Carrier conduction mechanisms of WSe2/p-type Ge epilayer heterojunction depending on the measurement temperature and applied bias

We have fabricated a WSe2/p-type Ge epilayer heterojunction and analyzed its electrical and carrier transport characteristics by temperature-dependent current–voltage (I–V) measurements in the range of 125–375 K. The WSe2/p-type Ge heterojunction showed rectifying I-V characteristics at room tempera...

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Veröffentlicht in:Journal of alloys and compounds 2020-11, Vol.842, p.155843, Article 155843
Hauptverfasser: Janardhanam, V., Jyothi, I., Kim, Yonghun, Lee, Sung-Nam, Yun, Hyung-Joong, Hong, Woong-Ki, Choi, Chel-Jong
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Sprache:eng
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