Modeling of Transfer Impedance in Automotive BCI Test System with Closed-Loop Method
This paper presents a methodology with which to construct an equivalent simulation model of closed-loop BCI testing for a vehicle component. The proposed model comprehensively takes the transfer impedance of the test configuration into account. The methodology used in this paper relies on circuit mo...
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| Veröffentlicht in: | IEICE Transactions on Communications 2020/04/01, Vol.E103.B(4), pp.405-414 |
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| container_title | IEICE Transactions on Communications |
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| creator | LEE, Junesang LEE, Hosang HA, Jungrae KIM, Minho YUN, Sangwon KIM, Yeongsik NAH, Wansoo |
| description | This paper presents a methodology with which to construct an equivalent simulation model of closed-loop BCI testing for a vehicle component. The proposed model comprehensively takes the transfer impedance of the test configuration into account. The methodology used in this paper relies on circuit modeling and EM modeling as well. The BCI test probes are modeled as the equivalent circuits, and the frequency-dependent losses characteristics in the probe's ferrite are derived using a PSO algorithm. The measurement environments involving the harness cable, load simulator, DUT, and ground plane are designed through three-dimensional EM simulation. The developed circuit model and EM model are completely integrated in a commercial EM simulation tool, EMC Studio of EMCoS Ltd. The simulated results are validated through comparison with measurements. The simulated and measurement results are consistent in the range of 1MHz up to 400MHz. |
| doi_str_mv | 10.1587/transcom.2019EBP3144 |
| format | Article |
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The proposed model comprehensively takes the transfer impedance of the test configuration into account. The methodology used in this paper relies on circuit modeling and EM modeling as well. The BCI test probes are modeled as the equivalent circuits, and the frequency-dependent losses characteristics in the probe's ferrite are derived using a PSO algorithm. The measurement environments involving the harness cable, load simulator, DUT, and ground plane are designed through three-dimensional EM simulation. The developed circuit model and EM model are completely integrated in a commercial EM simulation tool, EMC Studio of EMCoS Ltd. The simulated results are validated through comparison with measurements. The simulated and measurement results are consistent in the range of 1MHz up to 400MHz.</description><identifier>ISSN: 0916-8516</identifier><identifier>EISSN: 1745-1345</identifier><identifier>DOI: 10.1587/transcom.2019EBP3144</identifier><language>eng</language><publisher>Tokyo: The Institute of Electronics, Information and Communication Engineers</publisher><subject>Algorithms ; BCI ; Circuit design ; closed-loop method ; Computer simulation ; Electromagnetic compatibility ; EM simulation ; Equivalent circuits ; Ground plane ; Impedance ; Modelling ; PSO algorithm ; Simulation ; Three dimensional models ; transfer impedance</subject><ispartof>IEICE Transactions on Communications, 2020/04/01, Vol.E103.B(4), pp.405-414</ispartof><rights>2020 The Institute of Electronics, Information and Communication Engineers</rights><rights>Copyright Japan Science and Technology Agency 2020</rights><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c420t-1005033373c3955cd03f67ee68f6f050a72ee3b919725d6da0cda17846ba0cfc3</citedby><cites>FETCH-LOGICAL-c420t-1005033373c3955cd03f67ee68f6f050a72ee3b919725d6da0cda17846ba0cfc3</cites></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><link.rule.ids>314,780,784,27924,27925</link.rule.ids></links><search><creatorcontrib>LEE, Junesang</creatorcontrib><creatorcontrib>LEE, Hosang</creatorcontrib><creatorcontrib>HA, Jungrae</creatorcontrib><creatorcontrib>KIM, Minho</creatorcontrib><creatorcontrib>YUN, Sangwon</creatorcontrib><creatorcontrib>KIM, Yeongsik</creatorcontrib><creatorcontrib>NAH, Wansoo</creatorcontrib><title>Modeling of Transfer Impedance in Automotive BCI Test System with Closed-Loop Method</title><title>IEICE Transactions on Communications</title><addtitle>IEICE Trans. Commun.</addtitle><description>This paper presents a methodology with which to construct an equivalent simulation model of closed-loop BCI testing for a vehicle component. The proposed model comprehensively takes the transfer impedance of the test configuration into account. The methodology used in this paper relies on circuit modeling and EM modeling as well. The BCI test probes are modeled as the equivalent circuits, and the frequency-dependent losses characteristics in the probe's ferrite are derived using a PSO algorithm. The measurement environments involving the harness cable, load simulator, DUT, and ground plane are designed through three-dimensional EM simulation. The developed circuit model and EM model are completely integrated in a commercial EM simulation tool, EMC Studio of EMCoS Ltd. The simulated results are validated through comparison with measurements. The simulated and measurement results are consistent in the range of 1MHz up to 400MHz.</description><subject>Algorithms</subject><subject>BCI</subject><subject>Circuit design</subject><subject>closed-loop method</subject><subject>Computer simulation</subject><subject>Electromagnetic compatibility</subject><subject>EM simulation</subject><subject>Equivalent circuits</subject><subject>Ground plane</subject><subject>Impedance</subject><subject>Modelling</subject><subject>PSO algorithm</subject><subject>Simulation</subject><subject>Three dimensional models</subject><subject>transfer impedance</subject><issn>0916-8516</issn><issn>1745-1345</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2020</creationdate><recordtype>article</recordtype><recordid>eNpNkF9PwjAUxRujiYh-Ax-a-Dxs13Z_HmFBJYFodD43pbuDkW2dbdHw7R1BkKd7knt-594chO4pGVGRxI_eqtZp04xCQtPp5I1Rzi_QgMZcBJRxcYkGJKVRkAgaXaMb5zaE0CSk4QDlC1NAXbUrbEqc73NKsHjWdFCoVgOuWjzeetMYX30DnmQznIPz-GPnPDT4p_JrnNXGQRHMjenwAvzaFLfoqlS1g7u_OUSfT9M8ewnmr8-zbDwPNA-JDyghgjDGYqZZKoQuCCujGCBKyqjsVyoOAdgypWkciiIqFNGFonHCo2UvS82G6OGQ21nzte3_khuztW1_UoYsEZylSRT3Ln5waWucs1DKzlaNsjtJidz3J4_9ybP-euz9gG2cVys4Qcr6StfwD00pYXIi-VGchZzMeq2shJb9AsfqggU</recordid><startdate>20200401</startdate><enddate>20200401</enddate><creator>LEE, Junesang</creator><creator>LEE, Hosang</creator><creator>HA, Jungrae</creator><creator>KIM, Minho</creator><creator>YUN, Sangwon</creator><creator>KIM, Yeongsik</creator><creator>NAH, Wansoo</creator><general>The Institute of Electronics, Information and Communication Engineers</general><general>Japan Science and Technology Agency</general><scope>AAYXX</scope><scope>CITATION</scope><scope>7SP</scope><scope>8FD</scope><scope>L7M</scope></search><sort><creationdate>20200401</creationdate><title>Modeling of Transfer Impedance in Automotive BCI Test System with Closed-Loop Method</title><author>LEE, Junesang ; LEE, Hosang ; HA, Jungrae ; KIM, Minho ; YUN, Sangwon ; KIM, Yeongsik ; NAH, Wansoo</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c420t-1005033373c3955cd03f67ee68f6f050a72ee3b919725d6da0cda17846ba0cfc3</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2020</creationdate><topic>Algorithms</topic><topic>BCI</topic><topic>Circuit design</topic><topic>closed-loop method</topic><topic>Computer simulation</topic><topic>Electromagnetic compatibility</topic><topic>EM simulation</topic><topic>Equivalent circuits</topic><topic>Ground plane</topic><topic>Impedance</topic><topic>Modelling</topic><topic>PSO algorithm</topic><topic>Simulation</topic><topic>Three dimensional models</topic><topic>transfer impedance</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>LEE, Junesang</creatorcontrib><creatorcontrib>LEE, Hosang</creatorcontrib><creatorcontrib>HA, Jungrae</creatorcontrib><creatorcontrib>KIM, Minho</creatorcontrib><creatorcontrib>YUN, Sangwon</creatorcontrib><creatorcontrib>KIM, Yeongsik</creatorcontrib><creatorcontrib>NAH, Wansoo</creatorcontrib><collection>CrossRef</collection><collection>Electronics & Communications Abstracts</collection><collection>Technology Research Database</collection><collection>Advanced Technologies Database with Aerospace</collection><jtitle>IEICE Transactions on Communications</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>LEE, Junesang</au><au>LEE, Hosang</au><au>HA, Jungrae</au><au>KIM, Minho</au><au>YUN, Sangwon</au><au>KIM, Yeongsik</au><au>NAH, Wansoo</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Modeling of Transfer Impedance in Automotive BCI Test System with Closed-Loop Method</atitle><jtitle>IEICE Transactions on Communications</jtitle><addtitle>IEICE Trans. Commun.</addtitle><date>2020-04-01</date><risdate>2020</risdate><volume>E103.B</volume><issue>4</issue><spage>405</spage><epage>414</epage><pages>405-414</pages><issn>0916-8516</issn><eissn>1745-1345</eissn><abstract>This paper presents a methodology with which to construct an equivalent simulation model of closed-loop BCI testing for a vehicle component. The proposed model comprehensively takes the transfer impedance of the test configuration into account. The methodology used in this paper relies on circuit modeling and EM modeling as well. The BCI test probes are modeled as the equivalent circuits, and the frequency-dependent losses characteristics in the probe's ferrite are derived using a PSO algorithm. The measurement environments involving the harness cable, load simulator, DUT, and ground plane are designed through three-dimensional EM simulation. The developed circuit model and EM model are completely integrated in a commercial EM simulation tool, EMC Studio of EMCoS Ltd. 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| ispartof | IEICE Transactions on Communications, 2020/04/01, Vol.E103.B(4), pp.405-414 |
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| source | Alma/SFX Local Collection |
| subjects | Algorithms BCI Circuit design closed-loop method Computer simulation Electromagnetic compatibility EM simulation Equivalent circuits Ground plane Impedance Modelling PSO algorithm Simulation Three dimensional models transfer impedance |
| title | Modeling of Transfer Impedance in Automotive BCI Test System with Closed-Loop Method |
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