Correction to: A novel impedimetric sensor for trace level detection of dimethyl sulfide (DMS)

The original version of this paper was unfortunately published with some errors which are corrected by publishing this Correction article.

Gespeichert in:
Bibliographische Detailangaben
Veröffentlicht in:Journal of materials science. Materials in electronics 2020-09, Vol.31 (18), p.16087-16087
Hauptverfasser: Iden, Hassan, de Faria, Ricardo Adriano Dorledo, Heneine, Luiz Guilherme Dias, Matencio, Tulio, Messaddeq, Younès
Format: Artikel
Sprache:eng
Schlagworte:
Online-Zugang:Volltext
Tags: Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
container_end_page 16087
container_issue 18
container_start_page 16087
container_title Journal of materials science. Materials in electronics
container_volume 31
creator Iden, Hassan
de Faria, Ricardo Adriano Dorledo
Heneine, Luiz Guilherme Dias
Matencio, Tulio
Messaddeq, Younès
description The original version of this paper was unfortunately published with some errors which are corrected by publishing this Correction article.
doi_str_mv 10.1007/s10854-020-04197-7
format Article
fullrecord <record><control><sourceid>proquest_cross</sourceid><recordid>TN_cdi_proquest_journals_2439112755</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>2439112755</sourcerecordid><originalsourceid>FETCH-LOGICAL-c1597-b0f67e26b7715f30cb717b9ceaa7accf6d1b657b6b2ed68d56be588e1fdcd1253</originalsourceid><addsrcrecordid>eNp9kD1PwzAQhi0EEqXwB5gsscBgsJ3YTtiq8ikVMQASE1ZsnyFVGhc7Req_J20qsTGcbnme904vQqeMXjJK1VVitBA5oZwSmrNSEbWHRkyojOQFf99HI1oKRXLB-SE6SmlOKZV5VozQxzTECLarQ4u7cI0nuA0_0OB6sQRXL6CLtcUJ2hQi9v10sbKAG9gwDrqdGTzewl_rBqdV42sH-Pzm6eXiGB34qklwsttj9HZ3-zp9ILPn-8fpZEYsE_23hnqpgEujFBM-o9YopkxpoapUZa2XjhkplJGGg5OFE9KAKApg3lnHuMjG6GzIXcbwvYLU6XlYxbY_qXmelYxxJTYUHygbQ0oRvF7GelHFtWZUb3rUQ4-671Fve9Sql7JBSj3cfkL8i_7H-gWZgHZr</addsrcrecordid><sourcetype>Aggregation Database</sourcetype><iscdi>true</iscdi><recordtype>article</recordtype><pqid>2439112755</pqid></control><display><type>article</type><title>Correction to: A novel impedimetric sensor for trace level detection of dimethyl sulfide (DMS)</title><source>SpringerLink Journals</source><creator>Iden, Hassan ; de Faria, Ricardo Adriano Dorledo ; Heneine, Luiz Guilherme Dias ; Matencio, Tulio ; Messaddeq, Younès</creator><creatorcontrib>Iden, Hassan ; de Faria, Ricardo Adriano Dorledo ; Heneine, Luiz Guilherme Dias ; Matencio, Tulio ; Messaddeq, Younès</creatorcontrib><description>The original version of this paper was unfortunately published with some errors which are corrected by publishing this Correction article.</description><identifier>ISSN: 0957-4522</identifier><identifier>EISSN: 1573-482X</identifier><identifier>DOI: 10.1007/s10854-020-04197-7</identifier><language>eng</language><publisher>New York: Springer US</publisher><subject>Characterization and Evaluation of Materials ; Chemistry and Materials Science ; Materials Science ; Optical and Electronic Materials ; Publisher Correction</subject><ispartof>Journal of materials science. Materials in electronics, 2020-09, Vol.31 (18), p.16087-16087</ispartof><rights>Springer Science+Business Media, LLC, part of Springer Nature 2020</rights><rights>Springer Science+Business Media, LLC, part of Springer Nature 2020.</rights><lds50>peer_reviewed</lds50><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed><orcidid>0000-0002-7025-7042</orcidid></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktopdf>$$Uhttps://link.springer.com/content/pdf/10.1007/s10854-020-04197-7$$EPDF$$P50$$Gspringer$$H</linktopdf><linktohtml>$$Uhttps://link.springer.com/10.1007/s10854-020-04197-7$$EHTML$$P50$$Gspringer$$H</linktohtml><link.rule.ids>314,780,784,27924,27925,41488,42557,51319</link.rule.ids></links><search><creatorcontrib>Iden, Hassan</creatorcontrib><creatorcontrib>de Faria, Ricardo Adriano Dorledo</creatorcontrib><creatorcontrib>Heneine, Luiz Guilherme Dias</creatorcontrib><creatorcontrib>Matencio, Tulio</creatorcontrib><creatorcontrib>Messaddeq, Younès</creatorcontrib><title>Correction to: A novel impedimetric sensor for trace level detection of dimethyl sulfide (DMS)</title><title>Journal of materials science. Materials in electronics</title><addtitle>J Mater Sci: Mater Electron</addtitle><description>The original version of this paper was unfortunately published with some errors which are corrected by publishing this Correction article.</description><subject>Characterization and Evaluation of Materials</subject><subject>Chemistry and Materials Science</subject><subject>Materials Science</subject><subject>Optical and Electronic Materials</subject><subject>Publisher Correction</subject><issn>0957-4522</issn><issn>1573-482X</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2020</creationdate><recordtype>article</recordtype><sourceid>AFKRA</sourceid><sourceid>BENPR</sourceid><sourceid>CCPQU</sourceid><sourceid>DWQXO</sourceid><recordid>eNp9kD1PwzAQhi0EEqXwB5gsscBgsJ3YTtiq8ikVMQASE1ZsnyFVGhc7Req_J20qsTGcbnme904vQqeMXjJK1VVitBA5oZwSmrNSEbWHRkyojOQFf99HI1oKRXLB-SE6SmlOKZV5VozQxzTECLarQ4u7cI0nuA0_0OB6sQRXL6CLtcUJ2hQi9v10sbKAG9gwDrqdGTzewl_rBqdV42sH-Pzm6eXiGB34qklwsttj9HZ3-zp9ILPn-8fpZEYsE_23hnqpgEujFBM-o9YopkxpoapUZa2XjhkplJGGg5OFE9KAKApg3lnHuMjG6GzIXcbwvYLU6XlYxbY_qXmelYxxJTYUHygbQ0oRvF7GelHFtWZUb3rUQ4-671Fve9Sql7JBSj3cfkL8i_7H-gWZgHZr</recordid><startdate>20200901</startdate><enddate>20200901</enddate><creator>Iden, Hassan</creator><creator>de Faria, Ricardo Adriano Dorledo</creator><creator>Heneine, Luiz Guilherme Dias</creator><creator>Matencio, Tulio</creator><creator>Messaddeq, Younès</creator><general>Springer US</general><general>Springer Nature B.V</general><scope>AAYXX</scope><scope>CITATION</scope><scope>7SP</scope><scope>7SR</scope><scope>8BQ</scope><scope>8FD</scope><scope>8FE</scope><scope>8FG</scope><scope>ABJCF</scope><scope>AFKRA</scope><scope>ARAPS</scope><scope>BENPR</scope><scope>BGLVJ</scope><scope>CCPQU</scope><scope>D1I</scope><scope>DWQXO</scope><scope>F28</scope><scope>FR3</scope><scope>HCIFZ</scope><scope>JG9</scope><scope>KB.</scope><scope>L7M</scope><scope>P5Z</scope><scope>P62</scope><scope>PDBOC</scope><scope>PQEST</scope><scope>PQQKQ</scope><scope>PQUKI</scope><scope>PRINS</scope><scope>S0W</scope><orcidid>https://orcid.org/0000-0002-7025-7042</orcidid></search><sort><creationdate>20200901</creationdate><title>Correction to: A novel impedimetric sensor for trace level detection of dimethyl sulfide (DMS)</title><author>Iden, Hassan ; de Faria, Ricardo Adriano Dorledo ; Heneine, Luiz Guilherme Dias ; Matencio, Tulio ; Messaddeq, Younès</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c1597-b0f67e26b7715f30cb717b9ceaa7accf6d1b657b6b2ed68d56be588e1fdcd1253</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2020</creationdate><topic>Characterization and Evaluation of Materials</topic><topic>Chemistry and Materials Science</topic><topic>Materials Science</topic><topic>Optical and Electronic Materials</topic><topic>Publisher Correction</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Iden, Hassan</creatorcontrib><creatorcontrib>de Faria, Ricardo Adriano Dorledo</creatorcontrib><creatorcontrib>Heneine, Luiz Guilherme Dias</creatorcontrib><creatorcontrib>Matencio, Tulio</creatorcontrib><creatorcontrib>Messaddeq, Younès</creatorcontrib><collection>CrossRef</collection><collection>Electronics &amp; Communications Abstracts</collection><collection>Engineered Materials Abstracts</collection><collection>METADEX</collection><collection>Technology Research Database</collection><collection>ProQuest SciTech Collection</collection><collection>ProQuest Technology Collection</collection><collection>Materials Science &amp; Engineering Collection</collection><collection>ProQuest Central UK/Ireland</collection><collection>Advanced Technologies &amp; Aerospace Collection</collection><collection>ProQuest Central</collection><collection>Technology Collection</collection><collection>ProQuest One Community College</collection><collection>ProQuest Materials Science Collection</collection><collection>ProQuest Central Korea</collection><collection>ANTE: Abstracts in New Technology &amp; Engineering</collection><collection>Engineering Research Database</collection><collection>SciTech Premium Collection</collection><collection>Materials Research Database</collection><collection>Materials Science Database</collection><collection>Advanced Technologies Database with Aerospace</collection><collection>Advanced Technologies &amp; Aerospace Database</collection><collection>ProQuest Advanced Technologies &amp; Aerospace Collection</collection><collection>Materials Science Collection</collection><collection>ProQuest One Academic Eastern Edition (DO NOT USE)</collection><collection>ProQuest One Academic</collection><collection>ProQuest One Academic UKI Edition</collection><collection>ProQuest Central China</collection><collection>DELNET Engineering &amp; Technology Collection</collection><jtitle>Journal of materials science. Materials in electronics</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Iden, Hassan</au><au>de Faria, Ricardo Adriano Dorledo</au><au>Heneine, Luiz Guilherme Dias</au><au>Matencio, Tulio</au><au>Messaddeq, Younès</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Correction to: A novel impedimetric sensor for trace level detection of dimethyl sulfide (DMS)</atitle><jtitle>Journal of materials science. Materials in electronics</jtitle><stitle>J Mater Sci: Mater Electron</stitle><date>2020-09-01</date><risdate>2020</risdate><volume>31</volume><issue>18</issue><spage>16087</spage><epage>16087</epage><pages>16087-16087</pages><issn>0957-4522</issn><eissn>1573-482X</eissn><abstract>The original version of this paper was unfortunately published with some errors which are corrected by publishing this Correction article.</abstract><cop>New York</cop><pub>Springer US</pub><doi>10.1007/s10854-020-04197-7</doi><tpages>1</tpages><orcidid>https://orcid.org/0000-0002-7025-7042</orcidid><oa>free_for_read</oa></addata></record>
fulltext fulltext
identifier ISSN: 0957-4522
ispartof Journal of materials science. Materials in electronics, 2020-09, Vol.31 (18), p.16087-16087
issn 0957-4522
1573-482X
language eng
recordid cdi_proquest_journals_2439112755
source SpringerLink Journals
subjects Characterization and Evaluation of Materials
Chemistry and Materials Science
Materials Science
Optical and Electronic Materials
Publisher Correction
title Correction to: A novel impedimetric sensor for trace level detection of dimethyl sulfide (DMS)
url https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2024-12-24T00%3A36%3A08IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-proquest_cross&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.genre=article&rft.atitle=Correction%20to:%20A%20novel%20impedimetric%20sensor%20for%20trace%20level%20detection%20of%20dimethyl%20sulfide%20(DMS)&rft.jtitle=Journal%20of%20materials%20science.%20Materials%20in%20electronics&rft.au=Iden,%20Hassan&rft.date=2020-09-01&rft.volume=31&rft.issue=18&rft.spage=16087&rft.epage=16087&rft.pages=16087-16087&rft.issn=0957-4522&rft.eissn=1573-482X&rft_id=info:doi/10.1007/s10854-020-04197-7&rft_dat=%3Cproquest_cross%3E2439112755%3C/proquest_cross%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_pqid=2439112755&rft_id=info:pmid/&rfr_iscdi=true