Interdigital capacitor loaded electric‐LC resonator for dielectric characterization
A high sensitivity microstrip line‐based sensor loaded with the electric‐LC (ELC) resonator is proposed in this work for the accurate characterization of dielectric materials. The high sensitivity in the present situation is achieved due to usage of novel interdigital capacitor in the ELC resonator...
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Veröffentlicht in: | Microwave and optical technology letters 2020-09, Vol.62 (9), p.2835-2840 |
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creator | Kapoor, Anush Varshney, Prashant Kumar Akhtar, M. Jaleel |
description | A high sensitivity microstrip line‐based sensor loaded with the electric‐LC (ELC) resonator is proposed in this work for the accurate characterization of dielectric materials. The high sensitivity in the present situation is achieved due to usage of novel interdigital capacitor in the ELC resonator topology, which actually provides enhanced electric field for dielectric testing. The proposed sensor is designed in the S band regime, and various standard dielectric samples are tested to validate the proposed design. For retrieving the dielectric constants of these samples, an empirical relationship is proposed relating the dielectric properties with the resonant frequency of the sensor. The proposed empirical model is further improved by introducing two error terms to take into consideration the effect of fabrication tolerance of the sensor and surface roughness of the test specimen. The normalized sensitivity of the proposed sensor using standard procedure is estimated to be 5.14%, which is reasonably higher than that of other sensors reported in literature. |
doi_str_mv | 10.1002/mop.32391 |
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Jaleel</creator><creatorcontrib>Kapoor, Anush ; Varshney, Prashant Kumar ; Akhtar, M. Jaleel</creatorcontrib><description>A high sensitivity microstrip line‐based sensor loaded with the electric‐LC (ELC) resonator is proposed in this work for the accurate characterization of dielectric materials. The high sensitivity in the present situation is achieved due to usage of novel interdigital capacitor in the ELC resonator topology, which actually provides enhanced electric field for dielectric testing. The proposed sensor is designed in the S band regime, and various standard dielectric samples are tested to validate the proposed design. For retrieving the dielectric constants of these samples, an empirical relationship is proposed relating the dielectric properties with the resonant frequency of the sensor. The proposed empirical model is further improved by introducing two error terms to take into consideration the effect of fabrication tolerance of the sensor and surface roughness of the test specimen. The normalized sensitivity of the proposed sensor using standard procedure is estimated to be 5.14%, which is reasonably higher than that of other sensors reported in literature.</description><identifier>ISSN: 0895-2477</identifier><identifier>EISSN: 1098-2760</identifier><identifier>DOI: 10.1002/mop.32391</identifier><language>eng</language><publisher>Hoboken, USA: John Wiley & Sons, Inc</publisher><subject>Capacitors ; dielectric measurement ; Dielectric properties ; Electric fields ; electric‐LC (ELC) ; high sensitivity ; interdigital capacitance (IDC) ; metamaterials ; Microstrip transmission lines ; permittivity ; planar resonator ; Resonant frequencies ; Resonators ; Sensitivity ; Sensors ; Superhigh frequencies ; Surface roughness ; Topology</subject><ispartof>Microwave and optical technology letters, 2020-09, Vol.62 (9), p.2835-2840</ispartof><rights>2020 Wiley Periodicals, Inc.</rights><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c2121-7ae83b0caab2041ffb3d3cc44d9f73de48dd49e5de7254d367f4f4d8baf82e023</citedby><cites>FETCH-LOGICAL-c2121-7ae83b0caab2041ffb3d3cc44d9f73de48dd49e5de7254d367f4f4d8baf82e023</cites><orcidid>0000-0003-2405-9472</orcidid></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktopdf>$$Uhttps://onlinelibrary.wiley.com/doi/pdf/10.1002%2Fmop.32391$$EPDF$$P50$$Gwiley$$H</linktopdf><linktohtml>$$Uhttps://onlinelibrary.wiley.com/doi/full/10.1002%2Fmop.32391$$EHTML$$P50$$Gwiley$$H</linktohtml><link.rule.ids>314,780,784,1417,27924,27925,45574,45575</link.rule.ids></links><search><creatorcontrib>Kapoor, Anush</creatorcontrib><creatorcontrib>Varshney, Prashant Kumar</creatorcontrib><creatorcontrib>Akhtar, M. Jaleel</creatorcontrib><title>Interdigital capacitor loaded electric‐LC resonator for dielectric characterization</title><title>Microwave and optical technology letters</title><description>A high sensitivity microstrip line‐based sensor loaded with the electric‐LC (ELC) resonator is proposed in this work for the accurate characterization of dielectric materials. The high sensitivity in the present situation is achieved due to usage of novel interdigital capacitor in the ELC resonator topology, which actually provides enhanced electric field for dielectric testing. The proposed sensor is designed in the S band regime, and various standard dielectric samples are tested to validate the proposed design. For retrieving the dielectric constants of these samples, an empirical relationship is proposed relating the dielectric properties with the resonant frequency of the sensor. The proposed empirical model is further improved by introducing two error terms to take into consideration the effect of fabrication tolerance of the sensor and surface roughness of the test specimen. The normalized sensitivity of the proposed sensor using standard procedure is estimated to be 5.14%, which is reasonably higher than that of other sensors reported in literature.</description><subject>Capacitors</subject><subject>dielectric measurement</subject><subject>Dielectric properties</subject><subject>Electric fields</subject><subject>electric‐LC (ELC)</subject><subject>high sensitivity</subject><subject>interdigital capacitance (IDC)</subject><subject>metamaterials</subject><subject>Microstrip transmission lines</subject><subject>permittivity</subject><subject>planar resonator</subject><subject>Resonant frequencies</subject><subject>Resonators</subject><subject>Sensitivity</subject><subject>Sensors</subject><subject>Superhigh frequencies</subject><subject>Surface roughness</subject><subject>Topology</subject><issn>0895-2477</issn><issn>1098-2760</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2020</creationdate><recordtype>article</recordtype><recordid>eNp1kL1OwzAUhS0EEqUw8AaRmBjS-i91MqKKn0pFZaCzdeMfcJXGwU6FysQj8Iw8CYbAyHB1h_Pdc3UOQucETwjGdLr13YRRVpEDNCK4KnMqZvgQjXBZFTnlQhyjkxg3GGMmBB2h9aLtTdDuyfXQZAo6UK73IWs8aKMz0xjVB6c-3z-W8yyY6Fv4lm0a7f7UTD1DAJWM3Bv0zren6MhCE83Z7x6j9c314_wuX65uF_OrZa4ooSQXYEpWYwVQU8yJtTXTTCnOdWUF04aXWvPKFNoIWnDNZsJyy3VZgy2pwZSN0cXg2wX_sjOxlxu_C216KSmnKWMlRJGoy4FSwccYjJVdcFsIe0mw_G5NptbkT2uJnQ7sq2vM_n9Q3q8ehosviWBxOg</recordid><startdate>202009</startdate><enddate>202009</enddate><creator>Kapoor, Anush</creator><creator>Varshney, Prashant Kumar</creator><creator>Akhtar, M. 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Jaleel</creatorcontrib><collection>CrossRef</collection><collection>Electronics & Communications Abstracts</collection><collection>Technology Research Database</collection><collection>ANTE: Abstracts in New Technology & Engineering</collection><collection>Engineering Research Database</collection><collection>Advanced Technologies Database with Aerospace</collection><jtitle>Microwave and optical technology letters</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Kapoor, Anush</au><au>Varshney, Prashant Kumar</au><au>Akhtar, M. 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For retrieving the dielectric constants of these samples, an empirical relationship is proposed relating the dielectric properties with the resonant frequency of the sensor. The proposed empirical model is further improved by introducing two error terms to take into consideration the effect of fabrication tolerance of the sensor and surface roughness of the test specimen. The normalized sensitivity of the proposed sensor using standard procedure is estimated to be 5.14%, which is reasonably higher than that of other sensors reported in literature.</abstract><cop>Hoboken, USA</cop><pub>John Wiley & Sons, Inc</pub><doi>10.1002/mop.32391</doi><tpages>6</tpages><orcidid>https://orcid.org/0000-0003-2405-9472</orcidid></addata></record> |
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subjects | Capacitors dielectric measurement Dielectric properties Electric fields electric‐LC (ELC) high sensitivity interdigital capacitance (IDC) metamaterials Microstrip transmission lines permittivity planar resonator Resonant frequencies Resonators Sensitivity Sensors Superhigh frequencies Surface roughness Topology |
title | Interdigital capacitor loaded electric‐LC resonator for dielectric characterization |
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