Effects of intergranular capacitance and resistance dispersion on polycrystalline semiconductor impedance

In the present work we focused on the effects, often disregarded, of the intergranular barrier fluctuations on the total impedance of polycrystalline structures. These fluctuations come from the discreteness nature and random distribution of ionized donors at the polycrystal, which are responsible o...

Ausführliche Beschreibung

Gespeichert in:
Bibliographische Detailangaben
Veröffentlicht in:Solid state ionics 2019-12, Vol.343, p.115076, Article 115076
Hauptverfasser: Buono, C., Uriz, A.J., Aldao, C.M.
Format: Artikel
Sprache:eng
Schlagworte:
Online-Zugang:Volltext
Tags: Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
container_end_page
container_issue
container_start_page 115076
container_title Solid state ionics
container_volume 343
creator Buono, C.
Uriz, A.J.
Aldao, C.M.
description In the present work we focused on the effects, often disregarded, of the intergranular barrier fluctuations on the total impedance of polycrystalline structures. These fluctuations come from the discreteness nature and random distribution of ionized donors at the polycrystal, which are responsible of forming the intergranular barriers. Firstly, we used a numerical model that takes into account the point character of the involved donors and found that resistances and capacitances present distributions that become narrower with the grain size. Secondly, we built a bricklayer model with capacitances and resistances taken from the found distributions and calculated the total impedance, focusing on tin oxide as an example. We found the total polycrystal capacitance and resistance dependence on the specific dispersions of intergranular capacitances and resistances. •We studied the effect of intergranular barrier fluctuations in the polycrystalline semiconductor impedance.•We found the total polycrystal capacitance and resistance as a function of intergranular capacitances and resistances.•We found that it is important to take into account dispersions in the brick layer model for polycrystals with small grains.
doi_str_mv 10.1016/j.ssi.2019.115076
format Article
fullrecord <record><control><sourceid>proquest_cross</sourceid><recordid>TN_cdi_proquest_journals_2330022566</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><els_id>S016727381930801X</els_id><sourcerecordid>2330022566</sourcerecordid><originalsourceid>FETCH-LOGICAL-c325t-f7034714b1b59fbc98649337ed6c4dfab10564ee2fb0c2a3627d64126064ee323</originalsourceid><addsrcrecordid>eNp9kE1LxDAQhoMouK7-AG8Bz13z0SYtnmTxCxa86DmkyURSuk1NWmH_vSn1LAwMM_O-M8mD0C0lO0qouO92KfkdI7TZUVoRKc7QhtaSFVLUzTnaZI0smOT1JbpKqSOECF6LDfJPzoGZEg4O-2GC-BX1MPc6YqNHbfykBwNYDxZHSD6tpfVphJh8GHCOMfQnE0951vd-AJzg6E0Y7GymELE_jmAX1zW6cLpPcPOXt-jz-elj_1oc3l_e9o-HwnBWTYWThJeSli1tq8a1pqlF2XAuwQpTWqdbSipRAjDXEsM0F0xaUVImyNLljG_R3bp3jOF7hjSpLsxxyCcV45wQxiohsoquKhNDShGcGqM_6nhSlKiFqOpUJqoWomolmj0Pqwfy8388RJWMh_w162NmqGzw_7h_Af2NgGY</addsrcrecordid><sourcetype>Aggregation Database</sourcetype><iscdi>true</iscdi><recordtype>article</recordtype><pqid>2330022566</pqid></control><display><type>article</type><title>Effects of intergranular capacitance and resistance dispersion on polycrystalline semiconductor impedance</title><source>Elsevier ScienceDirect Journals Complete</source><creator>Buono, C. ; Uriz, A.J. ; Aldao, C.M.</creator><creatorcontrib>Buono, C. ; Uriz, A.J. ; Aldao, C.M.</creatorcontrib><description>In the present work we focused on the effects, often disregarded, of the intergranular barrier fluctuations on the total impedance of polycrystalline structures. These fluctuations come from the discreteness nature and random distribution of ionized donors at the polycrystal, which are responsible of forming the intergranular barriers. Firstly, we used a numerical model that takes into account the point character of the involved donors and found that resistances and capacitances present distributions that become narrower with the grain size. Secondly, we built a bricklayer model with capacitances and resistances taken from the found distributions and calculated the total impedance, focusing on tin oxide as an example. We found the total polycrystal capacitance and resistance dependence on the specific dispersions of intergranular capacitances and resistances. •We studied the effect of intergranular barrier fluctuations in the polycrystalline semiconductor impedance.•We found the total polycrystal capacitance and resistance as a function of intergranular capacitances and resistances.•We found that it is important to take into account dispersions in the brick layer model for polycrystals with small grains.</description><identifier>ISSN: 0167-2738</identifier><identifier>EISSN: 1872-7689</identifier><identifier>DOI: 10.1016/j.ssi.2019.115076</identifier><language>eng</language><publisher>Amsterdam: Elsevier B.V</publisher><subject>Bricklayer model ; Capacitance ; Dispersion ; Effects ; Electrical conduction ; Grain size ; Impedance ; Intergranular barrier fluctuations ; Numerical models ; Polycrystalline semiconductors ; Polycrystals ; Tin oxides ; Variations</subject><ispartof>Solid state ionics, 2019-12, Vol.343, p.115076, Article 115076</ispartof><rights>2019 Elsevier B.V.</rights><rights>Copyright Elsevier BV Dec 15, 2019</rights><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c325t-f7034714b1b59fbc98649337ed6c4dfab10564ee2fb0c2a3627d64126064ee323</citedby><cites>FETCH-LOGICAL-c325t-f7034714b1b59fbc98649337ed6c4dfab10564ee2fb0c2a3627d64126064ee323</cites></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://dx.doi.org/10.1016/j.ssi.2019.115076$$EHTML$$P50$$Gelsevier$$H</linktohtml><link.rule.ids>314,780,784,3550,27924,27925,45995</link.rule.ids></links><search><creatorcontrib>Buono, C.</creatorcontrib><creatorcontrib>Uriz, A.J.</creatorcontrib><creatorcontrib>Aldao, C.M.</creatorcontrib><title>Effects of intergranular capacitance and resistance dispersion on polycrystalline semiconductor impedance</title><title>Solid state ionics</title><description>In the present work we focused on the effects, often disregarded, of the intergranular barrier fluctuations on the total impedance of polycrystalline structures. These fluctuations come from the discreteness nature and random distribution of ionized donors at the polycrystal, which are responsible of forming the intergranular barriers. Firstly, we used a numerical model that takes into account the point character of the involved donors and found that resistances and capacitances present distributions that become narrower with the grain size. Secondly, we built a bricklayer model with capacitances and resistances taken from the found distributions and calculated the total impedance, focusing on tin oxide as an example. We found the total polycrystal capacitance and resistance dependence on the specific dispersions of intergranular capacitances and resistances. •We studied the effect of intergranular barrier fluctuations in the polycrystalline semiconductor impedance.•We found the total polycrystal capacitance and resistance as a function of intergranular capacitances and resistances.•We found that it is important to take into account dispersions in the brick layer model for polycrystals with small grains.</description><subject>Bricklayer model</subject><subject>Capacitance</subject><subject>Dispersion</subject><subject>Effects</subject><subject>Electrical conduction</subject><subject>Grain size</subject><subject>Impedance</subject><subject>Intergranular barrier fluctuations</subject><subject>Numerical models</subject><subject>Polycrystalline semiconductors</subject><subject>Polycrystals</subject><subject>Tin oxides</subject><subject>Variations</subject><issn>0167-2738</issn><issn>1872-7689</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2019</creationdate><recordtype>article</recordtype><recordid>eNp9kE1LxDAQhoMouK7-AG8Bz13z0SYtnmTxCxa86DmkyURSuk1NWmH_vSn1LAwMM_O-M8mD0C0lO0qouO92KfkdI7TZUVoRKc7QhtaSFVLUzTnaZI0smOT1JbpKqSOECF6LDfJPzoGZEg4O-2GC-BX1MPc6YqNHbfykBwNYDxZHSD6tpfVphJh8GHCOMfQnE0951vd-AJzg6E0Y7GymELE_jmAX1zW6cLpPcPOXt-jz-elj_1oc3l_e9o-HwnBWTYWThJeSli1tq8a1pqlF2XAuwQpTWqdbSipRAjDXEsM0F0xaUVImyNLljG_R3bp3jOF7hjSpLsxxyCcV45wQxiohsoquKhNDShGcGqM_6nhSlKiFqOpUJqoWomolmj0Pqwfy8388RJWMh_w162NmqGzw_7h_Af2NgGY</recordid><startdate>20191215</startdate><enddate>20191215</enddate><creator>Buono, C.</creator><creator>Uriz, A.J.</creator><creator>Aldao, C.M.</creator><general>Elsevier B.V</general><general>Elsevier BV</general><scope>AAYXX</scope><scope>CITATION</scope><scope>7U5</scope><scope>8FD</scope><scope>L7M</scope></search><sort><creationdate>20191215</creationdate><title>Effects of intergranular capacitance and resistance dispersion on polycrystalline semiconductor impedance</title><author>Buono, C. ; Uriz, A.J. ; Aldao, C.M.</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c325t-f7034714b1b59fbc98649337ed6c4dfab10564ee2fb0c2a3627d64126064ee323</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2019</creationdate><topic>Bricklayer model</topic><topic>Capacitance</topic><topic>Dispersion</topic><topic>Effects</topic><topic>Electrical conduction</topic><topic>Grain size</topic><topic>Impedance</topic><topic>Intergranular barrier fluctuations</topic><topic>Numerical models</topic><topic>Polycrystalline semiconductors</topic><topic>Polycrystals</topic><topic>Tin oxides</topic><topic>Variations</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Buono, C.</creatorcontrib><creatorcontrib>Uriz, A.J.</creatorcontrib><creatorcontrib>Aldao, C.M.</creatorcontrib><collection>CrossRef</collection><collection>Solid State and Superconductivity Abstracts</collection><collection>Technology Research Database</collection><collection>Advanced Technologies Database with Aerospace</collection><jtitle>Solid state ionics</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Buono, C.</au><au>Uriz, A.J.</au><au>Aldao, C.M.</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Effects of intergranular capacitance and resistance dispersion on polycrystalline semiconductor impedance</atitle><jtitle>Solid state ionics</jtitle><date>2019-12-15</date><risdate>2019</risdate><volume>343</volume><spage>115076</spage><pages>115076-</pages><artnum>115076</artnum><issn>0167-2738</issn><eissn>1872-7689</eissn><abstract>In the present work we focused on the effects, often disregarded, of the intergranular barrier fluctuations on the total impedance of polycrystalline structures. These fluctuations come from the discreteness nature and random distribution of ionized donors at the polycrystal, which are responsible of forming the intergranular barriers. Firstly, we used a numerical model that takes into account the point character of the involved donors and found that resistances and capacitances present distributions that become narrower with the grain size. Secondly, we built a bricklayer model with capacitances and resistances taken from the found distributions and calculated the total impedance, focusing on tin oxide as an example. We found the total polycrystal capacitance and resistance dependence on the specific dispersions of intergranular capacitances and resistances. •We studied the effect of intergranular barrier fluctuations in the polycrystalline semiconductor impedance.•We found the total polycrystal capacitance and resistance as a function of intergranular capacitances and resistances.•We found that it is important to take into account dispersions in the brick layer model for polycrystals with small grains.</abstract><cop>Amsterdam</cop><pub>Elsevier B.V</pub><doi>10.1016/j.ssi.2019.115076</doi></addata></record>
fulltext fulltext
identifier ISSN: 0167-2738
ispartof Solid state ionics, 2019-12, Vol.343, p.115076, Article 115076
issn 0167-2738
1872-7689
language eng
recordid cdi_proquest_journals_2330022566
source Elsevier ScienceDirect Journals Complete
subjects Bricklayer model
Capacitance
Dispersion
Effects
Electrical conduction
Grain size
Impedance
Intergranular barrier fluctuations
Numerical models
Polycrystalline semiconductors
Polycrystals
Tin oxides
Variations
title Effects of intergranular capacitance and resistance dispersion on polycrystalline semiconductor impedance
url https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-01-05T07%3A36%3A19IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-proquest_cross&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.genre=article&rft.atitle=Effects%20of%20intergranular%20capacitance%20and%20resistance%20dispersion%20on%20polycrystalline%20semiconductor%20impedance&rft.jtitle=Solid%20state%20ionics&rft.au=Buono,%20C.&rft.date=2019-12-15&rft.volume=343&rft.spage=115076&rft.pages=115076-&rft.artnum=115076&rft.issn=0167-2738&rft.eissn=1872-7689&rft_id=info:doi/10.1016/j.ssi.2019.115076&rft_dat=%3Cproquest_cross%3E2330022566%3C/proquest_cross%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_pqid=2330022566&rft_id=info:pmid/&rft_els_id=S016727381930801X&rfr_iscdi=true