3D ToF‐SIMS view of interfacial diffusion between Cr2AlC coating and zircaloy substrate
A diffused interface between a ceramic coating and a metallic substrate is expected to signify a more solid bonding. In addition to depth profiling, a novel 3D view and imaging approach based on ToF‐SIMS analysis was developed to investigate the diffused species around the interface. The diffusion o...
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Veröffentlicht in: | Surface and interface analysis 2020-05, Vol.52 (5), p.306-310 |
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creator | Zhang, Lei Dai, Chunli Zhang, Jie |
description | A diffused interface between a ceramic coating and a metallic substrate is expected to signify a more solid bonding. In addition to depth profiling, a novel 3D view and imaging approach based on ToF‐SIMS analysis was developed to investigate the diffused species around the interface. The diffusion of Al species in a Cr2AlC ceramic coating and Zircaloy substrate system was investigated in both the as‐deposited and postannealed states. In terms of the 3D view and imaging of CsAl+ after Gaussian convolution, Al species visibly diffused into the substrate after annealing at 800°C for only 5 minutes compared with that in the as‐deposited sample. |
doi_str_mv | 10.1002/sia.6715 |
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fullrecord | <record><control><sourceid>proquest_wiley</sourceid><recordid>TN_cdi_proquest_journals_2386061703</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>2386061703</sourcerecordid><originalsourceid>FETCH-LOGICAL-p2215-33c072c4c46e83607279edb0ab7d4f46faf66efe429822710bc3d7df9334c6403</originalsourceid><addsrcrecordid>eNotkL1OwzAcxC0EEqUg8QiWmFP-_qidjFWgUKmIoWVgshzHRq5CXOyEqkw8As_Ik5CqTHfD6U73Q-iawIQA0Nvk9URIMj1BIwKFyIqC5KdoBITTjHJKztFFShsAyFkuRuiV3eF1mP9-_6wWTyv86e0OB4d929notPG6wbV3rk8-tLiy3c7aFpeRzpoSm6A7375h3db4y0ejm7DHqa9SF3VnL9GZ002yV_86Ri_z-3X5mC2fHxblbJltKSXTjDEDkhpuuLA5E4OXha0r0JWsuePCaSeEdZbTIqdUEqgMq2XtCsa4ERzYGN0ce7cxfPQ2dWoT-tgOk4oOF0EQCWxIZcfUzjd2r7bRv-u4VwTUgZoaqKkDNbVazA7K_gBAx2D6</addsrcrecordid><sourcetype>Aggregation Database</sourcetype><iscdi>true</iscdi><recordtype>article</recordtype><pqid>2386061703</pqid></control><display><type>article</type><title>3D ToF‐SIMS view of interfacial diffusion between Cr2AlC coating and zircaloy substrate</title><source>Wiley Online Library Journals</source><creator>Zhang, Lei ; Dai, Chunli ; Zhang, Jie</creator><creatorcontrib>Zhang, Lei ; Dai, Chunli ; Zhang, Jie</creatorcontrib><description>A diffused interface between a ceramic coating and a metallic substrate is expected to signify a more solid bonding. In addition to depth profiling, a novel 3D view and imaging approach based on ToF‐SIMS analysis was developed to investigate the diffused species around the interface. The diffusion of Al species in a Cr2AlC ceramic coating and Zircaloy substrate system was investigated in both the as‐deposited and postannealed states. In terms of the 3D view and imaging of CsAl+ after Gaussian convolution, Al species visibly diffused into the substrate after annealing at 800°C for only 5 minutes compared with that in the as‐deposited sample.</description><identifier>ISSN: 0142-2421</identifier><identifier>EISSN: 1096-9918</identifier><identifier>DOI: 10.1002/sia.6715</identifier><language>eng</language><publisher>Bognor Regis: Wiley Subscription Services, Inc</publisher><subject>3D SIMS ; ceramic coating ; Ceramic coatings ; Ceramic glazes ; Convolution ; Depth profiling ; diffusion ; Diffusion coating ; interface ; Protective coatings ; Species diffusion ; Substrates ; ToF‐SIMS ; zircaloy ; Zircaloys (trademark)</subject><ispartof>Surface and interface analysis, 2020-05, Vol.52 (5), p.306-310</ispartof><rights>2019 John Wiley & Sons, Ltd.</rights><rights>2020 John Wiley & Sons, Ltd.</rights><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed><orcidid>0000-0003-2530-7853</orcidid></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktopdf>$$Uhttps://onlinelibrary.wiley.com/doi/pdf/10.1002%2Fsia.6715$$EPDF$$P50$$Gwiley$$H</linktopdf><linktohtml>$$Uhttps://onlinelibrary.wiley.com/doi/full/10.1002%2Fsia.6715$$EHTML$$P50$$Gwiley$$H</linktohtml><link.rule.ids>314,780,784,1416,27923,27924,45573,45574</link.rule.ids></links><search><creatorcontrib>Zhang, Lei</creatorcontrib><creatorcontrib>Dai, Chunli</creatorcontrib><creatorcontrib>Zhang, Jie</creatorcontrib><title>3D ToF‐SIMS view of interfacial diffusion between Cr2AlC coating and zircaloy substrate</title><title>Surface and interface analysis</title><description>A diffused interface between a ceramic coating and a metallic substrate is expected to signify a more solid bonding. In addition to depth profiling, a novel 3D view and imaging approach based on ToF‐SIMS analysis was developed to investigate the diffused species around the interface. The diffusion of Al species in a Cr2AlC ceramic coating and Zircaloy substrate system was investigated in both the as‐deposited and postannealed states. In terms of the 3D view and imaging of CsAl+ after Gaussian convolution, Al species visibly diffused into the substrate after annealing at 800°C for only 5 minutes compared with that in the as‐deposited sample.</description><subject>3D SIMS</subject><subject>ceramic coating</subject><subject>Ceramic coatings</subject><subject>Ceramic glazes</subject><subject>Convolution</subject><subject>Depth profiling</subject><subject>diffusion</subject><subject>Diffusion coating</subject><subject>interface</subject><subject>Protective coatings</subject><subject>Species diffusion</subject><subject>Substrates</subject><subject>ToF‐SIMS</subject><subject>zircaloy</subject><subject>Zircaloys (trademark)</subject><issn>0142-2421</issn><issn>1096-9918</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2020</creationdate><recordtype>article</recordtype><recordid>eNotkL1OwzAcxC0EEqUg8QiWmFP-_qidjFWgUKmIoWVgshzHRq5CXOyEqkw8As_Ik5CqTHfD6U73Q-iawIQA0Nvk9URIMj1BIwKFyIqC5KdoBITTjHJKztFFShsAyFkuRuiV3eF1mP9-_6wWTyv86e0OB4d929notPG6wbV3rk8-tLiy3c7aFpeRzpoSm6A7375h3db4y0ejm7DHqa9SF3VnL9GZ002yV_86Ri_z-3X5mC2fHxblbJltKSXTjDEDkhpuuLA5E4OXha0r0JWsuePCaSeEdZbTIqdUEqgMq2XtCsa4ERzYGN0ce7cxfPQ2dWoT-tgOk4oOF0EQCWxIZcfUzjd2r7bRv-u4VwTUgZoaqKkDNbVazA7K_gBAx2D6</recordid><startdate>202005</startdate><enddate>202005</enddate><creator>Zhang, Lei</creator><creator>Dai, Chunli</creator><creator>Zhang, Jie</creator><general>Wiley Subscription Services, Inc</general><scope>7SR</scope><scope>7U5</scope><scope>8BQ</scope><scope>8FD</scope><scope>JG9</scope><scope>L7M</scope><orcidid>https://orcid.org/0000-0003-2530-7853</orcidid></search><sort><creationdate>202005</creationdate><title>3D ToF‐SIMS view of interfacial diffusion between Cr2AlC coating and zircaloy substrate</title><author>Zhang, Lei ; Dai, Chunli ; Zhang, Jie</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-p2215-33c072c4c46e83607279edb0ab7d4f46faf66efe429822710bc3d7df9334c6403</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2020</creationdate><topic>3D SIMS</topic><topic>ceramic coating</topic><topic>Ceramic coatings</topic><topic>Ceramic glazes</topic><topic>Convolution</topic><topic>Depth profiling</topic><topic>diffusion</topic><topic>Diffusion coating</topic><topic>interface</topic><topic>Protective coatings</topic><topic>Species diffusion</topic><topic>Substrates</topic><topic>ToF‐SIMS</topic><topic>zircaloy</topic><topic>Zircaloys (trademark)</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Zhang, Lei</creatorcontrib><creatorcontrib>Dai, Chunli</creatorcontrib><creatorcontrib>Zhang, Jie</creatorcontrib><collection>Engineered Materials Abstracts</collection><collection>Solid State and Superconductivity Abstracts</collection><collection>METADEX</collection><collection>Technology Research Database</collection><collection>Materials Research Database</collection><collection>Advanced Technologies Database with Aerospace</collection><jtitle>Surface and interface analysis</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Zhang, Lei</au><au>Dai, Chunli</au><au>Zhang, Jie</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>3D ToF‐SIMS view of interfacial diffusion between Cr2AlC coating and zircaloy substrate</atitle><jtitle>Surface and interface analysis</jtitle><date>2020-05</date><risdate>2020</risdate><volume>52</volume><issue>5</issue><spage>306</spage><epage>310</epage><pages>306-310</pages><issn>0142-2421</issn><eissn>1096-9918</eissn><abstract>A diffused interface between a ceramic coating and a metallic substrate is expected to signify a more solid bonding. In addition to depth profiling, a novel 3D view and imaging approach based on ToF‐SIMS analysis was developed to investigate the diffused species around the interface. The diffusion of Al species in a Cr2AlC ceramic coating and Zircaloy substrate system was investigated in both the as‐deposited and postannealed states. In terms of the 3D view and imaging of CsAl+ after Gaussian convolution, Al species visibly diffused into the substrate after annealing at 800°C for only 5 minutes compared with that in the as‐deposited sample.</abstract><cop>Bognor Regis</cop><pub>Wiley Subscription Services, Inc</pub><doi>10.1002/sia.6715</doi><tpages>5</tpages><orcidid>https://orcid.org/0000-0003-2530-7853</orcidid></addata></record> |
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subjects | 3D SIMS ceramic coating Ceramic coatings Ceramic glazes Convolution Depth profiling diffusion Diffusion coating interface Protective coatings Species diffusion Substrates ToF‐SIMS zircaloy Zircaloys (trademark) |
title | 3D ToF‐SIMS view of interfacial diffusion between Cr2AlC coating and zircaloy substrate |
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