P‐182: A Numerical Analysis of Current Efficiency Hump at Low Grey in the OLED Devices
The hump behavior of current efficiency in OLEDs(Organic Light Emitting Diodes) were often observed at the low voltage under certain charge balance condition. The color non‐linearity with image sticking in the low voltage level was found to be well correlated with the existence of hump phenomena. In...
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| Veröffentlicht in: | SID International Symposium Digest of technical papers 2020-08, Vol.51 (1), p.2061-2062 |
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| creator | Cho, Hyung Uk Kim, Bo Woon Lee, Jun Young Cho, Young Mi Baek, Seung In Kim, Yong Jo |
| description | The hump behavior of current efficiency in OLEDs(Organic Light Emitting Diodes) were often observed at the low voltage under certain charge balance condition. The color non‐linearity with image sticking in the low voltage level was found to be well correlated with the existence of hump phenomena. In this paper, we explained the mechanism of hump is trade‐off between Langevin recombination and SRH(Schokley‐Reed‐Hall) recombination, and found out SRH recombination could be mainly controlled by EML(Emitting Layer)/ETL(Electron Transport Layer) interface barrier using OLED device simulation. Additionally we could suggest the conditions that reduce the hump at the low grey region to improve the performance of OLED device. Finally the color non‐linearity of OLED device was improved by elimination of hump behavior. |
| doi_str_mv | 10.1002/sdtp.14325 |
| format | Article |
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The color non‐linearity with image sticking in the low voltage level was found to be well correlated with the existence of hump phenomena. In this paper, we explained the mechanism of hump is trade‐off between Langevin recombination and SRH(Schokley‐Reed‐Hall) recombination, and found out SRH recombination could be mainly controlled by EML(Emitting Layer)/ETL(Electron Transport Layer) interface barrier using OLED device simulation. Additionally we could suggest the conditions that reduce the hump at the low grey region to improve the performance of OLED device. Finally the color non‐linearity of OLED device was improved by elimination of hump behavior.</description><identifier>ISSN: 0097-966X</identifier><identifier>EISSN: 2168-0159</identifier><identifier>DOI: 10.1002/sdtp.14325</identifier><language>eng</language><publisher>Campbell: Wiley Subscription Services, Inc</publisher><subject>Color ; Computer simulation ; Current efficiency ; Electron transport ; Linearity ; Low voltage ; Numerical analysis ; Organic light emitting diodes ; Performance enhancement</subject><ispartof>SID International Symposium Digest of technical papers, 2020-08, Vol.51 (1), p.2061-2062</ispartof><rights>2020 The Society for Information Display</rights><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktopdf>$$Uhttps://onlinelibrary.wiley.com/doi/pdf/10.1002%2Fsdtp.14325$$EPDF$$P50$$Gwiley$$H</linktopdf><linktohtml>$$Uhttps://onlinelibrary.wiley.com/doi/full/10.1002%2Fsdtp.14325$$EHTML$$P50$$Gwiley$$H</linktohtml><link.rule.ids>314,776,780,1411,27901,27902,45550,45551</link.rule.ids></links><search><creatorcontrib>Cho, Hyung Uk</creatorcontrib><creatorcontrib>Kim, Bo Woon</creatorcontrib><creatorcontrib>Lee, Jun Young</creatorcontrib><creatorcontrib>Cho, Young Mi</creatorcontrib><creatorcontrib>Baek, Seung In</creatorcontrib><creatorcontrib>Kim, Yong Jo</creatorcontrib><title>P‐182: A Numerical Analysis of Current Efficiency Hump at Low Grey in the OLED Devices</title><title>SID International Symposium Digest of technical papers</title><description>The hump behavior of current efficiency in OLEDs(Organic Light Emitting Diodes) were often observed at the low voltage under certain charge balance condition. The color non‐linearity with image sticking in the low voltage level was found to be well correlated with the existence of hump phenomena. In this paper, we explained the mechanism of hump is trade‐off between Langevin recombination and SRH(Schokley‐Reed‐Hall) recombination, and found out SRH recombination could be mainly controlled by EML(Emitting Layer)/ETL(Electron Transport Layer) interface barrier using OLED device simulation. Additionally we could suggest the conditions that reduce the hump at the low grey region to improve the performance of OLED device. Finally the color non‐linearity of OLED device was improved by elimination of hump behavior.</description><subject>Color</subject><subject>Computer simulation</subject><subject>Current efficiency</subject><subject>Electron transport</subject><subject>Linearity</subject><subject>Low voltage</subject><subject>Numerical analysis</subject><subject>Organic light emitting diodes</subject><subject>Performance enhancement</subject><issn>0097-966X</issn><issn>2168-0159</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2020</creationdate><recordtype>article</recordtype><recordid>eNp9kM1Kw0AYRQdRsFY3PsGAOyH1m7804660tRWCLdhFdyGdzOCUNIkziSU7H8Fn9ElMjWtXd3Pu5XIQuiUwIgD0wWd1NSKcUXGGBpSEUQBEyHM0AJDjQIbh9hJdeb8HYIxzOUDb9ffnF4noI57gl-agnVVpjidFmrfeelwaPG2c00WN58ZYZXWhWrxsDhVOaxyXR7xwusW2wPWbxqt4PsMz_WGV9tfowqS51zd_OUSbp_lmugzi1eJ5OokDRUCIYEfGIY0yMJyySIDUoQETUsK78wxAMEWFEjDmoZCcRCCVMFGWhSalTO0MG6K7frZy5XujfZ3sy8Z1931COReSSUZ5R933lHKl906bpHL2kLo2IZCcxCUnccmvuA4mPXy0uW7_IZPX2Wbdd34AJBBtpA</recordid><startdate>202008</startdate><enddate>202008</enddate><creator>Cho, Hyung Uk</creator><creator>Kim, Bo Woon</creator><creator>Lee, Jun Young</creator><creator>Cho, Young Mi</creator><creator>Baek, Seung In</creator><creator>Kim, Yong Jo</creator><general>Wiley Subscription Services, Inc</general><scope>AAYXX</scope><scope>CITATION</scope><scope>7SC</scope><scope>7SP</scope><scope>8FD</scope><scope>JQ2</scope><scope>L7M</scope><scope>L~C</scope><scope>L~D</scope></search><sort><creationdate>202008</creationdate><title>P‐182: A Numerical Analysis of Current Efficiency Hump at Low Grey in the OLED Devices</title><author>Cho, Hyung Uk ; Kim, Bo Woon ; Lee, Jun Young ; Cho, Young Mi ; Baek, Seung In ; Kim, Yong Jo</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c1055-b17628d0f4238509e6f0f621421630053c25c507465941809c5f8dd6fa23cbf3</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2020</creationdate><topic>Color</topic><topic>Computer simulation</topic><topic>Current efficiency</topic><topic>Electron transport</topic><topic>Linearity</topic><topic>Low voltage</topic><topic>Numerical analysis</topic><topic>Organic light emitting diodes</topic><topic>Performance enhancement</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Cho, Hyung Uk</creatorcontrib><creatorcontrib>Kim, Bo Woon</creatorcontrib><creatorcontrib>Lee, Jun Young</creatorcontrib><creatorcontrib>Cho, Young Mi</creatorcontrib><creatorcontrib>Baek, Seung In</creatorcontrib><creatorcontrib>Kim, Yong Jo</creatorcontrib><collection>CrossRef</collection><collection>Computer and Information Systems Abstracts</collection><collection>Electronics & Communications Abstracts</collection><collection>Technology Research Database</collection><collection>ProQuest Computer Science Collection</collection><collection>Advanced Technologies Database with Aerospace</collection><collection>Computer and Information Systems Abstracts Academic</collection><collection>Computer and Information Systems Abstracts Professional</collection><jtitle>SID International Symposium Digest of technical papers</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Cho, Hyung Uk</au><au>Kim, Bo Woon</au><au>Lee, Jun Young</au><au>Cho, Young Mi</au><au>Baek, Seung In</au><au>Kim, Yong Jo</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>P‐182: A Numerical Analysis of Current Efficiency Hump at Low Grey in the OLED Devices</atitle><jtitle>SID International Symposium Digest of technical papers</jtitle><date>2020-08</date><risdate>2020</risdate><volume>51</volume><issue>1</issue><spage>2061</spage><epage>2062</epage><pages>2061-2062</pages><issn>0097-966X</issn><eissn>2168-0159</eissn><abstract>The hump behavior of current efficiency in OLEDs(Organic Light Emitting Diodes) were often observed at the low voltage under certain charge balance condition. 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| subjects | Color Computer simulation Current efficiency Electron transport Linearity Low voltage Numerical analysis Organic light emitting diodes Performance enhancement |
| title | P‐182: A Numerical Analysis of Current Efficiency Hump at Low Grey in the OLED Devices |
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