Selective laser ablation and patterning on Ag thin films with width and depth control

Silver (Ag) films were deposited on glass substrates by radio frequency (RF) magnetron sputtering and then ablated by a 532 nm nanosecond pulsed laser. The effects of laser fluence and defocusing amount on the width and depth of laser-ablated grooves on 100- and 600-nm-thick Ag films were systematic...

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Veröffentlicht in:Journal of materials science. Materials in electronics 2020-03, Vol.31 (6), p.4943-4955
Hauptverfasser: Huang, Li-jing, Zhang, Gao-ming, Li, Huang, Li, Bao-jia, Wang, Yong-ying, Ren, Nai-fei
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container_issue 6
container_start_page 4943
container_title Journal of materials science. Materials in electronics
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creator Huang, Li-jing
Zhang, Gao-ming
Li, Huang
Li, Bao-jia
Wang, Yong-ying
Ren, Nai-fei
description Silver (Ag) films were deposited on glass substrates by radio frequency (RF) magnetron sputtering and then ablated by a 532 nm nanosecond pulsed laser. The effects of laser fluence and defocusing amount on the width and depth of laser-ablated grooves on 100- and 600-nm-thick Ag films were systematically investigated under single- and multi-scan ablation. The results suggested that the Ag films could be successfully removed from the substrate owing to laser-induced thermoelastic force or vaporization. It was confirmed that laser fluence and defocusing amount played very important roles in controlling the width and depth of the laser-ablated grooves. In the present work, grooves with widths ranging from 53 to 196 μm and depths ranging from 56 to 196 nm were obtained on 100-nm-thick Ag films by single-scan laser ablation, and laser ablation or removal with controllable depths was realized on 600-nm-thick Ag films by adopting single- or multi-scan (i.e., scanning numbers of 1–6). Furthermore, square spiral Ag patterns were successfully obtained by single- and multi-scan laser ablation and showed good electrical conductivity in a simple circuit. This work may have great potential applications in various fields that demand width and depth control of laser ablation/removal.
doi_str_mv 10.1007/s10854-020-03061-y
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fullrecord <record><control><sourceid>proquest_cross</sourceid><recordid>TN_cdi_proquest_journals_2366171260</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>2366171260</sourcerecordid><originalsourceid>FETCH-LOGICAL-c319t-a34a1fa17fc5657101bbc89b879205dfdbe137ab61e23864d8bfaa0a385430cc3</originalsourceid><addsrcrecordid>eNp9kE9LxDAQxYMouK5-AU8Bz9FJ0ibtcVn8BwsedMFbSNO026Wb1iSr7Lc3awVvXmaG4b03zA-hawq3FEDeBQpFnhFgQICDoORwgmY0l5xkBXs_RTMoc0mynLFzdBHCFgBExosZWr_a3prYfVrc62A91lWvYzc4rF2NRx2j9a5zLU6bRYvjpnO46fpdwF9d3KRSp3qU1nZMkxlc9EN_ic4a3Qd79dvnaP1w_7Z8IquXx-flYkUMp2UkmmeaNprKxuQilxRoVZmirApZMsjrpq4s5VJXglrGC5HVRdVoDZqnXzkYw-foZsod_fCxtyGq7bD3Lp1UjAtBJWUCkopNKuOHELxt1Oi7nfYHRUEd8akJn0r41A8-dUgmPplCErvW-r_of1zfNUBzmg</addsrcrecordid><sourcetype>Aggregation Database</sourcetype><iscdi>true</iscdi><recordtype>article</recordtype><pqid>2366171260</pqid></control><display><type>article</type><title>Selective laser ablation and patterning on Ag thin films with width and depth control</title><source>SpringerLink Journals</source><creator>Huang, Li-jing ; Zhang, Gao-ming ; Li, Huang ; Li, Bao-jia ; Wang, Yong-ying ; Ren, Nai-fei</creator><creatorcontrib>Huang, Li-jing ; Zhang, Gao-ming ; Li, Huang ; Li, Bao-jia ; Wang, Yong-ying ; Ren, Nai-fei</creatorcontrib><description>Silver (Ag) films were deposited on glass substrates by radio frequency (RF) magnetron sputtering and then ablated by a 532 nm nanosecond pulsed laser. The effects of laser fluence and defocusing amount on the width and depth of laser-ablated grooves on 100- and 600-nm-thick Ag films were systematically investigated under single- and multi-scan ablation. The results suggested that the Ag films could be successfully removed from the substrate owing to laser-induced thermoelastic force or vaporization. It was confirmed that laser fluence and defocusing amount played very important roles in controlling the width and depth of the laser-ablated grooves. In the present work, grooves with widths ranging from 53 to 196 μm and depths ranging from 56 to 196 nm were obtained on 100-nm-thick Ag films by single-scan laser ablation, and laser ablation or removal with controllable depths was realized on 600-nm-thick Ag films by adopting single- or multi-scan (i.e., scanning numbers of 1–6). Furthermore, square spiral Ag patterns were successfully obtained by single- and multi-scan laser ablation and showed good electrical conductivity in a simple circuit. This work may have great potential applications in various fields that demand width and depth control of laser ablation/removal.</description><identifier>ISSN: 0957-4522</identifier><identifier>EISSN: 1573-482X</identifier><identifier>DOI: 10.1007/s10854-020-03061-y</identifier><language>eng</language><publisher>New York: Springer US</publisher><subject>Characterization and Evaluation of Materials ; Chemistry and Materials Science ; Circuits ; Defocusing ; Electrical resistivity ; Fluence ; Glass substrates ; Grooves ; Isotopes ; Laser ablation ; Lasers ; Magnetron sputtering ; Materials Science ; Optical and Electronic Materials ; Pulsed lasers ; Radio frequency ; Stability ; Thick films ; Thin films ; Vaporization</subject><ispartof>Journal of materials science. Materials in electronics, 2020-03, Vol.31 (6), p.4943-4955</ispartof><rights>Springer Science+Business Media, LLC, part of Springer Nature 2020</rights><rights>Journal of Materials Science: Materials in Electronics is a copyright of Springer, (2020). All Rights Reserved.</rights><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c319t-a34a1fa17fc5657101bbc89b879205dfdbe137ab61e23864d8bfaa0a385430cc3</citedby><cites>FETCH-LOGICAL-c319t-a34a1fa17fc5657101bbc89b879205dfdbe137ab61e23864d8bfaa0a385430cc3</cites><orcidid>0000-0002-0693-0677</orcidid></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktopdf>$$Uhttps://link.springer.com/content/pdf/10.1007/s10854-020-03061-y$$EPDF$$P50$$Gspringer$$H</linktopdf><linktohtml>$$Uhttps://link.springer.com/10.1007/s10854-020-03061-y$$EHTML$$P50$$Gspringer$$H</linktohtml><link.rule.ids>314,776,780,27901,27902,41464,42533,51294</link.rule.ids></links><search><creatorcontrib>Huang, Li-jing</creatorcontrib><creatorcontrib>Zhang, Gao-ming</creatorcontrib><creatorcontrib>Li, Huang</creatorcontrib><creatorcontrib>Li, Bao-jia</creatorcontrib><creatorcontrib>Wang, Yong-ying</creatorcontrib><creatorcontrib>Ren, Nai-fei</creatorcontrib><title>Selective laser ablation and patterning on Ag thin films with width and depth control</title><title>Journal of materials science. Materials in electronics</title><addtitle>J Mater Sci: Mater Electron</addtitle><description>Silver (Ag) films were deposited on glass substrates by radio frequency (RF) magnetron sputtering and then ablated by a 532 nm nanosecond pulsed laser. The effects of laser fluence and defocusing amount on the width and depth of laser-ablated grooves on 100- and 600-nm-thick Ag films were systematically investigated under single- and multi-scan ablation. The results suggested that the Ag films could be successfully removed from the substrate owing to laser-induced thermoelastic force or vaporization. It was confirmed that laser fluence and defocusing amount played very important roles in controlling the width and depth of the laser-ablated grooves. In the present work, grooves with widths ranging from 53 to 196 μm and depths ranging from 56 to 196 nm were obtained on 100-nm-thick Ag films by single-scan laser ablation, and laser ablation or removal with controllable depths was realized on 600-nm-thick Ag films by adopting single- or multi-scan (i.e., scanning numbers of 1–6). Furthermore, square spiral Ag patterns were successfully obtained by single- and multi-scan laser ablation and showed good electrical conductivity in a simple circuit. This work may have great potential applications in various fields that demand width and depth control of laser ablation/removal.</description><subject>Characterization and Evaluation of Materials</subject><subject>Chemistry and Materials Science</subject><subject>Circuits</subject><subject>Defocusing</subject><subject>Electrical resistivity</subject><subject>Fluence</subject><subject>Glass substrates</subject><subject>Grooves</subject><subject>Isotopes</subject><subject>Laser ablation</subject><subject>Lasers</subject><subject>Magnetron sputtering</subject><subject>Materials Science</subject><subject>Optical and Electronic Materials</subject><subject>Pulsed lasers</subject><subject>Radio frequency</subject><subject>Stability</subject><subject>Thick films</subject><subject>Thin films</subject><subject>Vaporization</subject><issn>0957-4522</issn><issn>1573-482X</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2020</creationdate><recordtype>article</recordtype><sourceid>BENPR</sourceid><recordid>eNp9kE9LxDAQxYMouK5-AU8Bz9FJ0ibtcVn8BwsedMFbSNO026Wb1iSr7Lc3awVvXmaG4b03zA-hawq3FEDeBQpFnhFgQICDoORwgmY0l5xkBXs_RTMoc0mynLFzdBHCFgBExosZWr_a3prYfVrc62A91lWvYzc4rF2NRx2j9a5zLU6bRYvjpnO46fpdwF9d3KRSp3qU1nZMkxlc9EN_ic4a3Qd79dvnaP1w_7Z8IquXx-flYkUMp2UkmmeaNprKxuQilxRoVZmirApZMsjrpq4s5VJXglrGC5HVRdVoDZqnXzkYw-foZsod_fCxtyGq7bD3Lp1UjAtBJWUCkopNKuOHELxt1Oi7nfYHRUEd8akJn0r41A8-dUgmPplCErvW-r_of1zfNUBzmg</recordid><startdate>20200301</startdate><enddate>20200301</enddate><creator>Huang, Li-jing</creator><creator>Zhang, Gao-ming</creator><creator>Li, Huang</creator><creator>Li, Bao-jia</creator><creator>Wang, Yong-ying</creator><creator>Ren, Nai-fei</creator><general>Springer US</general><general>Springer Nature B.V</general><scope>AAYXX</scope><scope>CITATION</scope><scope>7SP</scope><scope>7SR</scope><scope>8BQ</scope><scope>8FD</scope><scope>8FE</scope><scope>8FG</scope><scope>ABJCF</scope><scope>AFKRA</scope><scope>ARAPS</scope><scope>BENPR</scope><scope>BGLVJ</scope><scope>CCPQU</scope><scope>D1I</scope><scope>DWQXO</scope><scope>F28</scope><scope>FR3</scope><scope>HCIFZ</scope><scope>JG9</scope><scope>KB.</scope><scope>L7M</scope><scope>P5Z</scope><scope>P62</scope><scope>PDBOC</scope><scope>PQEST</scope><scope>PQQKQ</scope><scope>PQUKI</scope><scope>PRINS</scope><scope>S0W</scope><orcidid>https://orcid.org/0000-0002-0693-0677</orcidid></search><sort><creationdate>20200301</creationdate><title>Selective laser ablation and patterning on Ag thin films with width and depth control</title><author>Huang, Li-jing ; Zhang, Gao-ming ; Li, Huang ; Li, Bao-jia ; Wang, Yong-ying ; Ren, Nai-fei</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c319t-a34a1fa17fc5657101bbc89b879205dfdbe137ab61e23864d8bfaa0a385430cc3</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2020</creationdate><topic>Characterization and Evaluation of Materials</topic><topic>Chemistry and Materials Science</topic><topic>Circuits</topic><topic>Defocusing</topic><topic>Electrical resistivity</topic><topic>Fluence</topic><topic>Glass substrates</topic><topic>Grooves</topic><topic>Isotopes</topic><topic>Laser ablation</topic><topic>Lasers</topic><topic>Magnetron sputtering</topic><topic>Materials Science</topic><topic>Optical and Electronic Materials</topic><topic>Pulsed lasers</topic><topic>Radio frequency</topic><topic>Stability</topic><topic>Thick films</topic><topic>Thin films</topic><topic>Vaporization</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Huang, Li-jing</creatorcontrib><creatorcontrib>Zhang, Gao-ming</creatorcontrib><creatorcontrib>Li, Huang</creatorcontrib><creatorcontrib>Li, Bao-jia</creatorcontrib><creatorcontrib>Wang, Yong-ying</creatorcontrib><creatorcontrib>Ren, Nai-fei</creatorcontrib><collection>CrossRef</collection><collection>Electronics &amp; Communications Abstracts</collection><collection>Engineered Materials Abstracts</collection><collection>METADEX</collection><collection>Technology Research Database</collection><collection>ProQuest SciTech Collection</collection><collection>ProQuest Technology Collection</collection><collection>Materials Science &amp; Engineering Collection</collection><collection>ProQuest Central UK/Ireland</collection><collection>Advanced Technologies &amp; Aerospace Collection</collection><collection>ProQuest Central</collection><collection>Technology Collection</collection><collection>ProQuest One Community College</collection><collection>ProQuest Materials Science Collection</collection><collection>ProQuest Central Korea</collection><collection>ANTE: Abstracts in New Technology &amp; Engineering</collection><collection>Engineering Research Database</collection><collection>SciTech Premium Collection</collection><collection>Materials Research Database</collection><collection>Materials Science Database</collection><collection>Advanced Technologies Database with Aerospace</collection><collection>Advanced Technologies &amp; Aerospace Database</collection><collection>ProQuest Advanced Technologies &amp; Aerospace Collection</collection><collection>Materials Science Collection</collection><collection>ProQuest One Academic Eastern Edition (DO NOT USE)</collection><collection>ProQuest One Academic</collection><collection>ProQuest One Academic UKI Edition</collection><collection>ProQuest Central China</collection><collection>DELNET Engineering &amp; Technology Collection</collection><jtitle>Journal of materials science. Materials in electronics</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Huang, Li-jing</au><au>Zhang, Gao-ming</au><au>Li, Huang</au><au>Li, Bao-jia</au><au>Wang, Yong-ying</au><au>Ren, Nai-fei</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Selective laser ablation and patterning on Ag thin films with width and depth control</atitle><jtitle>Journal of materials science. Materials in electronics</jtitle><stitle>J Mater Sci: Mater Electron</stitle><date>2020-03-01</date><risdate>2020</risdate><volume>31</volume><issue>6</issue><spage>4943</spage><epage>4955</epage><pages>4943-4955</pages><issn>0957-4522</issn><eissn>1573-482X</eissn><abstract>Silver (Ag) films were deposited on glass substrates by radio frequency (RF) magnetron sputtering and then ablated by a 532 nm nanosecond pulsed laser. The effects of laser fluence and defocusing amount on the width and depth of laser-ablated grooves on 100- and 600-nm-thick Ag films were systematically investigated under single- and multi-scan ablation. The results suggested that the Ag films could be successfully removed from the substrate owing to laser-induced thermoelastic force or vaporization. It was confirmed that laser fluence and defocusing amount played very important roles in controlling the width and depth of the laser-ablated grooves. In the present work, grooves with widths ranging from 53 to 196 μm and depths ranging from 56 to 196 nm were obtained on 100-nm-thick Ag films by single-scan laser ablation, and laser ablation or removal with controllable depths was realized on 600-nm-thick Ag films by adopting single- or multi-scan (i.e., scanning numbers of 1–6). Furthermore, square spiral Ag patterns were successfully obtained by single- and multi-scan laser ablation and showed good electrical conductivity in a simple circuit. This work may have great potential applications in various fields that demand width and depth control of laser ablation/removal.</abstract><cop>New York</cop><pub>Springer US</pub><doi>10.1007/s10854-020-03061-y</doi><tpages>13</tpages><orcidid>https://orcid.org/0000-0002-0693-0677</orcidid></addata></record>
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subjects Characterization and Evaluation of Materials
Chemistry and Materials Science
Circuits
Defocusing
Electrical resistivity
Fluence
Glass substrates
Grooves
Isotopes
Laser ablation
Lasers
Magnetron sputtering
Materials Science
Optical and Electronic Materials
Pulsed lasers
Radio frequency
Stability
Thick films
Thin films
Vaporization
title Selective laser ablation and patterning on Ag thin films with width and depth control
url https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-02-08T07%3A44%3A02IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-proquest_cross&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.genre=article&rft.atitle=Selective%20laser%20ablation%20and%20patterning%20on%20Ag%20thin%20films%20with%20width%20and%20depth%20control&rft.jtitle=Journal%20of%20materials%20science.%20Materials%20in%20electronics&rft.au=Huang,%20Li-jing&rft.date=2020-03-01&rft.volume=31&rft.issue=6&rft.spage=4943&rft.epage=4955&rft.pages=4943-4955&rft.issn=0957-4522&rft.eissn=1573-482X&rft_id=info:doi/10.1007/s10854-020-03061-y&rft_dat=%3Cproquest_cross%3E2366171260%3C/proquest_cross%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_pqid=2366171260&rft_id=info:pmid/&rfr_iscdi=true