Substrate damage and incorporation of sapphire into barium hexaferrite films deposited by aerosol deposition

Barium Hexaferrite (BaM) grown on sapphire substrate by aerosol deposition is investigated in a subtractive wedge series to determine the extent of energetic substrate damage and indentation. Energy dispersive x‐ray spectroscopy (EDS) mapping reveals Al2O3 particulates ejected from the substrate sur...

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Veröffentlicht in:	Journal of the American Ceramic Society 2020-03, Vol.103 (3), p.1542-1548
Hauptverfasser:	Ranjit, Smriti, Law, Ka Ming, Budhathoki, Sujan, Allred, Jared M., Rosenberg, Richard A., Park, Dong‐Soo, Johnson, Scooter, Hauser, Adam J.
Format:	Artikel
Sprache:	eng
Schlagworte:	aerosol deposition Aluminum oxide Barium hexaferrite Damage Deposition Diffraction patterns electron microscopy Indentation Magnetic moments Magnetic properties Mapping Particulates Reduction Sapphire Substrates substrate deformation Thickness thin films Wedges X‐ray absorption spectroscopy
Online-Zugang:	Volltext
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