Synthesis and characterization of La3+ ions incorporated (PVA/PVP) polymer composite films for optoelectronics devices

Polymer rare-earth composite films PVA/PVP –x La 3+ ( x wt%; x = 0, 3, 5, 10, and 15) were fabricated by the solution casting method. The structural parameters of these films were determined from X-ray diffraction (XRD) pattern analysis, and the complexation of La 3+ ions with the polymer composite...

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Veröffentlicht in:	Journal of materials science. Materials in electronics 2020-02, Vol.31 (3), p.2557-2566
Hauptverfasser:	Ali, F. M., Kershi, R. M.
Format:	Artikel
Sprache:	eng
Schlagworte:	Bonding strength Carbonyl groups Carbonyls Characterization and Evaluation of Materials Chemistry and Materials Science Crystallites Dielectric loss Dielectrics Diffraction patterns Electrical properties Electrical resistivity Energy dissipation Energy gap Fourier transforms Infrared spectroscopy Ions Materials Science Materials selection Optical and Electronic Materials Optoelectronics Parameters Pattern analysis Polarization Polymer films Polymer matrix composites Polymers Rare earth elements Refractivity Spectrum analysis
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