Theoretical Approach to Analysis of X-Ray Grazing-Incidence Diffraction from 2D Crystals
A theoretical formalism for quantitative description of X-ray diffraction from Langmuir monolayers under conditions of total external reflection has been developed. The proposed approach, based on the distorted-wave approximation, allows to consider physical mechanisms for plotting diffraction curve...
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| Veröffentlicht in: | Crystallography reports 2020-09, Vol.65 (5), p.772-778 |
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| container_title | Crystallography reports |
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| creator | Chuev, M. A. Prutskov, G. V. Novikova, N. N. Pashaev, E. M. Konovalov, O. V. Stepina, N. D. Rogachev, A. V. Yakunin, S. N. |
| description | A theoretical formalism for quantitative description of X-ray diffraction from Langmuir monolayers under conditions of total external reflection has been developed. The proposed approach, based on the distorted-wave approximation, allows to consider physical mechanisms for plotting diffraction curves and maps (in the reciprocal space) for real monolayers and describe self-consistently specific features of Bragg peaks. The resulting algorithm can easily be implemented on a personal computer, which provides the opportunities to carry out numerical simulation of experimental two-dimensional diffraction intensity maps and determine reliably both the mean values of structural parameters of layers and their rms deviations. |
| doi_str_mv | 10.1134/S1063774520050041 |
| format | Article |
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A. ; Prutskov, G. V. ; Novikova, N. N. ; Pashaev, E. M. ; Konovalov, O. V. ; Stepina, N. D. ; Rogachev, A. V. ; Yakunin, S. N.</creator><creatorcontrib>Chuev, M. A. ; Prutskov, G. V. ; Novikova, N. N. ; Pashaev, E. M. ; Konovalov, O. V. ; Stepina, N. D. ; Rogachev, A. V. ; Yakunin, S. N.</creatorcontrib><description>A theoretical formalism for quantitative description of X-ray diffraction from Langmuir monolayers under conditions of total external reflection has been developed. The proposed approach, based on the distorted-wave approximation, allows to consider physical mechanisms for plotting diffraction curves and maps (in the reciprocal space) for real monolayers and describe self-consistently specific features of Bragg peaks. 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The resulting algorithm can easily be implemented on a personal computer, which provides the opportunities to carry out numerical simulation of experimental two-dimensional diffraction intensity maps and determine reliably both the mean values of structural parameters of layers and their rms deviations.</description><subject>Algorithms</subject><subject>Crystallography and Scattering Methods</subject><subject>Monolayers</subject><subject>Monomolecular films</subject><subject>Personal computers</subject><subject>Physics</subject><subject>Physics and Astronomy</subject><subject>Surface and Thin Films</subject><subject>Wave diffraction</subject><issn>1063-7745</issn><issn>1562-689X</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2020</creationdate><recordtype>article</recordtype><recordid>eNp1kEFLAzEUhIMoWKs_wFvAc_Rlk-wmx9JqLRQErdDbks0m7ZZ2U5PtYf31TangQTzNgzffMAxC9xQeKWX86YNCzoqCiwxAAHB6gQZU5BnJpVpepju9yel_jW5i3ACAlJQP0HKxtj7YrjF6i0f7ffDarHHn8ajV2z42EXuHl-Rd93ga9HfTrsisNU1tW2PxpHEuaNM1vsUu-B3OJngc-tjpbbxFVy6JvfvRIfp8eV6MX8n8bTobj-bEZLnsSG11bmmRK2u1pM4ZUFDLXMuKFQJqwZR1olbO1lTIomK8AFrxhOrKmRokG6KHc26q_nWwsSs3_hBS-VhmXAADpYAlFz27TPAxBuvKfWh2OvQlhfI0YPlnwMRkZyYmb7uy4Tf5f-gIhOdxvw</recordid><startdate>20200901</startdate><enddate>20200901</enddate><creator>Chuev, M. 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Rep</stitle><date>2020-09-01</date><risdate>2020</risdate><volume>65</volume><issue>5</issue><spage>772</spage><epage>778</epage><pages>772-778</pages><issn>1063-7745</issn><eissn>1562-689X</eissn><abstract>A theoretical formalism for quantitative description of X-ray diffraction from Langmuir monolayers under conditions of total external reflection has been developed. The proposed approach, based on the distorted-wave approximation, allows to consider physical mechanisms for plotting diffraction curves and maps (in the reciprocal space) for real monolayers and describe self-consistently specific features of Bragg peaks. 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| subjects | Algorithms Crystallography and Scattering Methods Monolayers Monomolecular films Personal computers Physics Physics and Astronomy Surface and Thin Films Wave diffraction |
| title | Theoretical Approach to Analysis of X-Ray Grazing-Incidence Diffraction from 2D Crystals |
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