A survey on fault injection methods of digital integrated circuits
One of the most popular methods for reliability assessment of digital circuits is Fault Injection (FI) in which the behavior of the circuit is simulated in presence of faults. In this paper, we present a survey of FI techniques as well as classifying these techniques considering different aspects an...
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| Veröffentlicht in: | Integration (Amsterdam) 2020-03, Vol.71, p.154-163 |
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| container_title | Integration (Amsterdam) |
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| creator | Eslami, Mohammad Ghavami, Behnam Raji, Mohsen Mahani, Ali |
| description | One of the most popular methods for reliability assessment of digital circuits is Fault Injection (FI) in which the behavior of the circuit is simulated in presence of faults. In this paper, we present a survey of FI techniques as well as classifying these techniques considering different aspects and criteria to bring out their similarities and differences. The goal of this paper is to help the researchers and reliable circuit designers in gaining insights into the state-of-art in FI techniques and motivate them to further improve these techniques for more efficient reliability evaluation of digital circuit designs of tomorrow. |
| doi_str_mv | 10.1016/j.vlsi.2019.11.006 |
| format | Article |
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| language | eng |
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| source | Elsevier ScienceDirect Journals |
| subjects | Circuit design Circuit reliability Circuits Digital circuits Digital electronics Fault diagnosis Fault injection Fault simulation Fault tolerance Integrated circuits Reliability Reliability analysis Reliability assessment |
| title | A survey on fault injection methods of digital integrated circuits |
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