Electron Irradiation Effects and Defects Analysis of the Inverted Metamorphic Four-Junction Solar Cells
The degradation of inverted metamorphic four-junction (GaInP/GaAs/In 0.3 Ga 0.7 As/In 0.58 Ga 0.42 As, IMM4J) solar cells irradiated by 1-MeV electrons was investigated via their spectral responses and the characterization of their electrical properties. As in the case of traditional three-junction...
Gespeichert in:
Veröffentlicht in: | IEEE journal of photovoltaics 2020-11, Vol.10 (6), p.1712-1720 |
---|---|
Hauptverfasser: | , , , , , , , , , , , , , , , |
Format: | Artikel |
Sprache: | eng |
Schlagworte: | |
Online-Zugang: | Volltext bestellen |
Tags: |
Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
|
container_end_page | 1720 |
---|---|
container_issue | 6 |
container_start_page | 1712 |
container_title | IEEE journal of photovoltaics |
container_volume | 10 |
creator | Zhang, Yanqing Qi, Chunhua Wang, Tianqi Ma, Guoliang Tsai, Hsu-Sheng Liu, Chaoming Zhou, Jiaming Wei, Yidan Li, Heyi Xiao, Liyi Ma, Yao Wang, Duowei Tang, Changxin Li, Juncheng Wu, Zhenlong Huo, Mingxue |
description | The degradation of inverted metamorphic four-junction (GaInP/GaAs/In 0.3 Ga 0.7 As/In 0.58 Ga 0.42 As, IMM4J) solar cells irradiated by 1-MeV electrons was investigated via their spectral responses and the characterization of their electrical properties. As in the case of traditional three-junction (TJ) GaInP/GaAs/Ge solar cells, the electrical properties ( I sc , V oc , and P max ) decrease with the logarithmic change of the electron fluence. The degradation of open-circuit voltage ( V oc ) is slightly more pronounced than that of I sc in IMM4J solar cells because of the sum rule for V oc and the limit rule for I sc . The spectral response analysis showed that an In 0.3 Ga 0.7 As subcell was the most damaged subcell in the irradiated IMM4J solar cell, but an In 0.58 Ga 0.42 As subcell had the lowest initial short-circuit current density (J sc ), which was maintained throughout the irradiation test. We therefore focused on the In 0.58 Ga 0.42 As subcell. Deep-level transient spectroscopy (DLTS) experiments were realized to study emission and capture processes in two special full configurations of In 0.58 Ga 0.42 As and In 0.3 Ga 0.7 As subcells of the IMM4J solar cell. DLTS measurements reveal a dominant electron trap at 0.52 eV below the conduction band (E c ) of In 0.58 Ga 0.42 As, and the electron trap gradually evolved into E c -0.46eV and E c -0.58eV after 1-MeV electron irradiation. Based on the first-principles calculation, E c -0.46 eV and E c -0.58 eV can be assigned as {\bf V}_{{\bf Ga}}^{\bf 0}/{\bf V}_{{\bf Ga}}^{{\rm{ - }}1} and {\bf V}_{{\bf In}}^{\bf 0}/{\bf V}_{{\bf In}}^{{\bf - 1}}, respectively. However, only one shallow level E c -0.03eV was observed within the bandgap of In 0.3 Ga 0.7 As after irradiation with DLTS detection. We summarize the issues faced for the space application of IMM4J solar cells by comparing the spectral responses of IMM3J, IMM4J, and TJ solar cells. Finally, the optimization of the design and fabrication of IMM solar cells are proposed. |
doi_str_mv | 10.1109/JPHOTOV.2020.3025442 |
format | Article |
fullrecord | <record><control><sourceid>proquest_RIE</sourceid><recordid>TN_cdi_proquest_journals_2453815275</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><ieee_id>9212651</ieee_id><sourcerecordid>2453815275</sourcerecordid><originalsourceid>FETCH-LOGICAL-c299t-2c4698e532ef4831937e5a67fdf3d4b0412f8a97656d56b13c855063f65325233</originalsourceid><addsrcrecordid>eNo9kE9PwkAQxTdGE4nyCfSwiefi_m_3SBAEgsFE9LpZ2lkpKS3uFhO-vYtF5zIvk_cmLz-E7ikZUEr04_x1ulwtPwaMMDLghEkh2AXqMSpVwgXhl3-aZ_Qa9UPYkjiKSKVED32OK8hb39R45r0tStuWUY-di9eAbV3gJ-j0sLbVMZQBNw63G8Cz-ht8CwV-gdbuGr_flDmeNAefzA91_vvmramsxyOoqnCLrpytAvTP-wa9T8ar0TRZLJ9no-EiyZnWbcJyoXQGkjNwIuNU8xSkVakrHC_EmgjKXGZ1qqQqpFpTnmdSEsWdihHJOL9BD93fvW--DhBas42VYvVgmJARgWSpjC7RuXLfhODBmb0vd9YfDSXmRNWcqZoTVXOmGmN3XawEgP-IZpQpSfkPenxy2Q</addsrcrecordid><sourcetype>Aggregation Database</sourcetype><iscdi>true</iscdi><recordtype>article</recordtype><pqid>2453815275</pqid></control><display><type>article</type><title>Electron Irradiation Effects and Defects Analysis of the Inverted Metamorphic Four-Junction Solar Cells</title><source>IEEE Electronic Library (IEL)</source><creator>Zhang, Yanqing ; Qi, Chunhua ; Wang, Tianqi ; Ma, Guoliang ; Tsai, Hsu-Sheng ; Liu, Chaoming ; Zhou, Jiaming ; Wei, Yidan ; Li, Heyi ; Xiao, Liyi ; Ma, Yao ; Wang, Duowei ; Tang, Changxin ; Li, Juncheng ; Wu, Zhenlong ; Huo, Mingxue</creator><creatorcontrib>Zhang, Yanqing ; Qi, Chunhua ; Wang, Tianqi ; Ma, Guoliang ; Tsai, Hsu-Sheng ; Liu, Chaoming ; Zhou, Jiaming ; Wei, Yidan ; Li, Heyi ; Xiao, Liyi ; Ma, Yao ; Wang, Duowei ; Tang, Changxin ; Li, Juncheng ; Wu, Zhenlong ; Huo, Mingxue</creatorcontrib><description><![CDATA[The degradation of inverted metamorphic four-junction (GaInP/GaAs/In 0.3 Ga 0.7 As/In 0.58 Ga 0.42 As, IMM4J) solar cells irradiated by 1-MeV electrons was investigated via their spectral responses and the characterization of their electrical properties. As in the case of traditional three-junction (TJ) GaInP/GaAs/Ge solar cells, the electrical properties ( I sc , V oc , and P max ) decrease with the logarithmic change of the electron fluence. The degradation of open-circuit voltage ( V oc ) is slightly more pronounced than that of I sc in IMM4J solar cells because of the sum rule for V oc and the limit rule for I sc . The spectral response analysis showed that an In 0.3 Ga 0.7 As subcell was the most damaged subcell in the irradiated IMM4J solar cell, but an In 0.58 Ga 0.42 As subcell had the lowest initial short-circuit current density (J sc ), which was maintained throughout the irradiation test. We therefore focused on the In 0.58 Ga 0.42 As subcell. Deep-level transient spectroscopy (DLTS) experiments were realized to study emission and capture processes in two special full configurations of In 0.58 Ga 0.42 As and In 0.3 Ga 0.7 As subcells of the IMM4J solar cell. DLTS measurements reveal a dominant electron trap at 0.52 eV below the conduction band (E c ) of In 0.58 Ga 0.42 As, and the electron trap gradually evolved into E c -0.46eV and E c -0.58eV after 1-MeV electron irradiation. Based on the first-principles calculation, E c -0.46 eV and E c -0.58 eV can be assigned as <inline-formula><tex-math notation="LaTeX">{\bf V}_{{\bf Ga}}^{\bf 0}/{\bf V}_{{\bf Ga}}^{{\rm{ - }}1}</tex-math></inline-formula> and <inline-formula><tex-math notation="LaTeX">{\bf V}_{{\bf In}}^{\bf 0}/{\bf V}_{{\bf In}}^{{\bf - 1}}</tex-math></inline-formula>, respectively. However, only one shallow level E c -0.03eV was observed within the bandgap of In 0.3 Ga 0.7 As after irradiation with DLTS detection. We summarize the issues faced for the space application of IMM4J solar cells by comparing the spectral responses of IMM3J, IMM4J, and TJ solar cells. Finally, the optimization of the design and fabrication of IMM solar cells are proposed.]]></description><identifier>ISSN: 2156-3381</identifier><identifier>EISSN: 2156-3403</identifier><identifier>DOI: 10.1109/JPHOTOV.2020.3025442</identifier><identifier>CODEN: IJPEG8</identifier><language>eng</language><publisher>Piscataway: IEEE</publisher><subject>Circuits ; Conduction bands ; Current measurement ; Deep level transient spectroscopy ; Defect analysis ; Degradation ; Design optimization ; Electrical properties ; electron beam ; Electron beams ; Electron irradiation ; Emission analysis ; First principles ; Fluence ; Gallium indium phosphide ; inverted metamorphic four-junction (IMM4J) solar cell ; irradiation effects ; Open circuit voltage ; Photovoltaic cells ; Photovoltaic systems ; Radiation damage ; Radiation effects ; Short circuit currents ; Solar cells ; Spectra ; Spectral sensitivity ; Sum rules</subject><ispartof>IEEE journal of photovoltaics, 2020-11, Vol.10 (6), p.1712-1720</ispartof><rights>Copyright The Institute of Electrical and Electronics Engineers, Inc. (IEEE) 2020</rights><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c299t-2c4698e532ef4831937e5a67fdf3d4b0412f8a97656d56b13c855063f65325233</citedby><cites>FETCH-LOGICAL-c299t-2c4698e532ef4831937e5a67fdf3d4b0412f8a97656d56b13c855063f65325233</cites><orcidid>0000-0002-6644-8081 ; 0000-0002-3039-9038 ; 0000-0003-1486-6377 ; 0000-0001-8839-5729 ; 0000-0002-7074-7957 ; 0000-0001-7038-6154</orcidid></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://ieeexplore.ieee.org/document/9212651$$EHTML$$P50$$Gieee$$H</linktohtml><link.rule.ids>314,776,780,792,27901,27902,54733</link.rule.ids><linktorsrc>$$Uhttps://ieeexplore.ieee.org/document/9212651$$EView_record_in_IEEE$$FView_record_in_$$GIEEE</linktorsrc></links><search><creatorcontrib>Zhang, Yanqing</creatorcontrib><creatorcontrib>Qi, Chunhua</creatorcontrib><creatorcontrib>Wang, Tianqi</creatorcontrib><creatorcontrib>Ma, Guoliang</creatorcontrib><creatorcontrib>Tsai, Hsu-Sheng</creatorcontrib><creatorcontrib>Liu, Chaoming</creatorcontrib><creatorcontrib>Zhou, Jiaming</creatorcontrib><creatorcontrib>Wei, Yidan</creatorcontrib><creatorcontrib>Li, Heyi</creatorcontrib><creatorcontrib>Xiao, Liyi</creatorcontrib><creatorcontrib>Ma, Yao</creatorcontrib><creatorcontrib>Wang, Duowei</creatorcontrib><creatorcontrib>Tang, Changxin</creatorcontrib><creatorcontrib>Li, Juncheng</creatorcontrib><creatorcontrib>Wu, Zhenlong</creatorcontrib><creatorcontrib>Huo, Mingxue</creatorcontrib><title>Electron Irradiation Effects and Defects Analysis of the Inverted Metamorphic Four-Junction Solar Cells</title><title>IEEE journal of photovoltaics</title><addtitle>JPHOTOV</addtitle><description><![CDATA[The degradation of inverted metamorphic four-junction (GaInP/GaAs/In 0.3 Ga 0.7 As/In 0.58 Ga 0.42 As, IMM4J) solar cells irradiated by 1-MeV electrons was investigated via their spectral responses and the characterization of their electrical properties. As in the case of traditional three-junction (TJ) GaInP/GaAs/Ge solar cells, the electrical properties ( I sc , V oc , and P max ) decrease with the logarithmic change of the electron fluence. The degradation of open-circuit voltage ( V oc ) is slightly more pronounced than that of I sc in IMM4J solar cells because of the sum rule for V oc and the limit rule for I sc . The spectral response analysis showed that an In 0.3 Ga 0.7 As subcell was the most damaged subcell in the irradiated IMM4J solar cell, but an In 0.58 Ga 0.42 As subcell had the lowest initial short-circuit current density (J sc ), which was maintained throughout the irradiation test. We therefore focused on the In 0.58 Ga 0.42 As subcell. Deep-level transient spectroscopy (DLTS) experiments were realized to study emission and capture processes in two special full configurations of In 0.58 Ga 0.42 As and In 0.3 Ga 0.7 As subcells of the IMM4J solar cell. DLTS measurements reveal a dominant electron trap at 0.52 eV below the conduction band (E c ) of In 0.58 Ga 0.42 As, and the electron trap gradually evolved into E c -0.46eV and E c -0.58eV after 1-MeV electron irradiation. Based on the first-principles calculation, E c -0.46 eV and E c -0.58 eV can be assigned as <inline-formula><tex-math notation="LaTeX">{\bf V}_{{\bf Ga}}^{\bf 0}/{\bf V}_{{\bf Ga}}^{{\rm{ - }}1}</tex-math></inline-formula> and <inline-formula><tex-math notation="LaTeX">{\bf V}_{{\bf In}}^{\bf 0}/{\bf V}_{{\bf In}}^{{\bf - 1}}</tex-math></inline-formula>, respectively. However, only one shallow level E c -0.03eV was observed within the bandgap of In 0.3 Ga 0.7 As after irradiation with DLTS detection. We summarize the issues faced for the space application of IMM4J solar cells by comparing the spectral responses of IMM3J, IMM4J, and TJ solar cells. Finally, the optimization of the design and fabrication of IMM solar cells are proposed.]]></description><subject>Circuits</subject><subject>Conduction bands</subject><subject>Current measurement</subject><subject>Deep level transient spectroscopy</subject><subject>Defect analysis</subject><subject>Degradation</subject><subject>Design optimization</subject><subject>Electrical properties</subject><subject>electron beam</subject><subject>Electron beams</subject><subject>Electron irradiation</subject><subject>Emission analysis</subject><subject>First principles</subject><subject>Fluence</subject><subject>Gallium indium phosphide</subject><subject>inverted metamorphic four-junction (IMM4J) solar cell</subject><subject>irradiation effects</subject><subject>Open circuit voltage</subject><subject>Photovoltaic cells</subject><subject>Photovoltaic systems</subject><subject>Radiation damage</subject><subject>Radiation effects</subject><subject>Short circuit currents</subject><subject>Solar cells</subject><subject>Spectra</subject><subject>Spectral sensitivity</subject><subject>Sum rules</subject><issn>2156-3381</issn><issn>2156-3403</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2020</creationdate><recordtype>article</recordtype><sourceid>RIE</sourceid><recordid>eNo9kE9PwkAQxTdGE4nyCfSwiefi_m_3SBAEgsFE9LpZ2lkpKS3uFhO-vYtF5zIvk_cmLz-E7ikZUEr04_x1ulwtPwaMMDLghEkh2AXqMSpVwgXhl3-aZ_Qa9UPYkjiKSKVED32OK8hb39R45r0tStuWUY-di9eAbV3gJ-j0sLbVMZQBNw63G8Cz-ht8CwV-gdbuGr_flDmeNAefzA91_vvmramsxyOoqnCLrpytAvTP-wa9T8ar0TRZLJ9no-EiyZnWbcJyoXQGkjNwIuNU8xSkVakrHC_EmgjKXGZ1qqQqpFpTnmdSEsWdihHJOL9BD93fvW--DhBas42VYvVgmJARgWSpjC7RuXLfhODBmb0vd9YfDSXmRNWcqZoTVXOmGmN3XawEgP-IZpQpSfkPenxy2Q</recordid><startdate>20201101</startdate><enddate>20201101</enddate><creator>Zhang, Yanqing</creator><creator>Qi, Chunhua</creator><creator>Wang, Tianqi</creator><creator>Ma, Guoliang</creator><creator>Tsai, Hsu-Sheng</creator><creator>Liu, Chaoming</creator><creator>Zhou, Jiaming</creator><creator>Wei, Yidan</creator><creator>Li, Heyi</creator><creator>Xiao, Liyi</creator><creator>Ma, Yao</creator><creator>Wang, Duowei</creator><creator>Tang, Changxin</creator><creator>Li, Juncheng</creator><creator>Wu, Zhenlong</creator><creator>Huo, Mingxue</creator><general>IEEE</general><general>The Institute of Electrical and Electronics Engineers, Inc. (IEEE)</general><scope>97E</scope><scope>RIA</scope><scope>RIE</scope><scope>AAYXX</scope><scope>CITATION</scope><scope>7SP</scope><scope>8FD</scope><scope>L7M</scope><orcidid>https://orcid.org/0000-0002-6644-8081</orcidid><orcidid>https://orcid.org/0000-0002-3039-9038</orcidid><orcidid>https://orcid.org/0000-0003-1486-6377</orcidid><orcidid>https://orcid.org/0000-0001-8839-5729</orcidid><orcidid>https://orcid.org/0000-0002-7074-7957</orcidid><orcidid>https://orcid.org/0000-0001-7038-6154</orcidid></search><sort><creationdate>20201101</creationdate><title>Electron Irradiation Effects and Defects Analysis of the Inverted Metamorphic Four-Junction Solar Cells</title><author>Zhang, Yanqing ; Qi, Chunhua ; Wang, Tianqi ; Ma, Guoliang ; Tsai, Hsu-Sheng ; Liu, Chaoming ; Zhou, Jiaming ; Wei, Yidan ; Li, Heyi ; Xiao, Liyi ; Ma, Yao ; Wang, Duowei ; Tang, Changxin ; Li, Juncheng ; Wu, Zhenlong ; Huo, Mingxue</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c299t-2c4698e532ef4831937e5a67fdf3d4b0412f8a97656d56b13c855063f65325233</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2020</creationdate><topic>Circuits</topic><topic>Conduction bands</topic><topic>Current measurement</topic><topic>Deep level transient spectroscopy</topic><topic>Defect analysis</topic><topic>Degradation</topic><topic>Design optimization</topic><topic>Electrical properties</topic><topic>electron beam</topic><topic>Electron beams</topic><topic>Electron irradiation</topic><topic>Emission analysis</topic><topic>First principles</topic><topic>Fluence</topic><topic>Gallium indium phosphide</topic><topic>inverted metamorphic four-junction (IMM4J) solar cell</topic><topic>irradiation effects</topic><topic>Open circuit voltage</topic><topic>Photovoltaic cells</topic><topic>Photovoltaic systems</topic><topic>Radiation damage</topic><topic>Radiation effects</topic><topic>Short circuit currents</topic><topic>Solar cells</topic><topic>Spectra</topic><topic>Spectral sensitivity</topic><topic>Sum rules</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Zhang, Yanqing</creatorcontrib><creatorcontrib>Qi, Chunhua</creatorcontrib><creatorcontrib>Wang, Tianqi</creatorcontrib><creatorcontrib>Ma, Guoliang</creatorcontrib><creatorcontrib>Tsai, Hsu-Sheng</creatorcontrib><creatorcontrib>Liu, Chaoming</creatorcontrib><creatorcontrib>Zhou, Jiaming</creatorcontrib><creatorcontrib>Wei, Yidan</creatorcontrib><creatorcontrib>Li, Heyi</creatorcontrib><creatorcontrib>Xiao, Liyi</creatorcontrib><creatorcontrib>Ma, Yao</creatorcontrib><creatorcontrib>Wang, Duowei</creatorcontrib><creatorcontrib>Tang, Changxin</creatorcontrib><creatorcontrib>Li, Juncheng</creatorcontrib><creatorcontrib>Wu, Zhenlong</creatorcontrib><creatorcontrib>Huo, Mingxue</creatorcontrib><collection>IEEE All-Society Periodicals Package (ASPP) 2005-present</collection><collection>IEEE All-Society Periodicals Package (ASPP) 1998–Present</collection><collection>IEEE Electronic Library (IEL)</collection><collection>CrossRef</collection><collection>Electronics & Communications Abstracts</collection><collection>Technology Research Database</collection><collection>Advanced Technologies Database with Aerospace</collection><jtitle>IEEE journal of photovoltaics</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>Zhang, Yanqing</au><au>Qi, Chunhua</au><au>Wang, Tianqi</au><au>Ma, Guoliang</au><au>Tsai, Hsu-Sheng</au><au>Liu, Chaoming</au><au>Zhou, Jiaming</au><au>Wei, Yidan</au><au>Li, Heyi</au><au>Xiao, Liyi</au><au>Ma, Yao</au><au>Wang, Duowei</au><au>Tang, Changxin</au><au>Li, Juncheng</au><au>Wu, Zhenlong</au><au>Huo, Mingxue</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Electron Irradiation Effects and Defects Analysis of the Inverted Metamorphic Four-Junction Solar Cells</atitle><jtitle>IEEE journal of photovoltaics</jtitle><stitle>JPHOTOV</stitle><date>2020-11-01</date><risdate>2020</risdate><volume>10</volume><issue>6</issue><spage>1712</spage><epage>1720</epage><pages>1712-1720</pages><issn>2156-3381</issn><eissn>2156-3403</eissn><coden>IJPEG8</coden><abstract><![CDATA[The degradation of inverted metamorphic four-junction (GaInP/GaAs/In 0.3 Ga 0.7 As/In 0.58 Ga 0.42 As, IMM4J) solar cells irradiated by 1-MeV electrons was investigated via their spectral responses and the characterization of their electrical properties. As in the case of traditional three-junction (TJ) GaInP/GaAs/Ge solar cells, the electrical properties ( I sc , V oc , and P max ) decrease with the logarithmic change of the electron fluence. The degradation of open-circuit voltage ( V oc ) is slightly more pronounced than that of I sc in IMM4J solar cells because of the sum rule for V oc and the limit rule for I sc . The spectral response analysis showed that an In 0.3 Ga 0.7 As subcell was the most damaged subcell in the irradiated IMM4J solar cell, but an In 0.58 Ga 0.42 As subcell had the lowest initial short-circuit current density (J sc ), which was maintained throughout the irradiation test. We therefore focused on the In 0.58 Ga 0.42 As subcell. Deep-level transient spectroscopy (DLTS) experiments were realized to study emission and capture processes in two special full configurations of In 0.58 Ga 0.42 As and In 0.3 Ga 0.7 As subcells of the IMM4J solar cell. DLTS measurements reveal a dominant electron trap at 0.52 eV below the conduction band (E c ) of In 0.58 Ga 0.42 As, and the electron trap gradually evolved into E c -0.46eV and E c -0.58eV after 1-MeV electron irradiation. Based on the first-principles calculation, E c -0.46 eV and E c -0.58 eV can be assigned as <inline-formula><tex-math notation="LaTeX">{\bf V}_{{\bf Ga}}^{\bf 0}/{\bf V}_{{\bf Ga}}^{{\rm{ - }}1}</tex-math></inline-formula> and <inline-formula><tex-math notation="LaTeX">{\bf V}_{{\bf In}}^{\bf 0}/{\bf V}_{{\bf In}}^{{\bf - 1}}</tex-math></inline-formula>, respectively. However, only one shallow level E c -0.03eV was observed within the bandgap of In 0.3 Ga 0.7 As after irradiation with DLTS detection. We summarize the issues faced for the space application of IMM4J solar cells by comparing the spectral responses of IMM3J, IMM4J, and TJ solar cells. Finally, the optimization of the design and fabrication of IMM solar cells are proposed.]]></abstract><cop>Piscataway</cop><pub>IEEE</pub><doi>10.1109/JPHOTOV.2020.3025442</doi><tpages>9</tpages><orcidid>https://orcid.org/0000-0002-6644-8081</orcidid><orcidid>https://orcid.org/0000-0002-3039-9038</orcidid><orcidid>https://orcid.org/0000-0003-1486-6377</orcidid><orcidid>https://orcid.org/0000-0001-8839-5729</orcidid><orcidid>https://orcid.org/0000-0002-7074-7957</orcidid><orcidid>https://orcid.org/0000-0001-7038-6154</orcidid></addata></record> |
fulltext | fulltext_linktorsrc |
identifier | ISSN: 2156-3381 |
ispartof | IEEE journal of photovoltaics, 2020-11, Vol.10 (6), p.1712-1720 |
issn | 2156-3381 2156-3403 |
language | eng |
recordid | cdi_proquest_journals_2453815275 |
source | IEEE Electronic Library (IEL) |
subjects | Circuits Conduction bands Current measurement Deep level transient spectroscopy Defect analysis Degradation Design optimization Electrical properties electron beam Electron beams Electron irradiation Emission analysis First principles Fluence Gallium indium phosphide inverted metamorphic four-junction (IMM4J) solar cell irradiation effects Open circuit voltage Photovoltaic cells Photovoltaic systems Radiation damage Radiation effects Short circuit currents Solar cells Spectra Spectral sensitivity Sum rules |
title | Electron Irradiation Effects and Defects Analysis of the Inverted Metamorphic Four-Junction Solar Cells |
url | https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-01-28T23%3A06%3A27IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-proquest_RIE&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.genre=article&rft.atitle=Electron%20Irradiation%20Effects%20and%20Defects%20Analysis%20of%20the%20Inverted%20Metamorphic%20Four-Junction%20Solar%20Cells&rft.jtitle=IEEE%20journal%20of%20photovoltaics&rft.au=Zhang,%20Yanqing&rft.date=2020-11-01&rft.volume=10&rft.issue=6&rft.spage=1712&rft.epage=1720&rft.pages=1712-1720&rft.issn=2156-3381&rft.eissn=2156-3403&rft.coden=IJPEG8&rft_id=info:doi/10.1109/JPHOTOV.2020.3025442&rft_dat=%3Cproquest_RIE%3E2453815275%3C/proquest_RIE%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_pqid=2453815275&rft_id=info:pmid/&rft_ieee_id=9212651&rfr_iscdi=true |