Linear and Non-linear Optical Parameters of Diluted Magnetic Semiconductor CdS0.9Mn0.1 Thin Film: Influence of the Film Thickness

The optical properties of CdS 0.9 Mn 0.1 thin film with different thicknesses ( d = 300, 450, 600, 750, 900 and 1000 nm) were explored. The Swanepoel method was employed to calculate the thickness of the studied films. Analyses of the absorption spectra indicated the existence of allowed indirect a...

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Veröffentlicht in:	Journal of electronic materials 2020-03, Vol.49 (3), p.1944-1956
Hauptverfasser:	Abdelraheem, A. M., Abd-Elrahman, M. I., Mohamed, Mansour, Hadia, N. M. A., Shaaban, E. R.
Format:	Artikel
Sprache:	eng
Schlagworte:	Absorption spectra Absorptivity Characterization and Evaluation of Materials Chemistry and Materials Science Dispersion Electrical resistivity Electronics and Microelectronics Energy gap Film thickness Instrumentation Magnetic permeability Magnetic semiconductors Materials Science Optical and Electronic Materials Optical properties Parameters Refractivity Solid State Physics Thin films
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