Selective laser ablation and patterning on Ag thin films with width and depth control
Silver (Ag) films were deposited on glass substrates by radio frequency (RF) magnetron sputtering and then ablated by a 532 nm nanosecond pulsed laser. The effects of laser fluence and defocusing amount on the width and depth of laser-ablated grooves on 100- and 600-nm-thick Ag films were systematic...
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creator | Huang, Li-jing Zhang, Gao-ming Li, Huang Li, Bao-jia Wang, Yong-ying Ren, Nai-fei |
description | Silver (Ag) films were deposited on glass substrates by radio frequency (RF) magnetron sputtering and then ablated by a 532 nm nanosecond pulsed laser. The effects of laser fluence and defocusing amount on the width and depth of laser-ablated grooves on 100- and 600-nm-thick Ag films were systematically investigated under single- and multi-scan ablation. The results suggested that the Ag films could be successfully removed from the substrate owing to laser-induced thermoelastic force or vaporization. It was confirmed that laser fluence and defocusing amount played very important roles in controlling the width and depth of the laser-ablated grooves. In the present work, grooves with widths ranging from 53 to 196 μm and depths ranging from 56 to 196 nm were obtained on 100-nm-thick Ag films by single-scan laser ablation, and laser ablation or removal with controllable depths was realized on 600-nm-thick Ag films by adopting single- or multi-scan (i.e., scanning numbers of 1–6). Furthermore, square spiral Ag patterns were successfully obtained by single- and multi-scan laser ablation and showed good electrical conductivity in a simple circuit. This work may have great potential applications in various fields that demand width and depth control of laser ablation/removal. |
doi_str_mv | 10.1007/s10854-020-03061-y |
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The effects of laser fluence and defocusing amount on the width and depth of laser-ablated grooves on 100- and 600-nm-thick Ag films were systematically investigated under single- and multi-scan ablation. The results suggested that the Ag films could be successfully removed from the substrate owing to laser-induced thermoelastic force or vaporization. It was confirmed that laser fluence and defocusing amount played very important roles in controlling the width and depth of the laser-ablated grooves. In the present work, grooves with widths ranging from 53 to 196 μm and depths ranging from 56 to 196 nm were obtained on 100-nm-thick Ag films by single-scan laser ablation, and laser ablation or removal with controllable depths was realized on 600-nm-thick Ag films by adopting single- or multi-scan (i.e., scanning numbers of 1–6). Furthermore, square spiral Ag patterns were successfully obtained by single- and multi-scan laser ablation and showed good electrical conductivity in a simple circuit. This work may have great potential applications in various fields that demand width and depth control of laser ablation/removal.</description><identifier>ISSN: 0957-4522</identifier><identifier>EISSN: 1573-482X</identifier><identifier>DOI: 10.1007/s10854-020-03061-y</identifier><language>eng</language><publisher>New York: Springer US</publisher><subject>Characterization and Evaluation of Materials ; Chemistry and Materials Science ; Circuits ; Defocusing ; Electrical resistivity ; Fluence ; Glass substrates ; Grooves ; Isotopes ; Laser ablation ; Lasers ; Magnetron sputtering ; Materials Science ; Optical and Electronic Materials ; Pulsed lasers ; Radio frequency ; Stability ; Thick films ; Thin films ; Vaporization</subject><ispartof>Journal of materials science. 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All Rights Reserved.</rights><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c319t-a34a1fa17fc5657101bbc89b879205dfdbe137ab61e23864d8bfaa0a385430cc3</citedby><cites>FETCH-LOGICAL-c319t-a34a1fa17fc5657101bbc89b879205dfdbe137ab61e23864d8bfaa0a385430cc3</cites><orcidid>0000-0002-0693-0677</orcidid></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktopdf>$$Uhttps://link.springer.com/content/pdf/10.1007/s10854-020-03061-y$$EPDF$$P50$$Gspringer$$H</linktopdf><linktohtml>$$Uhttps://link.springer.com/10.1007/s10854-020-03061-y$$EHTML$$P50$$Gspringer$$H</linktohtml><link.rule.ids>314,776,780,27901,27902,41464,42533,51294</link.rule.ids></links><search><creatorcontrib>Huang, Li-jing</creatorcontrib><creatorcontrib>Zhang, Gao-ming</creatorcontrib><creatorcontrib>Li, Huang</creatorcontrib><creatorcontrib>Li, Bao-jia</creatorcontrib><creatorcontrib>Wang, Yong-ying</creatorcontrib><creatorcontrib>Ren, Nai-fei</creatorcontrib><title>Selective laser ablation and patterning on Ag thin films with width and depth control</title><title>Journal of materials science. Materials in electronics</title><addtitle>J Mater Sci: Mater Electron</addtitle><description>Silver (Ag) films were deposited on glass substrates by radio frequency (RF) magnetron sputtering and then ablated by a 532 nm nanosecond pulsed laser. The effects of laser fluence and defocusing amount on the width and depth of laser-ablated grooves on 100- and 600-nm-thick Ag films were systematically investigated under single- and multi-scan ablation. The results suggested that the Ag films could be successfully removed from the substrate owing to laser-induced thermoelastic force or vaporization. It was confirmed that laser fluence and defocusing amount played very important roles in controlling the width and depth of the laser-ablated grooves. In the present work, grooves with widths ranging from 53 to 196 μm and depths ranging from 56 to 196 nm were obtained on 100-nm-thick Ag films by single-scan laser ablation, and laser ablation or removal with controllable depths was realized on 600-nm-thick Ag films by adopting single- or multi-scan (i.e., scanning numbers of 1–6). Furthermore, square spiral Ag patterns were successfully obtained by single- and multi-scan laser ablation and showed good electrical conductivity in a simple circuit. This work may have great potential applications in various fields that demand width and depth control of laser ablation/removal.</description><subject>Characterization and Evaluation of Materials</subject><subject>Chemistry and Materials Science</subject><subject>Circuits</subject><subject>Defocusing</subject><subject>Electrical resistivity</subject><subject>Fluence</subject><subject>Glass substrates</subject><subject>Grooves</subject><subject>Isotopes</subject><subject>Laser ablation</subject><subject>Lasers</subject><subject>Magnetron sputtering</subject><subject>Materials Science</subject><subject>Optical and Electronic Materials</subject><subject>Pulsed lasers</subject><subject>Radio frequency</subject><subject>Stability</subject><subject>Thick films</subject><subject>Thin films</subject><subject>Vaporization</subject><issn>0957-4522</issn><issn>1573-482X</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2020</creationdate><recordtype>article</recordtype><sourceid>BENPR</sourceid><recordid>eNp9kE9LxDAQxYMouK5-AU8Bz9FJ0ibtcVn8BwsedMFbSNO026Wb1iSr7Lc3awVvXmaG4b03zA-hawq3FEDeBQpFnhFgQICDoORwgmY0l5xkBXs_RTMoc0mynLFzdBHCFgBExosZWr_a3prYfVrc62A91lWvYzc4rF2NRx2j9a5zLU6bRYvjpnO46fpdwF9d3KRSp3qU1nZMkxlc9EN_ic4a3Qd79dvnaP1w_7Z8IquXx-flYkUMp2UkmmeaNprKxuQilxRoVZmirApZMsjrpq4s5VJXglrGC5HVRdVoDZqnXzkYw-foZsod_fCxtyGq7bD3Lp1UjAtBJWUCkopNKuOHELxt1Oi7nfYHRUEd8akJn0r41A8-dUgmPplCErvW-r_of1zfNUBzmg</recordid><startdate>20200301</startdate><enddate>20200301</enddate><creator>Huang, Li-jing</creator><creator>Zhang, Gao-ming</creator><creator>Li, Huang</creator><creator>Li, Bao-jia</creator><creator>Wang, Yong-ying</creator><creator>Ren, Nai-fei</creator><general>Springer US</general><general>Springer Nature B.V</general><scope>AAYXX</scope><scope>CITATION</scope><scope>7SP</scope><scope>7SR</scope><scope>8BQ</scope><scope>8FD</scope><scope>8FE</scope><scope>8FG</scope><scope>ABJCF</scope><scope>AFKRA</scope><scope>ARAPS</scope><scope>BENPR</scope><scope>BGLVJ</scope><scope>CCPQU</scope><scope>D1I</scope><scope>DWQXO</scope><scope>F28</scope><scope>FR3</scope><scope>HCIFZ</scope><scope>JG9</scope><scope>KB.</scope><scope>L7M</scope><scope>P5Z</scope><scope>P62</scope><scope>PDBOC</scope><scope>PQEST</scope><scope>PQQKQ</scope><scope>PQUKI</scope><scope>PRINS</scope><scope>S0W</scope><orcidid>https://orcid.org/0000-0002-0693-0677</orcidid></search><sort><creationdate>20200301</creationdate><title>Selective laser ablation and patterning on Ag thin films with width and depth control</title><author>Huang, Li-jing ; Zhang, Gao-ming ; Li, Huang ; Li, Bao-jia ; Wang, Yong-ying ; Ren, Nai-fei</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c319t-a34a1fa17fc5657101bbc89b879205dfdbe137ab61e23864d8bfaa0a385430cc3</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2020</creationdate><topic>Characterization and Evaluation of Materials</topic><topic>Chemistry and Materials Science</topic><topic>Circuits</topic><topic>Defocusing</topic><topic>Electrical resistivity</topic><topic>Fluence</topic><topic>Glass substrates</topic><topic>Grooves</topic><topic>Isotopes</topic><topic>Laser ablation</topic><topic>Lasers</topic><topic>Magnetron sputtering</topic><topic>Materials Science</topic><topic>Optical and Electronic Materials</topic><topic>Pulsed lasers</topic><topic>Radio frequency</topic><topic>Stability</topic><topic>Thick films</topic><topic>Thin films</topic><topic>Vaporization</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Huang, Li-jing</creatorcontrib><creatorcontrib>Zhang, Gao-ming</creatorcontrib><creatorcontrib>Li, Huang</creatorcontrib><creatorcontrib>Li, Bao-jia</creatorcontrib><creatorcontrib>Wang, Yong-ying</creatorcontrib><creatorcontrib>Ren, Nai-fei</creatorcontrib><collection>CrossRef</collection><collection>Electronics & Communications Abstracts</collection><collection>Engineered Materials Abstracts</collection><collection>METADEX</collection><collection>Technology Research Database</collection><collection>ProQuest SciTech Collection</collection><collection>ProQuest Technology Collection</collection><collection>Materials Science & Engineering Collection</collection><collection>ProQuest Central UK/Ireland</collection><collection>Advanced Technologies & Aerospace Collection</collection><collection>ProQuest Central</collection><collection>Technology Collection</collection><collection>ProQuest One Community College</collection><collection>ProQuest Materials Science Collection</collection><collection>ProQuest Central Korea</collection><collection>ANTE: Abstracts in New Technology & Engineering</collection><collection>Engineering Research Database</collection><collection>SciTech Premium Collection</collection><collection>Materials Research Database</collection><collection>Materials Science Database</collection><collection>Advanced Technologies Database with Aerospace</collection><collection>Advanced Technologies & Aerospace Database</collection><collection>ProQuest Advanced Technologies & Aerospace Collection</collection><collection>Materials Science Collection</collection><collection>ProQuest One Academic Eastern Edition (DO NOT USE)</collection><collection>ProQuest One Academic</collection><collection>ProQuest One Academic UKI Edition</collection><collection>ProQuest Central China</collection><collection>DELNET Engineering & Technology Collection</collection><jtitle>Journal of materials science. Materials in electronics</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Huang, Li-jing</au><au>Zhang, Gao-ming</au><au>Li, Huang</au><au>Li, Bao-jia</au><au>Wang, Yong-ying</au><au>Ren, Nai-fei</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Selective laser ablation and patterning on Ag thin films with width and depth control</atitle><jtitle>Journal of materials science. Materials in electronics</jtitle><stitle>J Mater Sci: Mater Electron</stitle><date>2020-03-01</date><risdate>2020</risdate><volume>31</volume><issue>6</issue><spage>4943</spage><epage>4955</epage><pages>4943-4955</pages><issn>0957-4522</issn><eissn>1573-482X</eissn><abstract>Silver (Ag) films were deposited on glass substrates by radio frequency (RF) magnetron sputtering and then ablated by a 532 nm nanosecond pulsed laser. The effects of laser fluence and defocusing amount on the width and depth of laser-ablated grooves on 100- and 600-nm-thick Ag films were systematically investigated under single- and multi-scan ablation. The results suggested that the Ag films could be successfully removed from the substrate owing to laser-induced thermoelastic force or vaporization. It was confirmed that laser fluence and defocusing amount played very important roles in controlling the width and depth of the laser-ablated grooves. In the present work, grooves with widths ranging from 53 to 196 μm and depths ranging from 56 to 196 nm were obtained on 100-nm-thick Ag films by single-scan laser ablation, and laser ablation or removal with controllable depths was realized on 600-nm-thick Ag films by adopting single- or multi-scan (i.e., scanning numbers of 1–6). Furthermore, square spiral Ag patterns were successfully obtained by single- and multi-scan laser ablation and showed good electrical conductivity in a simple circuit. This work may have great potential applications in various fields that demand width and depth control of laser ablation/removal.</abstract><cop>New York</cop><pub>Springer US</pub><doi>10.1007/s10854-020-03061-y</doi><tpages>13</tpages><orcidid>https://orcid.org/0000-0002-0693-0677</orcidid></addata></record> |
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subjects | Characterization and Evaluation of Materials Chemistry and Materials Science Circuits Defocusing Electrical resistivity Fluence Glass substrates Grooves Isotopes Laser ablation Lasers Magnetron sputtering Materials Science Optical and Electronic Materials Pulsed lasers Radio frequency Stability Thick films Thin films Vaporization |
title | Selective laser ablation and patterning on Ag thin films with width and depth control |
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