The Rasnik 3-point optical alignment system

The Rasnik alignment system was developed initially in 1983 for the monitoring of the alignment of the muon chambers of the L3 Muon Spectrometer at CERN. Since then, the development has continued as new opto-electronic components become available. Rasnik systems are 3-point optical displacement moni...

Ausführliche Beschreibung

Gespeichert in:
Bibliographische Detailangaben
Veröffentlicht in:Journal of instrumentation 2019-08, Vol.14 (8), p.P08010-P08010
Hauptverfasser: Beker, M., Bobbink, G., Bouwens, B., Deelen, N., Duinker, P., Eldik, J. van, Fortman, N. de Gaay, Geer, R. van der, Graaf, H. van der, Groenstege, H., Hart, R., Hashemi, K., Heijningen, J. van, Kea, M., Koopstra, J., Leijtens, X., Linde, F., Paradiso, J.A., Tolsma, H., Woudstra, M.
Format: Artikel
Sprache:eng
Schlagworte:
Online-Zugang:Volltext
Tags: Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
container_end_page P08010
container_issue 8
container_start_page P08010
container_title Journal of instrumentation
container_volume 14
creator Beker, M.
Bobbink, G.
Bouwens, B.
Deelen, N.
Duinker, P.
Eldik, J. van
Fortman, N. de Gaay
Geer, R. van der
Graaf, H. van der
Groenstege, H.
Hart, R.
Hashemi, K.
Heijningen, J. van
Kea, M.
Koopstra, J.
Leijtens, X.
Linde, F.
Paradiso, J.A.
Tolsma, H.
Woudstra, M.
description The Rasnik alignment system was developed initially in 1983 for the monitoring of the alignment of the muon chambers of the L3 Muon Spectrometer at CERN. Since then, the development has continued as new opto-electronic components become available. Rasnik systems are 3-point optical displacement monitors and their precision ranges from below nanometers to several micrometers, depending on the design and requirements of the systems. A result, expressed in the range/precision ratio of 2×106, is presented. According to the calculations of the Cram'er-Rao limit, and by means of MonteCarlo simulations, a typical Rasnik image should have enough information to reach deep sub-nanometer precision. This paper is an overview of the technological developments and achievements since Rasnik was applied in high energy physics experiments.
doi_str_mv 10.1088/1748-0221/14/08/P08010
format Article
fullrecord <record><control><sourceid>proquest_cross</sourceid><recordid>TN_cdi_proquest_journals_2357640571</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>2357640571</sourcerecordid><originalsourceid>FETCH-LOGICAL-c336t-72c37e88fbf52109ee34f978cb290933be39c3e1804fc49c1bbb632fe6560b683</originalsourceid><addsrcrecordid>eNpNkE9LxDAQxYMouK5-BSl4lNpJJkmToyy6CguKrOfQhES79p9J97Df3i0V8TSPeT9meI-Qawp3FJQqaMlVDozRgvICVPEKCiickMWfcfpPn5OLlHYAQgsOC3K7_fTZW5W6-ivDfOjrbsz6Yaxd1WRVU390rT9u0iGNvr0kZ6Fqkr_6nUvy_viwXT3lm5f18-p-kztEOeYlc1h6pYINglHQ3iMPulTOMg0a0XrUDj1VwIPj2lFrrUQWvBQSrFS4JDfz3SH233ufRrPr97E7vjQMRSk5iJIeKTlTLvYpRR_MEOu2igdDwUzFmCmzmTIbyg0oMxeDP97QVE4</addsrcrecordid><sourcetype>Aggregation Database</sourcetype><iscdi>true</iscdi><recordtype>article</recordtype><pqid>2357640571</pqid></control><display><type>article</type><title>The Rasnik 3-point optical alignment system</title><source>IOP Publishing Journals</source><source>Institute of Physics (IOP) Journals - HEAL-Link</source><creator>Beker, M. ; Bobbink, G. ; Bouwens, B. ; Deelen, N. ; Duinker, P. ; Eldik, J. van ; Fortman, N. de Gaay ; Geer, R. van der ; Graaf, H. van der ; Groenstege, H. ; Hart, R. ; Hashemi, K. ; Heijningen, J. van ; Kea, M. ; Koopstra, J. ; Leijtens, X. ; Linde, F. ; Paradiso, J.A. ; Tolsma, H. ; Woudstra, M.</creator><creatorcontrib>Beker, M. ; Bobbink, G. ; Bouwens, B. ; Deelen, N. ; Duinker, P. ; Eldik, J. van ; Fortman, N. de Gaay ; Geer, R. van der ; Graaf, H. van der ; Groenstege, H. ; Hart, R. ; Hashemi, K. ; Heijningen, J. van ; Kea, M. ; Koopstra, J. ; Leijtens, X. ; Linde, F. ; Paradiso, J.A. ; Tolsma, H. ; Woudstra, M.</creatorcontrib><description>The Rasnik alignment system was developed initially in 1983 for the monitoring of the alignment of the muon chambers of the L3 Muon Spectrometer at CERN. Since then, the development has continued as new opto-electronic components become available. Rasnik systems are 3-point optical displacement monitors and their precision ranges from below nanometers to several micrometers, depending on the design and requirements of the systems. A result, expressed in the range/precision ratio of 2×106, is presented. According to the calculations of the Cram'er-Rao limit, and by means of MonteCarlo simulations, a typical Rasnik image should have enough information to reach deep sub-nanometer precision. This paper is an overview of the technological developments and achievements since Rasnik was applied in high energy physics experiments.</description><identifier>ISSN: 1748-0221</identifier><identifier>EISSN: 1748-0221</identifier><identifier>DOI: 10.1088/1748-0221/14/08/P08010</identifier><language>eng</language><publisher>Bristol: IOP Publishing</publisher><subject>Alignment ; Electronic components ; Micrometers ; Muons ; Optoelectronics</subject><ispartof>Journal of instrumentation, 2019-08, Vol.14 (8), p.P08010-P08010</ispartof><rights>Copyright IOP Publishing Aug 2019</rights><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c336t-72c37e88fbf52109ee34f978cb290933be39c3e1804fc49c1bbb632fe6560b683</citedby><cites>FETCH-LOGICAL-c336t-72c37e88fbf52109ee34f978cb290933be39c3e1804fc49c1bbb632fe6560b683</cites></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><link.rule.ids>314,776,780,27901,27902</link.rule.ids></links><search><creatorcontrib>Beker, M.</creatorcontrib><creatorcontrib>Bobbink, G.</creatorcontrib><creatorcontrib>Bouwens, B.</creatorcontrib><creatorcontrib>Deelen, N.</creatorcontrib><creatorcontrib>Duinker, P.</creatorcontrib><creatorcontrib>Eldik, J. van</creatorcontrib><creatorcontrib>Fortman, N. de Gaay</creatorcontrib><creatorcontrib>Geer, R. van der</creatorcontrib><creatorcontrib>Graaf, H. van der</creatorcontrib><creatorcontrib>Groenstege, H.</creatorcontrib><creatorcontrib>Hart, R.</creatorcontrib><creatorcontrib>Hashemi, K.</creatorcontrib><creatorcontrib>Heijningen, J. van</creatorcontrib><creatorcontrib>Kea, M.</creatorcontrib><creatorcontrib>Koopstra, J.</creatorcontrib><creatorcontrib>Leijtens, X.</creatorcontrib><creatorcontrib>Linde, F.</creatorcontrib><creatorcontrib>Paradiso, J.A.</creatorcontrib><creatorcontrib>Tolsma, H.</creatorcontrib><creatorcontrib>Woudstra, M.</creatorcontrib><title>The Rasnik 3-point optical alignment system</title><title>Journal of instrumentation</title><description>The Rasnik alignment system was developed initially in 1983 for the monitoring of the alignment of the muon chambers of the L3 Muon Spectrometer at CERN. Since then, the development has continued as new opto-electronic components become available. Rasnik systems are 3-point optical displacement monitors and their precision ranges from below nanometers to several micrometers, depending on the design and requirements of the systems. A result, expressed in the range/precision ratio of 2×106, is presented. According to the calculations of the Cram'er-Rao limit, and by means of MonteCarlo simulations, a typical Rasnik image should have enough information to reach deep sub-nanometer precision. This paper is an overview of the technological developments and achievements since Rasnik was applied in high energy physics experiments.</description><subject>Alignment</subject><subject>Electronic components</subject><subject>Micrometers</subject><subject>Muons</subject><subject>Optoelectronics</subject><issn>1748-0221</issn><issn>1748-0221</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2019</creationdate><recordtype>article</recordtype><recordid>eNpNkE9LxDAQxYMouK5-BSl4lNpJJkmToyy6CguKrOfQhES79p9J97Df3i0V8TSPeT9meI-Qawp3FJQqaMlVDozRgvICVPEKCiickMWfcfpPn5OLlHYAQgsOC3K7_fTZW5W6-ivDfOjrbsz6Yaxd1WRVU390rT9u0iGNvr0kZ6Fqkr_6nUvy_viwXT3lm5f18-p-kztEOeYlc1h6pYINglHQ3iMPulTOMg0a0XrUDj1VwIPj2lFrrUQWvBQSrFS4JDfz3SH233ufRrPr97E7vjQMRSk5iJIeKTlTLvYpRR_MEOu2igdDwUzFmCmzmTIbyg0oMxeDP97QVE4</recordid><startdate>20190808</startdate><enddate>20190808</enddate><creator>Beker, M.</creator><creator>Bobbink, G.</creator><creator>Bouwens, B.</creator><creator>Deelen, N.</creator><creator>Duinker, P.</creator><creator>Eldik, J. van</creator><creator>Fortman, N. de Gaay</creator><creator>Geer, R. van der</creator><creator>Graaf, H. van der</creator><creator>Groenstege, H.</creator><creator>Hart, R.</creator><creator>Hashemi, K.</creator><creator>Heijningen, J. van</creator><creator>Kea, M.</creator><creator>Koopstra, J.</creator><creator>Leijtens, X.</creator><creator>Linde, F.</creator><creator>Paradiso, J.A.</creator><creator>Tolsma, H.</creator><creator>Woudstra, M.</creator><general>IOP Publishing</general><scope>AAYXX</scope><scope>CITATION</scope><scope>7U5</scope><scope>8FD</scope><scope>L7M</scope></search><sort><creationdate>20190808</creationdate><title>The Rasnik 3-point optical alignment system</title><author>Beker, M. ; Bobbink, G. ; Bouwens, B. ; Deelen, N. ; Duinker, P. ; Eldik, J. van ; Fortman, N. de Gaay ; Geer, R. van der ; Graaf, H. van der ; Groenstege, H. ; Hart, R. ; Hashemi, K. ; Heijningen, J. van ; Kea, M. ; Koopstra, J. ; Leijtens, X. ; Linde, F. ; Paradiso, J.A. ; Tolsma, H. ; Woudstra, M.</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c336t-72c37e88fbf52109ee34f978cb290933be39c3e1804fc49c1bbb632fe6560b683</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2019</creationdate><topic>Alignment</topic><topic>Electronic components</topic><topic>Micrometers</topic><topic>Muons</topic><topic>Optoelectronics</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Beker, M.</creatorcontrib><creatorcontrib>Bobbink, G.</creatorcontrib><creatorcontrib>Bouwens, B.</creatorcontrib><creatorcontrib>Deelen, N.</creatorcontrib><creatorcontrib>Duinker, P.</creatorcontrib><creatorcontrib>Eldik, J. van</creatorcontrib><creatorcontrib>Fortman, N. de Gaay</creatorcontrib><creatorcontrib>Geer, R. van der</creatorcontrib><creatorcontrib>Graaf, H. van der</creatorcontrib><creatorcontrib>Groenstege, H.</creatorcontrib><creatorcontrib>Hart, R.</creatorcontrib><creatorcontrib>Hashemi, K.</creatorcontrib><creatorcontrib>Heijningen, J. van</creatorcontrib><creatorcontrib>Kea, M.</creatorcontrib><creatorcontrib>Koopstra, J.</creatorcontrib><creatorcontrib>Leijtens, X.</creatorcontrib><creatorcontrib>Linde, F.</creatorcontrib><creatorcontrib>Paradiso, J.A.</creatorcontrib><creatorcontrib>Tolsma, H.</creatorcontrib><creatorcontrib>Woudstra, M.</creatorcontrib><collection>CrossRef</collection><collection>Solid State and Superconductivity Abstracts</collection><collection>Technology Research Database</collection><collection>Advanced Technologies Database with Aerospace</collection><jtitle>Journal of instrumentation</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Beker, M.</au><au>Bobbink, G.</au><au>Bouwens, B.</au><au>Deelen, N.</au><au>Duinker, P.</au><au>Eldik, J. van</au><au>Fortman, N. de Gaay</au><au>Geer, R. van der</au><au>Graaf, H. van der</au><au>Groenstege, H.</au><au>Hart, R.</au><au>Hashemi, K.</au><au>Heijningen, J. van</au><au>Kea, M.</au><au>Koopstra, J.</au><au>Leijtens, X.</au><au>Linde, F.</au><au>Paradiso, J.A.</au><au>Tolsma, H.</au><au>Woudstra, M.</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>The Rasnik 3-point optical alignment system</atitle><jtitle>Journal of instrumentation</jtitle><date>2019-08-08</date><risdate>2019</risdate><volume>14</volume><issue>8</issue><spage>P08010</spage><epage>P08010</epage><pages>P08010-P08010</pages><issn>1748-0221</issn><eissn>1748-0221</eissn><abstract>The Rasnik alignment system was developed initially in 1983 for the monitoring of the alignment of the muon chambers of the L3 Muon Spectrometer at CERN. Since then, the development has continued as new opto-electronic components become available. Rasnik systems are 3-point optical displacement monitors and their precision ranges from below nanometers to several micrometers, depending on the design and requirements of the systems. A result, expressed in the range/precision ratio of 2×106, is presented. According to the calculations of the Cram'er-Rao limit, and by means of MonteCarlo simulations, a typical Rasnik image should have enough information to reach deep sub-nanometer precision. This paper is an overview of the technological developments and achievements since Rasnik was applied in high energy physics experiments.</abstract><cop>Bristol</cop><pub>IOP Publishing</pub><doi>10.1088/1748-0221/14/08/P08010</doi></addata></record>
fulltext fulltext
identifier ISSN: 1748-0221
ispartof Journal of instrumentation, 2019-08, Vol.14 (8), p.P08010-P08010
issn 1748-0221
1748-0221
language eng
recordid cdi_proquest_journals_2357640571
source IOP Publishing Journals; Institute of Physics (IOP) Journals - HEAL-Link
subjects Alignment
Electronic components
Micrometers
Muons
Optoelectronics
title The Rasnik 3-point optical alignment system
url https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-02-11T11%3A39%3A44IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-proquest_cross&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.genre=article&rft.atitle=The%20Rasnik%203-point%20optical%20alignment%20system&rft.jtitle=Journal%20of%20instrumentation&rft.au=Beker,%20M.&rft.date=2019-08-08&rft.volume=14&rft.issue=8&rft.spage=P08010&rft.epage=P08010&rft.pages=P08010-P08010&rft.issn=1748-0221&rft.eissn=1748-0221&rft_id=info:doi/10.1088/1748-0221/14/08/P08010&rft_dat=%3Cproquest_cross%3E2357640571%3C/proquest_cross%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_pqid=2357640571&rft_id=info:pmid/&rfr_iscdi=true