Applications of a pnCCD detector coupled to columnar structure CsI(Tl) scintillator system in ultra high energy X-ray Laue diffraction

Most charge coupled devices (CCDs) are made of silicon (Si) with typical active layer thicknesses of several microns. In case of a pnCCD detector the sensitive Si thickness is 450 μm. However, for silicon based detectors the quantum efficiency for hard X-rays drops significantly for photon energies...

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Veröffentlicht in:	Journal of instrumentation 2017-12, Vol.12 (12), p.P12032-P12032
Hauptverfasser:	Shokr, M., Schlosser, D., Abboud, A., Algashi, A., Tosson, A., Conka, T., Hartmann, R., Klaus, M., Genzel, C., Strüder, L., Pietsch, U.
Format:	Artikel
Sprache:	eng
Schlagworte:	Charge coupled devices Columnar structure Crystal structure Crystals Low noise Photons Pixels Quantum efficiency Scintillation counters Sensors Silicon Single crystals Synchrotron radiation Thickness X-rays
Online-Zugang:	Volltext
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