Testing and Comparison of Imaging Detectors for Electrons in the Energy Range 10–20 keV

Interest in direct detectors for low-energy electrons has increased markedly in recent years. Detection of electrons in the energy range up to low tens of keV is important in techniques such as photoelectron emission microscopy (PEEM) and electron backscatter diffraction (EBSD) on scanning electron...

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Veröffentlicht in:Journal of instrumentation 2017-11, Vol.12 (11), p.C11016-C11016
Hauptverfasser: Matheson, J., Moldovan, G., Kirkland, A., Allinson, N., Abrahams, J.P.
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Sprache:eng
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