The grain‐boundary resistance of CeO2 ceramics: A combined microscopy‐spectroscopy‐simulation study of a dilute solution

Weakly acceptor‐doped ceria ceramics were characterized structurally and compositionally with advanced transmission electron microscopy (TEM) techniques and electrically with electrochemical impedance spectroscopy (EIS). The grain boundaries studied with TEM were found to be free of second phases. T...

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Veröffentlicht in:	Journal of the American Ceramic Society 2020-03, Vol.103 (3), p.1755-1764
Hauptverfasser:	Parras, Jana P., Cao, Chen, Ma, Zheng, Mücke, Robert, Jin, Lei, Dunin‐Borkowski, Rafal, Guillon, Olivier, De Souza, Roger A.
Format:	Artikel
Sprache:	eng
Schlagworte:	Cations Ceramics Cerium oxides Charge distribution Computer simulation Current carriers Electric arcs Electrochemical impedance spectroscopy Grain boundaries Microscopy Simulation Spectroscopic analysis Spectrum analysis Transmission electron microscopy Vacancies
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