In Silico Prediction of Critical Micelle Concentration (CMC) of Classic and Extended Anionic Surfactants from Their Molecular Structural Descriptors

CMC is an important parameter for the characterization of surfactants. Compared to other properties, the CMC can be correlated with surfactants performance characteristics on an industrial scale. In this investigation, QSPR models were established to identify the relation between the molecular struc...

Ausführliche Beschreibung

Gespeichert in:
Bibliographische Detailangaben
Veröffentlicht in:Arabian journal for science and engineering (2011) 2020-09, Vol.45 (9), p.7445-7454
Hauptverfasser: Rahal, S., Hadidi, N., Hamadache, M.
Format: Artikel
Sprache:eng
Schlagworte:
Online-Zugang:Volltext
Tags: Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!