Size dependency in stacking fault-mediated ultrahard high-entropy alloy thin films

High-entropy alloy (HEA) thin films are known to exhibit excellent and tunable mechanical properties, making it an attractive candidate for various engineering applications. A series of nanocrystalline face-centered cubic (FCC) Al0·1CoCrFeNi HEA films with film thicknesses spanning from 250 to 1500 ...

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Veröffentlicht in:	Journal of alloys and compounds 2020-12, Vol.844, p.156187, Article 156187
Hauptverfasser:	Feng, Xiaobin, Surjadi, James Utama, Li, Xiaocui, Lu, Yang
Format:	Artikel
Sprache:	eng
Schlagworte:	Activation Deformation mechanism Dependence Face centered cubic lattice Film thickness Grain size Hardness High entropy alloys High-entropy alloy Magnetron sputtering Mechanical properties Size effect Stacking fault Stacking faults Strain rate sensitivity Thin film Thin films
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