Correlation between structural phase transition and surface chemical properties of thin film SrRuO3/SrTiO3 (001)
The correlation between the structural phase transition (SPT) and oxygen vacancy in SrRuO3 (SRO) thin films was investigated by in situ X-ray diffraction (XRD) and ambient pressure X-ray photoelectron spectroscopy (AP-XPS). In situ XRD shows that the SPT occurs from a monoclinic SRO phase to a tetra...
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| Veröffentlicht in: | The Journal of chemical physics 2020-01, Vol.152 (3), p.034704-034704 |
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| creator | Kim, Dongwoo Lim, Hojoon Ha, Sung Soo Seo, Okkyun Lee, Sung Su Kim, Jinwoo Kim, Ki-jeong Perez Ramirez, Lucia Gallet, Jean-Jacques Bournel, Fabrice Jo, Ji Young Nemsak, Slavomir Noh, Do Young Mun, Bongjin Simon |
| description | The correlation between the structural phase transition (SPT) and oxygen vacancy in SrRuO3 (SRO) thin films was investigated by in situ X-ray diffraction (XRD) and ambient pressure X-ray photoelectron spectroscopy (AP-XPS). In situ XRD shows that the SPT occurs from a monoclinic SRO phase to a tetragonal SRO phase near ∼200 °C, regardless of the pressure environment. On the other hand, significant core level shifts in both the Ru and Sr photoemission spectra are found under ultrahigh vacuum, but not under the oxygen pressure environment. The directions and behavior of the core level shift of Ru and Sr are attributed to the formation of oxygen vacancy across the SPT temperature of SRO. The analysis of in situ XRD and AP-XPS results provides an evidence for the formation of metastable surface oxide possibly due to the migration of internal oxygen atoms across the SPT temperature, indicating the close relationship between oxygen vacancy and SPT in SRO thin films. |
| doi_str_mv | 10.1063/1.5134653 |
| format | Article |
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(LBNL), Berkeley, CA (United States)</creatorcontrib><description>The correlation between the structural phase transition (SPT) and oxygen vacancy in SrRuO3 (SRO) thin films was investigated by in situ X-ray diffraction (XRD) and ambient pressure X-ray photoelectron spectroscopy (AP-XPS). In situ XRD shows that the SPT occurs from a monoclinic SRO phase to a tetragonal SRO phase near ∼200 °C, regardless of the pressure environment. On the other hand, significant core level shifts in both the Ru and Sr photoemission spectra are found under ultrahigh vacuum, but not under the oxygen pressure environment. The directions and behavior of the core level shift of Ru and Sr are attributed to the formation of oxygen vacancy across the SPT temperature of SRO. The analysis of in situ XRD and AP-XPS results provides an evidence for the formation of metastable surface oxide possibly due to the migration of internal oxygen atoms across the SPT temperature, indicating the close relationship between oxygen vacancy and SPT in SRO thin films.</description><identifier>ISSN: 0021-9606</identifier><identifier>EISSN: 1089-7690</identifier><identifier>DOI: 10.1063/1.5134653</identifier><identifier>CODEN: JCPSA6</identifier><language>eng</language><publisher>Melville: American Institute of Physics</publisher><subject>Chemical properties ; crystal structure ; crystallographic defects ; electronic band structure ; MATERIALS SCIENCE ; Organic chemistry ; Oxygen atoms ; phase traditions ; Phase transitions ; Photoelectric emission ; Photoelectrons ; Pressure ; Spectrum analysis ; Strontium titanates ; Thin films ; ultra-high vacuum ; Ultrahigh vacuum ; Vacancies ; X ray photoelectron spectroscopy ; X-ray diffraction</subject><ispartof>The Journal of chemical physics, 2020-01, Vol.152 (3), p.034704-034704</ispartof><rights>Author(s)</rights><rights>2020 Author(s). All article content, except where otherwise noted, is licensed under a Creative Commons Attribution (CC BY) license (http://creativecommons.org/licenses/by/4.0/).</rights><lds50>peer_reviewed</lds50><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c422t-c2832c2390fb51a8ee2d1bc276fe7869e632b5b638ccba7475442160d11677df3</citedby><cites>FETCH-LOGICAL-c422t-c2832c2390fb51a8ee2d1bc276fe7869e632b5b638ccba7475442160d11677df3</cites><orcidid>0000-0002-8525-3298 ; 0000-0002-7120-7207 ; 0000000271207207 ; 0000000285253298</orcidid></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://pubs.aip.org/jcp/article-lookup/doi/10.1063/1.5134653$$EHTML$$P50$$Gscitation$$Hfree_for_read</linktohtml><link.rule.ids>230,314,776,780,790,881,4498,27901,27902,76126</link.rule.ids><backlink>$$Uhttps://www.osti.gov/servlets/purl/1760195$$D View this record in Osti.gov$$Hfree_for_read</backlink></links><search><creatorcontrib>Kim, Dongwoo</creatorcontrib><creatorcontrib>Lim, Hojoon</creatorcontrib><creatorcontrib>Ha, Sung Soo</creatorcontrib><creatorcontrib>Seo, Okkyun</creatorcontrib><creatorcontrib>Lee, Sung Su</creatorcontrib><creatorcontrib>Kim, Jinwoo</creatorcontrib><creatorcontrib>Kim, Ki-jeong</creatorcontrib><creatorcontrib>Perez Ramirez, Lucia</creatorcontrib><creatorcontrib>Gallet, Jean-Jacques</creatorcontrib><creatorcontrib>Bournel, Fabrice</creatorcontrib><creatorcontrib>Jo, Ji Young</creatorcontrib><creatorcontrib>Nemsak, Slavomir</creatorcontrib><creatorcontrib>Noh, Do Young</creatorcontrib><creatorcontrib>Mun, Bongjin Simon</creatorcontrib><creatorcontrib>Lawrence Berkeley National Lab. (LBNL), Berkeley, CA (United States)</creatorcontrib><title>Correlation between structural phase transition and surface chemical properties of thin film SrRuO3/SrTiO3 (001)</title><title>The Journal of chemical physics</title><description>The correlation between the structural phase transition (SPT) and oxygen vacancy in SrRuO3 (SRO) thin films was investigated by in situ X-ray diffraction (XRD) and ambient pressure X-ray photoelectron spectroscopy (AP-XPS). In situ XRD shows that the SPT occurs from a monoclinic SRO phase to a tetragonal SRO phase near ∼200 °C, regardless of the pressure environment. On the other hand, significant core level shifts in both the Ru and Sr photoemission spectra are found under ultrahigh vacuum, but not under the oxygen pressure environment. The directions and behavior of the core level shift of Ru and Sr are attributed to the formation of oxygen vacancy across the SPT temperature of SRO. The analysis of in situ XRD and AP-XPS results provides an evidence for the formation of metastable surface oxide possibly due to the migration of internal oxygen atoms across the SPT temperature, indicating the close relationship between oxygen vacancy and SPT in SRO thin films.</description><subject>Chemical properties</subject><subject>crystal structure</subject><subject>crystallographic defects</subject><subject>electronic band structure</subject><subject>MATERIALS SCIENCE</subject><subject>Organic chemistry</subject><subject>Oxygen atoms</subject><subject>phase traditions</subject><subject>Phase transitions</subject><subject>Photoelectric emission</subject><subject>Photoelectrons</subject><subject>Pressure</subject><subject>Spectrum analysis</subject><subject>Strontium titanates</subject><subject>Thin films</subject><subject>ultra-high vacuum</subject><subject>Ultrahigh vacuum</subject><subject>Vacancies</subject><subject>X ray photoelectron spectroscopy</subject><subject>X-ray diffraction</subject><issn>0021-9606</issn><issn>1089-7690</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2020</creationdate><recordtype>article</recordtype><recordid>eNqd0U1rGzEQBmBRGqjr9NB_INpLHNhEXyvtHovJFwQMiXMWWnkWK6ylraRNyL-PbAcKPeY0l4eZeXkR-knJBSWSX9KLmnIha_4FzShp2krJlnxFM0IYrVpJ5Df0PaVnQghVTMzQuAwxwmCyCx53kF8BPE45TjZP0Qx43JoEOEfjkzsY4zc4TbE3FrDdws7ZvYphhJgdJBx6nLfO494NO_wYH6YVv3yMa7fi-KwcXZyik94MCX58zDl6ur5aL2-r-9XN3fLPfWUFY7myrOHMMt6SvqupaQDYhnaWKdmDamQLkrOu7iRvrO2MEqoWglFJNpRKpTY9n6Nfx70hZaeTdRns1gbvwWZNlSS0rQs6O6IS4O8EKeudSxaGwXgIU9KMl61MKKkK_f0ffQ5T9CVCUbzlDRGtKGpxVDaGlCL0eoxuZ-KbpkTvC9JUfxRU7PnR7p87FPA5_BLiP6jHkv0dWAKcxA</recordid><startdate>20200121</startdate><enddate>20200121</enddate><creator>Kim, Dongwoo</creator><creator>Lim, Hojoon</creator><creator>Ha, Sung Soo</creator><creator>Seo, Okkyun</creator><creator>Lee, Sung Su</creator><creator>Kim, Jinwoo</creator><creator>Kim, Ki-jeong</creator><creator>Perez Ramirez, Lucia</creator><creator>Gallet, Jean-Jacques</creator><creator>Bournel, Fabrice</creator><creator>Jo, Ji Young</creator><creator>Nemsak, Slavomir</creator><creator>Noh, Do Young</creator><creator>Mun, Bongjin Simon</creator><general>American Institute of Physics</general><general>American Institute of Physics (AIP)</general><scope>AJDQP</scope><scope>AAYXX</scope><scope>CITATION</scope><scope>8FD</scope><scope>H8D</scope><scope>L7M</scope><scope>7X8</scope><scope>OIOZB</scope><scope>OTOTI</scope><orcidid>https://orcid.org/0000-0002-8525-3298</orcidid><orcidid>https://orcid.org/0000-0002-7120-7207</orcidid><orcidid>https://orcid.org/0000000271207207</orcidid><orcidid>https://orcid.org/0000000285253298</orcidid></search><sort><creationdate>20200121</creationdate><title>Correlation between structural phase transition and surface chemical properties of thin film SrRuO3/SrTiO3 (001)</title><author>Kim, Dongwoo ; Lim, Hojoon ; Ha, Sung Soo ; Seo, Okkyun ; Lee, Sung Su ; Kim, Jinwoo ; Kim, Ki-jeong ; Perez Ramirez, Lucia ; Gallet, Jean-Jacques ; Bournel, Fabrice ; Jo, Ji Young ; Nemsak, Slavomir ; Noh, Do Young ; Mun, Bongjin Simon</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c422t-c2832c2390fb51a8ee2d1bc276fe7869e632b5b638ccba7475442160d11677df3</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2020</creationdate><topic>Chemical properties</topic><topic>crystal structure</topic><topic>crystallographic defects</topic><topic>electronic band structure</topic><topic>MATERIALS SCIENCE</topic><topic>Organic chemistry</topic><topic>Oxygen atoms</topic><topic>phase traditions</topic><topic>Phase transitions</topic><topic>Photoelectric emission</topic><topic>Photoelectrons</topic><topic>Pressure</topic><topic>Spectrum analysis</topic><topic>Strontium titanates</topic><topic>Thin films</topic><topic>ultra-high vacuum</topic><topic>Ultrahigh vacuum</topic><topic>Vacancies</topic><topic>X ray photoelectron spectroscopy</topic><topic>X-ray diffraction</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Kim, Dongwoo</creatorcontrib><creatorcontrib>Lim, Hojoon</creatorcontrib><creatorcontrib>Ha, Sung Soo</creatorcontrib><creatorcontrib>Seo, Okkyun</creatorcontrib><creatorcontrib>Lee, Sung Su</creatorcontrib><creatorcontrib>Kim, Jinwoo</creatorcontrib><creatorcontrib>Kim, Ki-jeong</creatorcontrib><creatorcontrib>Perez Ramirez, Lucia</creatorcontrib><creatorcontrib>Gallet, Jean-Jacques</creatorcontrib><creatorcontrib>Bournel, Fabrice</creatorcontrib><creatorcontrib>Jo, Ji Young</creatorcontrib><creatorcontrib>Nemsak, Slavomir</creatorcontrib><creatorcontrib>Noh, Do Young</creatorcontrib><creatorcontrib>Mun, Bongjin Simon</creatorcontrib><creatorcontrib>Lawrence Berkeley National Lab. 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(LBNL), Berkeley, CA (United States)</aucorp><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Correlation between structural phase transition and surface chemical properties of thin film SrRuO3/SrTiO3 (001)</atitle><jtitle>The Journal of chemical physics</jtitle><date>2020-01-21</date><risdate>2020</risdate><volume>152</volume><issue>3</issue><spage>034704</spage><epage>034704</epage><pages>034704-034704</pages><issn>0021-9606</issn><eissn>1089-7690</eissn><coden>JCPSA6</coden><abstract>The correlation between the structural phase transition (SPT) and oxygen vacancy in SrRuO3 (SRO) thin films was investigated by in situ X-ray diffraction (XRD) and ambient pressure X-ray photoelectron spectroscopy (AP-XPS). In situ XRD shows that the SPT occurs from a monoclinic SRO phase to a tetragonal SRO phase near ∼200 °C, regardless of the pressure environment. On the other hand, significant core level shifts in both the Ru and Sr photoemission spectra are found under ultrahigh vacuum, but not under the oxygen pressure environment. The directions and behavior of the core level shift of Ru and Sr are attributed to the formation of oxygen vacancy across the SPT temperature of SRO. The analysis of in situ XRD and AP-XPS results provides an evidence for the formation of metastable surface oxide possibly due to the migration of internal oxygen atoms across the SPT temperature, indicating the close relationship between oxygen vacancy and SPT in SRO thin films.</abstract><cop>Melville</cop><pub>American Institute of Physics</pub><doi>10.1063/1.5134653</doi><tpages>7</tpages><orcidid>https://orcid.org/0000-0002-8525-3298</orcidid><orcidid>https://orcid.org/0000-0002-7120-7207</orcidid><orcidid>https://orcid.org/0000000271207207</orcidid><orcidid>https://orcid.org/0000000285253298</orcidid><oa>free_for_read</oa></addata></record> |
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| subjects | Chemical properties crystal structure crystallographic defects electronic band structure MATERIALS SCIENCE Organic chemistry Oxygen atoms phase traditions Phase transitions Photoelectric emission Photoelectrons Pressure Spectrum analysis Strontium titanates Thin films ultra-high vacuum Ultrahigh vacuum Vacancies X ray photoelectron spectroscopy X-ray diffraction |
| title | Correlation between structural phase transition and surface chemical properties of thin film SrRuO3/SrTiO3 (001) |
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