Effect of Vanadium Content on the Microwave Dielectric Properties of Sr2VxO7 (1.80 ≤ x ≤ 2.05) Ceramics
Vanadium content has a prominent effect on the microwave dielectric properties of Sr 2 V x O 7 (1.80 ≤ x ≤ 2.05) ceramics, which is related to extrinsic factors and intrinsic factors, such as secondary phase, bulk density, crystal structure, and V–O bond length. Rietveld refinement, energy dispers...
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| Veröffentlicht in: | Journal of electronic materials 2020-10, Vol.49 (10), p.6136-6142 |
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| creator | Yao, Pengyu Deng, Yaping Li, Bo |
| description | Vanadium content has a prominent effect on the microwave dielectric properties of Sr
2
V
x
O
7
(1.80 ≤
x
≤ 2.05) ceramics, which is related to extrinsic factors and intrinsic factors, such as secondary phase, bulk density, crystal structure, and V–O bond length. Rietveld refinement, energy dispersive spectroscopy, and Raman spectra analysis revealed that an appropriate vanadium deficiency causes the appearance of secondary phase Sr
3
V
2
O
8
, which results in the variation of unit cell volume and the significant improvement of
Q
×
f
value and the temperature coefficient of resonant frequency. Specifically, the Sr
2
V
1.90
O
7
ceramic sintered at 950°C possesses optimum microwave dielectric performances: the dielectric constant of 11.1, the
Q
×
f
value of 36,500 GHz, and the temperature coefficient of resonant frequency of − 35.6 ppm/°C. |
| doi_str_mv | 10.1007/s11664-020-08360-y |
| format | Article |
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2
V
x
O
7
(1.80 ≤
x
≤ 2.05) ceramics, which is related to extrinsic factors and intrinsic factors, such as secondary phase, bulk density, crystal structure, and V–O bond length. Rietveld refinement, energy dispersive spectroscopy, and Raman spectra analysis revealed that an appropriate vanadium deficiency causes the appearance of secondary phase Sr
3
V
2
O
8
, which results in the variation of unit cell volume and the significant improvement of
Q
×
f
value and the temperature coefficient of resonant frequency. Specifically, the Sr
2
V
1.90
O
7
ceramic sintered at 950°C possesses optimum microwave dielectric performances: the dielectric constant of 11.1, the
Q
×
f
value of 36,500 GHz, and the temperature coefficient of resonant frequency of − 35.6 ppm/°C.</description><identifier>ISSN: 0361-5235</identifier><identifier>EISSN: 1543-186X</identifier><identifier>DOI: 10.1007/s11664-020-08360-y</identifier><language>eng</language><publisher>New York: Springer US</publisher><subject>Bulk density ; Ceramics ; Characterization and Evaluation of Materials ; Chemistry and Materials Science ; Crystal structure ; Dielectric properties ; Electronics and Microelectronics ; Instrumentation ; Materials Science ; Optical and Electronic Materials ; Raman spectra ; Resonant frequencies ; Solid State Physics ; Spectrum analysis ; Unit cell ; Vanadium</subject><ispartof>Journal of electronic materials, 2020-10, Vol.49 (10), p.6136-6142</ispartof><rights>The Minerals, Metals & Materials Society 2020</rights><rights>The Minerals, Metals & Materials Society 2020.</rights><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c249t-a6a8317b4bf8506bbabf5fd7adcb48594f71b410892cf16f77a66aeee1b0102c3</citedby><cites>FETCH-LOGICAL-c249t-a6a8317b4bf8506bbabf5fd7adcb48594f71b410892cf16f77a66aeee1b0102c3</cites><orcidid>0000-0002-7262-8310</orcidid></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktopdf>$$Uhttps://link.springer.com/content/pdf/10.1007/s11664-020-08360-y$$EPDF$$P50$$Gspringer$$H</linktopdf><linktohtml>$$Uhttps://link.springer.com/10.1007/s11664-020-08360-y$$EHTML$$P50$$Gspringer$$H</linktohtml><link.rule.ids>315,781,785,27926,27927,41490,42559,51321</link.rule.ids></links><search><creatorcontrib>Yao, Pengyu</creatorcontrib><creatorcontrib>Deng, Yaping</creatorcontrib><creatorcontrib>Li, Bo</creatorcontrib><title>Effect of Vanadium Content on the Microwave Dielectric Properties of Sr2VxO7 (1.80 ≤ x ≤ 2.05) Ceramics</title><title>Journal of electronic materials</title><addtitle>Journal of Elec Materi</addtitle><description>Vanadium content has a prominent effect on the microwave dielectric properties of Sr
2
V
x
O
7
(1.80 ≤
x
≤ 2.05) ceramics, which is related to extrinsic factors and intrinsic factors, such as secondary phase, bulk density, crystal structure, and V–O bond length. Rietveld refinement, energy dispersive spectroscopy, and Raman spectra analysis revealed that an appropriate vanadium deficiency causes the appearance of secondary phase Sr
3
V
2
O
8
, which results in the variation of unit cell volume and the significant improvement of
Q
×
f
value and the temperature coefficient of resonant frequency. Specifically, the Sr
2
V
1.90
O
7
ceramic sintered at 950°C possesses optimum microwave dielectric performances: the dielectric constant of 11.1, the
Q
×
f
value of 36,500 GHz, and the temperature coefficient of resonant frequency of − 35.6 ppm/°C.</description><subject>Bulk density</subject><subject>Ceramics</subject><subject>Characterization and Evaluation of Materials</subject><subject>Chemistry and Materials Science</subject><subject>Crystal structure</subject><subject>Dielectric properties</subject><subject>Electronics and Microelectronics</subject><subject>Instrumentation</subject><subject>Materials Science</subject><subject>Optical and Electronic Materials</subject><subject>Raman spectra</subject><subject>Resonant frequencies</subject><subject>Solid State Physics</subject><subject>Spectrum analysis</subject><subject>Unit cell</subject><subject>Vanadium</subject><issn>0361-5235</issn><issn>1543-186X</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2020</creationdate><recordtype>article</recordtype><sourceid>8G5</sourceid><sourceid>ABUWG</sourceid><sourceid>AFKRA</sourceid><sourceid>AZQEC</sourceid><sourceid>BENPR</sourceid><sourceid>CCPQU</sourceid><sourceid>DWQXO</sourceid><sourceid>GNUQQ</sourceid><sourceid>GUQSH</sourceid><sourceid>M2O</sourceid><recordid>eNp9kE1OwzAQhS0EEqVwAVaW2MAiZcZJbHeJSvmRiooEVOwsJ7UhFU2KnUK7Y9t7cLKeBJcg2LGZGY3e90bzCDlE6CCAOPWInCcRMIhAxhyi5RZpYZrEEUr-uE1aEHOMUhanu2TP-wkApiixRXzfWpPXtLJ0pEs9LuZT2qvK2pRhV9L62dCbInfVu34z9LwwL0HsipzeumpmXF0Yv0HvHBsthoIeY0fC-mO1Xn2GuvidWAfSE9ozTk-L3O-THatfvDn46W3ycNG_711Fg-Hlde9sEOUs6daR5lrGKLIkszIFnmU6s6kdCz3Os0Sm3cQKzBIE2WW5RW6F0JxrYwxmgMDyuE2OGt-Zq17nxtdqUs1dGU4qlsRSAhdCBBVrVOFL752xauaKqXZLhaA24aomXBXCVd_hqmWA4gbyQVw-Gfdn_Q_1Bb0Wgbg</recordid><startdate>20201001</startdate><enddate>20201001</enddate><creator>Yao, Pengyu</creator><creator>Deng, Yaping</creator><creator>Li, Bo</creator><general>Springer US</general><general>Springer Nature B.V</general><scope>AAYXX</scope><scope>CITATION</scope><scope>3V.</scope><scope>7XB</scope><scope>88I</scope><scope>8AF</scope><scope>8AO</scope><scope>8FE</scope><scope>8FG</scope><scope>8FK</scope><scope>8G5</scope><scope>ABJCF</scope><scope>ABUWG</scope><scope>AFKRA</scope><scope>ARAPS</scope><scope>AZQEC</scope><scope>BENPR</scope><scope>BGLVJ</scope><scope>CCPQU</scope><scope>D1I</scope><scope>DWQXO</scope><scope>GNUQQ</scope><scope>GUQSH</scope><scope>HCIFZ</scope><scope>KB.</scope><scope>L6V</scope><scope>M2O</scope><scope>M2P</scope><scope>M7S</scope><scope>MBDVC</scope><scope>P5Z</scope><scope>P62</scope><scope>PDBOC</scope><scope>PQEST</scope><scope>PQQKQ</scope><scope>PQUKI</scope><scope>PRINS</scope><scope>PTHSS</scope><scope>Q9U</scope><scope>S0X</scope><orcidid>https://orcid.org/0000-0002-7262-8310</orcidid></search><sort><creationdate>20201001</creationdate><title>Effect of Vanadium Content on the Microwave Dielectric Properties of Sr2VxO7 (1.80 ≤ x ≤ 2.05) Ceramics</title><author>Yao, Pengyu ; Deng, Yaping ; Li, Bo</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c249t-a6a8317b4bf8506bbabf5fd7adcb48594f71b410892cf16f77a66aeee1b0102c3</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2020</creationdate><topic>Bulk density</topic><topic>Ceramics</topic><topic>Characterization and Evaluation of Materials</topic><topic>Chemistry and Materials Science</topic><topic>Crystal structure</topic><topic>Dielectric properties</topic><topic>Electronics and Microelectronics</topic><topic>Instrumentation</topic><topic>Materials Science</topic><topic>Optical and Electronic Materials</topic><topic>Raman spectra</topic><topic>Resonant frequencies</topic><topic>Solid State Physics</topic><topic>Spectrum analysis</topic><topic>Unit cell</topic><topic>Vanadium</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Yao, Pengyu</creatorcontrib><creatorcontrib>Deng, Yaping</creatorcontrib><creatorcontrib>Li, Bo</creatorcontrib><collection>CrossRef</collection><collection>ProQuest Central (Corporate)</collection><collection>ProQuest Central (purchase pre-March 2016)</collection><collection>Science Database (Alumni Edition)</collection><collection>STEM Database</collection><collection>ProQuest Pharma Collection</collection><collection>ProQuest SciTech Collection</collection><collection>ProQuest Technology Collection</collection><collection>ProQuest Central (Alumni) (purchase pre-March 2016)</collection><collection>Research Library (Alumni Edition)</collection><collection>Materials Science & Engineering Collection</collection><collection>ProQuest Central (Alumni Edition)</collection><collection>ProQuest Central UK/Ireland</collection><collection>Advanced Technologies & Aerospace Collection</collection><collection>ProQuest Central Essentials</collection><collection>ProQuest Central</collection><collection>Technology Collection</collection><collection>ProQuest One Community College</collection><collection>ProQuest Materials Science Collection</collection><collection>ProQuest Central Korea</collection><collection>ProQuest Central Student</collection><collection>Research Library Prep</collection><collection>SciTech Premium Collection</collection><collection>Materials Science Database</collection><collection>ProQuest Engineering Collection</collection><collection>Research Library</collection><collection>Science Database</collection><collection>Engineering Database</collection><collection>Research Library (Corporate)</collection><collection>Advanced Technologies & Aerospace Database</collection><collection>ProQuest Advanced Technologies & Aerospace Collection</collection><collection>Materials Science Collection</collection><collection>ProQuest One Academic Eastern Edition (DO NOT USE)</collection><collection>ProQuest One Academic</collection><collection>ProQuest One Academic UKI Edition</collection><collection>ProQuest Central China</collection><collection>Engineering Collection</collection><collection>ProQuest Central Basic</collection><collection>SIRS Editorial</collection><jtitle>Journal of electronic materials</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Yao, Pengyu</au><au>Deng, Yaping</au><au>Li, Bo</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Effect of Vanadium Content on the Microwave Dielectric Properties of Sr2VxO7 (1.80 ≤ x ≤ 2.05) Ceramics</atitle><jtitle>Journal of electronic materials</jtitle><stitle>Journal of Elec Materi</stitle><date>2020-10-01</date><risdate>2020</risdate><volume>49</volume><issue>10</issue><spage>6136</spage><epage>6142</epage><pages>6136-6142</pages><issn>0361-5235</issn><eissn>1543-186X</eissn><abstract>Vanadium content has a prominent effect on the microwave dielectric properties of Sr
2
V
x
O
7
(1.80 ≤
x
≤ 2.05) ceramics, which is related to extrinsic factors and intrinsic factors, such as secondary phase, bulk density, crystal structure, and V–O bond length. Rietveld refinement, energy dispersive spectroscopy, and Raman spectra analysis revealed that an appropriate vanadium deficiency causes the appearance of secondary phase Sr
3
V
2
O
8
, which results in the variation of unit cell volume and the significant improvement of
Q
×
f
value and the temperature coefficient of resonant frequency. Specifically, the Sr
2
V
1.90
O
7
ceramic sintered at 950°C possesses optimum microwave dielectric performances: the dielectric constant of 11.1, the
Q
×
f
value of 36,500 GHz, and the temperature coefficient of resonant frequency of − 35.6 ppm/°C.</abstract><cop>New York</cop><pub>Springer US</pub><doi>10.1007/s11664-020-08360-y</doi><tpages>7</tpages><orcidid>https://orcid.org/0000-0002-7262-8310</orcidid></addata></record> |
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| source | SpringerNature Journals |
| subjects | Bulk density Ceramics Characterization and Evaluation of Materials Chemistry and Materials Science Crystal structure Dielectric properties Electronics and Microelectronics Instrumentation Materials Science Optical and Electronic Materials Raman spectra Resonant frequencies Solid State Physics Spectrum analysis Unit cell Vanadium |
| title | Effect of Vanadium Content on the Microwave Dielectric Properties of Sr2VxO7 (1.80 ≤ x ≤ 2.05) Ceramics |
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