Mechanism of Diffusion of Carbon and Silicon Monooxides in a Cubic Silicon Carbide Crystal
The main processes that occur during diffusion of gaseous carbon CO and silicon SiO monoxides through a layer of a single-crystal silicon carbide SiC of the cubic polytype are described. This problem arises as a single-crystal SiC layer is grown by the method of matched atomic substitution due to th...
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Veröffentlicht in: | Physics of the solid state 2019-12, Vol.61 (12), p.2338-2341 |
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description | The main processes that occur during diffusion of gaseous carbon CO and silicon SiO monoxides through a layer of a single-crystal silicon carbide SiC of the cubic polytype are described. This problem arises as a single-crystal SiC layer is grown by the method of matched atomic substitution due to the chemical reaction of a crystalline silicon substrate with CO gas. The reaction products are an epitaxial SiC layer and SiO gas. CO and SiO molecules are shown to decompose in the SiC crystal into individual atoms. The oxygen atoms diffuse over interstitial sites only in the [110] direction with the activation energy 2.6 eV. The Si and C atoms displace by the vacancy mechanism in the corresponding SiC sublattices with activation energies 3.6 and 3.9 eV, respectively, and only in the [110] direction. |
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A. ; Osipov, A. V.</creator><creatorcontrib>Kukushkin, S. A. ; Osipov, A. V.</creatorcontrib><description>The main processes that occur during diffusion of gaseous carbon CO and silicon SiO monoxides through a layer of a single-crystal silicon carbide SiC of the cubic polytype are described. This problem arises as a single-crystal SiC layer is grown by the method of matched atomic substitution due to the chemical reaction of a crystalline silicon substrate with CO gas. The reaction products are an epitaxial SiC layer and SiO gas. CO and SiO molecules are shown to decompose in the SiC crystal into individual atoms. The oxygen atoms diffuse over interstitial sites only in the [110] direction with the activation energy 2.6 eV. The Si and C atoms displace by the vacancy mechanism in the corresponding SiC sublattices with activation energies 3.6 and 3.9 eV, respectively, and only in the [110] direction.</description><identifier>ISSN: 1063-7834</identifier><identifier>EISSN: 1090-6460</identifier><identifier>DOI: 10.1134/S1063783419120242</identifier><language>eng</language><publisher>Moscow: Pleiades Publishing</publisher><subject>Activation energy ; Atoms ; Carbon monoxide ; Chemical reactions ; Crystal growth ; Crystals ; Diffusion layers ; Epitaxy ; Organic chemistry ; Oxygen atoms ; Physics ; Physics and Astronomy ; Reaction products ; Semiconductors ; Silicon ; Silicon carbide ; Silicon substrates ; Single crystals ; Solid State Physics ; Substitution reactions</subject><ispartof>Physics of the solid state, 2019-12, Vol.61 (12), p.2338-2341</ispartof><rights>Pleiades Publishing, Ltd. 2019</rights><rights>COPYRIGHT 2019 Springer</rights><rights>2019© Pleiades Publishing, Ltd. 2019</rights><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c319t-dcde615e41d430b9723d44ec8e89ea8e485c1f514c8c461748d6a311ade51fa73</citedby><cites>FETCH-LOGICAL-c319t-dcde615e41d430b9723d44ec8e89ea8e485c1f514c8c461748d6a311ade51fa73</cites></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktopdf>$$Uhttps://link.springer.com/content/pdf/10.1134/S1063783419120242$$EPDF$$P50$$Gspringer$$H</linktopdf><linktohtml>$$Uhttps://link.springer.com/10.1134/S1063783419120242$$EHTML$$P50$$Gspringer$$H</linktohtml><link.rule.ids>314,780,784,27924,27925,41488,42557,51319</link.rule.ids></links><search><creatorcontrib>Kukushkin, S. A.</creatorcontrib><creatorcontrib>Osipov, A. V.</creatorcontrib><title>Mechanism of Diffusion of Carbon and Silicon Monooxides in a Cubic Silicon Carbide Crystal</title><title>Physics of the solid state</title><addtitle>Phys. Solid State</addtitle><description>The main processes that occur during diffusion of gaseous carbon CO and silicon SiO monoxides through a layer of a single-crystal silicon carbide SiC of the cubic polytype are described. This problem arises as a single-crystal SiC layer is grown by the method of matched atomic substitution due to the chemical reaction of a crystalline silicon substrate with CO gas. The reaction products are an epitaxial SiC layer and SiO gas. CO and SiO molecules are shown to decompose in the SiC crystal into individual atoms. The oxygen atoms diffuse over interstitial sites only in the [110] direction with the activation energy 2.6 eV. The Si and C atoms displace by the vacancy mechanism in the corresponding SiC sublattices with activation energies 3.6 and 3.9 eV, respectively, and only in the [110] direction.</description><subject>Activation energy</subject><subject>Atoms</subject><subject>Carbon monoxide</subject><subject>Chemical reactions</subject><subject>Crystal growth</subject><subject>Crystals</subject><subject>Diffusion layers</subject><subject>Epitaxy</subject><subject>Organic chemistry</subject><subject>Oxygen atoms</subject><subject>Physics</subject><subject>Physics and Astronomy</subject><subject>Reaction products</subject><subject>Semiconductors</subject><subject>Silicon</subject><subject>Silicon carbide</subject><subject>Silicon substrates</subject><subject>Single crystals</subject><subject>Solid State Physics</subject><subject>Substitution reactions</subject><issn>1063-7834</issn><issn>1090-6460</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2019</creationdate><recordtype>article</recordtype><recordid>eNp1kV9LwzAUxYsoOKcfwLeCTz505jZp2j6O-m-wITh98aVkyc3M2JqZtLB9e1MmiojkIffm_M7JhRtFl0BGAJTdzIFwmheUQQkpSVl6FA2AlCThjJPjvuY06fXT6Mz7FSEAkJWD6G2G8l00xm9iq-Nbo3XnjW36phJuESrRqHhu1kaGemYba3dGoY9NUOKqWxj5rfaGoMWV2_tWrM-jEy3WHi--7mH0en_3Uj0m06eHSTWeJpJC2SZKKuSQIQPFKFmUeUoVYygLLEoUBbIik6AzYLKQjEPOCsUFBRAKM9Aip8Po6pC7dfajQ9_WK9u5JnxZp5QTCAElD9ToQC3FGmvTaNs6IcNRuOmnR23C-5gDy1PO8j72-pchMC3u2qXovK8n8-ffLBxY6az3DnW9dWYj3L4GUvf7qf_sJ3jSg8cHtlmi-xn7f9Mn75KPVQ</recordid><startdate>20191201</startdate><enddate>20191201</enddate><creator>Kukushkin, S. 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V.</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c319t-dcde615e41d430b9723d44ec8e89ea8e485c1f514c8c461748d6a311ade51fa73</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2019</creationdate><topic>Activation energy</topic><topic>Atoms</topic><topic>Carbon monoxide</topic><topic>Chemical reactions</topic><topic>Crystal growth</topic><topic>Crystals</topic><topic>Diffusion layers</topic><topic>Epitaxy</topic><topic>Organic chemistry</topic><topic>Oxygen atoms</topic><topic>Physics</topic><topic>Physics and Astronomy</topic><topic>Reaction products</topic><topic>Semiconductors</topic><topic>Silicon</topic><topic>Silicon carbide</topic><topic>Silicon substrates</topic><topic>Single crystals</topic><topic>Solid State Physics</topic><topic>Substitution reactions</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Kukushkin, S. A.</creatorcontrib><creatorcontrib>Osipov, A. V.</creatorcontrib><collection>CrossRef</collection><collection>Gale In Context: Science</collection><jtitle>Physics of the solid state</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Kukushkin, S. A.</au><au>Osipov, A. V.</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Mechanism of Diffusion of Carbon and Silicon Monooxides in a Cubic Silicon Carbide Crystal</atitle><jtitle>Physics of the solid state</jtitle><stitle>Phys. Solid State</stitle><date>2019-12-01</date><risdate>2019</risdate><volume>61</volume><issue>12</issue><spage>2338</spage><epage>2341</epage><pages>2338-2341</pages><issn>1063-7834</issn><eissn>1090-6460</eissn><abstract>The main processes that occur during diffusion of gaseous carbon CO and silicon SiO monoxides through a layer of a single-crystal silicon carbide SiC of the cubic polytype are described. This problem arises as a single-crystal SiC layer is grown by the method of matched atomic substitution due to the chemical reaction of a crystalline silicon substrate with CO gas. The reaction products are an epitaxial SiC layer and SiO gas. CO and SiO molecules are shown to decompose in the SiC crystal into individual atoms. The oxygen atoms diffuse over interstitial sites only in the [110] direction with the activation energy 2.6 eV. The Si and C atoms displace by the vacancy mechanism in the corresponding SiC sublattices with activation energies 3.6 and 3.9 eV, respectively, and only in the [110] direction.</abstract><cop>Moscow</cop><pub>Pleiades Publishing</pub><doi>10.1134/S1063783419120242</doi><tpages>4</tpages></addata></record> |
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subjects | Activation energy Atoms Carbon monoxide Chemical reactions Crystal growth Crystals Diffusion layers Epitaxy Organic chemistry Oxygen atoms Physics Physics and Astronomy Reaction products Semiconductors Silicon Silicon carbide Silicon substrates Single crystals Solid State Physics Substitution reactions |
title | Mechanism of Diffusion of Carbon and Silicon Monooxides in a Cubic Silicon Carbide Crystal |
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