Three-fold improved set-voltage variability of a Cu atom switch with a split electrode for very-large-scale integration

We propose a self-selected smallest set-voltage cell (4S-cell) to realize three-fold improvement of the set-voltage (Vset) variability of Cu atom switches. In the cell, switches are connected in parallel and the switch with the smallest Vset is automatically selected, resulting in smaller Vset varia...

Ausführliche Beschreibung

Bibliographische Detailangaben

Veröffentlicht in:	Japanese Journal of Applied Physics 2020-04, Vol.59 (SG), p.SGGB09
Hauptverfasser:	Banno, Naoki, Okamoto, Koichiro, Numata, Hideaki, Iguchi, Noriyuki, Miyamura, Makoto, Nebashi, Ryusuke, Bai, Xu, Hada, Hiromitsu, Sugibayashi, Tadahiko, Sakamoto, Toshitsugu, Tada, Munehiro
Format:	Artikel
Sprache:	eng
Schlagworte:	Electric potential Electrodes Parallel connected Switches Very large scale integration Voltage
Online-Zugang:	Volltext
Tags:	Tag hinzufügen Keine Tags, Fügen Sie den ersten Tag hinzu!