgjKXGZ1qqQqpFpTnmdSEsWdihHJOL9BD93fvW--DhBas42VYvVgmJARgWSpjC7RuXLfhODBmb0vd9YfDSXmRNWcqZoTVXOmGmN3XawEgP-IZpQpSfkPenxy2Q</recordid><startdate>20201101</startdate><enddate>20201101</enddate><creator>Zhang, Yanqing</creator><creator>Qi, Chunhua</creator><creator>Wang, Tianqi</creator><creator>Ma, Guoliang</creator><creator>Tsai, Hsu-Sheng</creator><creator>Liu, Chaoming</creator><creator>Zhou, Jiaming</creator><creator>Wei, Yidan</creator><creator>Li, Heyi</creator><creator>Xiao, Liyi</creator><creator>Ma, Yao</creator><creator>Wang, Duowei</creator><creator>Tang, Changxin</creator><creator>Li, Juncheng</creator><creator>Wu, Zhenlong</creator><creator>Huo, Mingxue</creator><general>IEEE</general><general>The Institute of Electrical and Electronics Engineers, Inc. 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As in the case of traditional three-junction (TJ) GaInP/GaAs/Ge solar cells, the electrical properties ( I sc , V oc , and P max ) decrease with the logarithmic change of the electron fluence. The degradation of open-circuit voltage ( V oc ) is slightly more pronounced than that of I sc in IMM4J solar cells because of the sum rule for V oc and the limit rule for I sc . The spectral response analysis showed that an In 0.3 Ga 0.7 As subcell was the most damaged subcell in the irradiated IMM4J solar cell, but an In 0.58 Ga 0.42 As subcell had the lowest initial short-circuit current density (J sc ), which was maintained throughout the irradiation test. We therefore focused on the In 0.58 Ga 0.42 As subcell. Deep-level transient spectroscopy (DLTS) experiments were realized to study emission and capture processes in two special full configurations of In 0.58 Ga 0.42 As and In 0.3 Ga 0.7 As subcells of the IMM4J solar cell. DLTS measurements reveal a dominant electron trap at 0.52 eV below the conduction band (E c ) of In 0.58 Ga 0.42 As, and the electron trap gradually evolved into E c -0.46eV and E c -0.58eV after 1-MeV electron irradiation. Based on the first-principles calculation, E c -0.46 eV and E c -0.58 eV can be assigned as <inline-formula><tex-math notation="LaTeX">{\bf V}_{{\bf Ga}}^{\bf 0}/{\bf V}_{{\bf Ga}}^{{\rm{ - }}1}</tex-math></inline-formula> and <inline-formula><tex-math notation="LaTeX">{\bf V}_{{\bf In}}^{\bf 0}/{\bf V}_{{\bf In}}^{{\bf - 1}}</tex-math></inline-formula>, respectively. However, only one shallow level E c -0.03eV was observed within the bandgap of In 0.3 Ga 0.7 As after irradiation with DLTS detection. We summarize the issues faced for the space application of IMM4J solar cells by comparing the spectral responses of IMM3J, IMM4J, and TJ solar cells. Finally, the optimization of the design and fabrication of IMM solar cells are proposed.]]></abstract><cop>Piscataway</cop><pub>IEEE</pub><doi>10.1109/JPHOTOV.2020.3025442</doi><tpages>9</tpages><orcidid>https://orcid.org/0000-0002-6644-8081</orcidid><orcidid>https://orcid.org/0000-0002-3039-9038</orcidid><orcidid>https://orcid.org/0000-0003-1486-6377</orcidid><orcidid>https://orcid.org/0000-0001-8839-5729</orcidid><orcidid>https://orcid.org/0000-0002-7074-7957</orcidid><orcidid>https://orcid.org/0000-0001-7038-6154</orcidid></addata></record>
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subjects Circuits
Conduction bands
Current measurement
Deep level transient spectroscopy
Defect analysis
Degradation
Design optimization
Electrical properties
electron beam
Electron beams
Electron irradiation
Emission analysis
First principles
Fluence
Gallium indium phosphide
inverted metamorphic four-junction (IMM4J) solar cell
irradiation effects
Open circuit voltage
Photovoltaic cells
Photovoltaic systems
Radiation damage
Radiation effects
Short circuit currents
Solar cells
Spectra
Spectral sensitivity
Sum rules
title Electron Irradiation Effects and Defects Analysis of the Inverted Metamorphic Four-Junction Solar Cells
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