Universal Testing for Linear Feed-Forward/Feedback Shift Registers

Linear feed-forward/feedback shift registers are used as an effective tool of testing circuits in various fields including built-in self-test and secure scan design. In this paper, we consider the issue of testing linear feed-forward/feedback shift registers themselves. To test linear feed-forward/f...

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Veröffentlicht in:	IEICE Transactions on Information and Systems 2020/05/01, Vol.E103.D(5), pp.1023-1030
Hauptverfasser:	FUJIWARA, Hideo, FUJIWARA, Katsuya, HOSOKAWA, Toshinori
Format:	Artikel
Sprache:	eng
Schlagworte:	built-in self-test Circuit design Existence theorems Feedback linear feed-forward shift registers linear feedback shift registers Registers secure scan design Self tests sequential logic Shift registers test generation Test pattern generators universal test
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