Electromagnetic Pattern Extraction and Grouping for Near-Field Scanning of Integrated Circuits by PCA and K-Means Approaches
Electromagnetic patterns in near field scanning usually give important information about the source inside an device under test. In this paper, we develop a postprocessing technique, including standard-deviation-based method, principal component analysis, and K-means method, so that the electromagne...
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| Veröffentlicht in: | IEEE transactions on electromagnetic compatibility 2019-12, Vol.61 (6), p.1811-1822 |
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| container_issue | 6 |
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| container_title | IEEE transactions on electromagnetic compatibility |
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| creator | Hong, Ziyang Fang, Wenxiao En, Yunfei Luo, Chengyang Shao, Weiheng Wang, Lei He, Zhiyuan Shao, E. |
| description | Electromagnetic patterns in near field scanning usually give important information about the source inside an device under test. In this paper, we develop a postprocessing technique, including standard-deviation-based method, principal component analysis, and K-means method, so that the electromagnetic patterns in near field scanning can be extracted fast and grouped automatically and efficiently. The postprocessing techniques are applied to experimental near-field scanning of ICs, such as a microcontroller unit (MCU) and a field programmable gate array (FPGA). The grouping on the electromagnetic patterns of the MCU is in good agreement with the published grouping result, and the grouping on the electromagnetic patterns of the FPGA can find out the additional cluster responsible for additional circuit. |
| doi_str_mv | 10.1109/TEMC.2018.2890026 |
| format | Article |
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In this paper, we develop a postprocessing technique, including standard-deviation-based method, principal component analysis, and K-means method, so that the electromagnetic patterns in near field scanning can be extracted fast and grouped automatically and efficiently. The postprocessing techniques are applied to experimental near-field scanning of ICs, such as a microcontroller unit (MCU) and a field programmable gate array (FPGA). 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| subjects | <named-content xmlns:xlink="http://www.w3.org/1999/xlink" xmlns:ali="http://www.niso.org/schemas/ali/1.0/" xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xsi="http://www.w3.org/2001/XMLSchema-instance" content-type="math" xlink:type="simple"> <inline-formula> <tex-math notation="LaTeX"> K</tex-math> </inline-formula> </named-content>-means Eigenvalues and eigenfunctions Electromagnetic interference Electromagnetic pattern Electromagnetics Feature extraction Field programmable gate arrays Integrated circuits Microcontrollers near-field scanning Principal component analysis principal component analysis (PCA) Principal components analysis Scanning |
| title | Electromagnetic Pattern Extraction and Grouping for Near-Field Scanning of Integrated Circuits by PCA and K-Means Approaches |
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