Structural and opto-electronic properties of epoxy/silver nanocomposite films

Inexpensive easy method elaboration of epoxy/silver nanocomposites thin films using controlling extrusion method is presented. The obtained films were structurally studied with scanning electronic microscope, X-Ray Diffraction, and Fourier Transform Infrared analysis. Hygroscopic tests under a highly humid environment on prepared films have been checked out; showing homogeneous and stable structure. Electrical conductivity has been measured as silver content; revealing a percolative behavior. An insulator to conductor phase transition with a high jump of several decades was observed. Optical study as a function of silver filling allowed the determination of the film thickness, kind of the electronic transition as well as optical band gap energy and Urbach energy. Hence, the epoxy/Ag nanocomposite films can be elaborated as dielectric or electrically conducting materials with specific optical characteristics, giving the possibility to be used in optoelectronic applications. Finally, the obtained results have been successfully discussed based on the available theoretical frameworks.