Effects of intergranular capacitance and resistance dispersion on polycrystalline semiconductor impedance
In the present work we focused on the effects, often disregarded, of the intergranular barrier fluctuations on the total impedance of polycrystalline structures. These fluctuations come from the discreteness nature and random distribution of ionized donors at the polycrystal, which are responsible o...
Gespeichert in:
Veröffentlicht in: | Solid state ionics 2019-12, Vol.343, p.115076, Article 115076 |
---|---|
Hauptverfasser: | , , |
Format: | Artikel |
Sprache: | eng |
Schlagworte: | |
Online-Zugang: | Volltext |
Tags: |
Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
|
container_end_page | |
---|---|
container_issue | |
container_start_page | 115076 |
container_title | Solid state ionics |
container_volume | 343 |
creator | Buono, C. Uriz, A.J. Aldao, C.M. |
description | In the present work we focused on the effects, often disregarded, of the intergranular barrier fluctuations on the total impedance of polycrystalline structures. These fluctuations come from the discreteness nature and random distribution of ionized donors at the polycrystal, which are responsible of forming the intergranular barriers. Firstly, we used a numerical model that takes into account the point character of the involved donors and found that resistances and capacitances present distributions that become narrower with the grain size. Secondly, we built a bricklayer model with capacitances and resistances taken from the found distributions and calculated the total impedance, focusing on tin oxide as an example. We found the total polycrystal capacitance and resistance dependence on the specific dispersions of intergranular capacitances and resistances.
•We studied the effect of intergranular barrier fluctuations in the polycrystalline semiconductor impedance.•We found the total polycrystal capacitance and resistance as a function of intergranular capacitances and resistances.•We found that it is important to take into account dispersions in the brick layer model for polycrystals with small grains. |
doi_str_mv | 10.1016/j.ssi.2019.115076 |
format | Article |
fullrecord | <record><control><sourceid>proquest_cross</sourceid><recordid>TN_cdi_proquest_journals_2330022566</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><els_id>S016727381930801X</els_id><sourcerecordid>2330022566</sourcerecordid><originalsourceid>FETCH-LOGICAL-c325t-f7034714b1b59fbc98649337ed6c4dfab10564ee2fb0c2a3627d64126064ee323</originalsourceid><addsrcrecordid>eNp9kE1LxDAQhoMouK7-AG8Bz13z0SYtnmTxCxa86DmkyURSuk1NWmH_vSn1LAwMM_O-M8mD0C0lO0qouO92KfkdI7TZUVoRKc7QhtaSFVLUzTnaZI0smOT1JbpKqSOECF6LDfJPzoGZEg4O-2GC-BX1MPc6YqNHbfykBwNYDxZHSD6tpfVphJh8GHCOMfQnE0951vd-AJzg6E0Y7GymELE_jmAX1zW6cLpPcPOXt-jz-elj_1oc3l_e9o-HwnBWTYWThJeSli1tq8a1pqlF2XAuwQpTWqdbSipRAjDXEsM0F0xaUVImyNLljG_R3bp3jOF7hjSpLsxxyCcV45wQxiohsoquKhNDShGcGqM_6nhSlKiFqOpUJqoWomolmj0Pqwfy8388RJWMh_w162NmqGzw_7h_Af2NgGY</addsrcrecordid><sourcetype>Aggregation Database</sourcetype><iscdi>true</iscdi><recordtype>article</recordtype><pqid>2330022566</pqid></control><display><type>article</type><title>Effects of intergranular capacitance and resistance dispersion on polycrystalline semiconductor impedance</title><source>Elsevier ScienceDirect Journals Complete</source><creator>Buono, C. ; Uriz, A.J. ; Aldao, C.M.</creator><creatorcontrib>Buono, C. ; Uriz, A.J. ; Aldao, C.M.</creatorcontrib><description>In the present work we focused on the effects, often disregarded, of the intergranular barrier fluctuations on the total impedance of polycrystalline structures. These fluctuations come from the discreteness nature and random distribution of ionized donors at the polycrystal, which are responsible of forming the intergranular barriers. Firstly, we used a numerical model that takes into account the point character of the involved donors and found that resistances and capacitances present distributions that become narrower with the grain size. Secondly, we built a bricklayer model with capacitances and resistances taken from the found distributions and calculated the total impedance, focusing on tin oxide as an example. We found the total polycrystal capacitance and resistance dependence on the specific dispersions of intergranular capacitances and resistances.
•We studied the effect of intergranular barrier fluctuations in the polycrystalline semiconductor impedance.•We found the total polycrystal capacitance and resistance as a function of intergranular capacitances and resistances.•We found that it is important to take into account dispersions in the brick layer model for polycrystals with small grains.</description><identifier>ISSN: 0167-2738</identifier><identifier>EISSN: 1872-7689</identifier><identifier>DOI: 10.1016/j.ssi.2019.115076</identifier><language>eng</language><publisher>Amsterdam: Elsevier B.V</publisher><subject>Bricklayer model ; Capacitance ; Dispersion ; Effects ; Electrical conduction ; Grain size ; Impedance ; Intergranular barrier fluctuations ; Numerical models ; Polycrystalline semiconductors ; Polycrystals ; Tin oxides ; Variations</subject><ispartof>Solid state ionics, 2019-12, Vol.343, p.115076, Article 115076</ispartof><rights>2019 Elsevier B.V.</rights><rights>Copyright Elsevier BV Dec 15, 2019</rights><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c325t-f7034714b1b59fbc98649337ed6c4dfab10564ee2fb0c2a3627d64126064ee323</citedby><cites>FETCH-LOGICAL-c325t-f7034714b1b59fbc98649337ed6c4dfab10564ee2fb0c2a3627d64126064ee323</cites></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://dx.doi.org/10.1016/j.ssi.2019.115076$$EHTML$$P50$$Gelsevier$$H</linktohtml><link.rule.ids>314,780,784,3550,27924,27925,45995</link.rule.ids></links><search><creatorcontrib>Buono, C.</creatorcontrib><creatorcontrib>Uriz, A.J.</creatorcontrib><creatorcontrib>Aldao, C.M.</creatorcontrib><title>Effects of intergranular capacitance and resistance dispersion on polycrystalline semiconductor impedance</title><title>Solid state ionics</title><description>In the present work we focused on the effects, often disregarded, of the intergranular barrier fluctuations on the total impedance of polycrystalline structures. These fluctuations come from the discreteness nature and random distribution of ionized donors at the polycrystal, which are responsible of forming the intergranular barriers. Firstly, we used a numerical model that takes into account the point character of the involved donors and found that resistances and capacitances present distributions that become narrower with the grain size. Secondly, we built a bricklayer model with capacitances and resistances taken from the found distributions and calculated the total impedance, focusing on tin oxide as an example. We found the total polycrystal capacitance and resistance dependence on the specific dispersions of intergranular capacitances and resistances.
•We studied the effect of intergranular barrier fluctuations in the polycrystalline semiconductor impedance.•We found the total polycrystal capacitance and resistance as a function of intergranular capacitances and resistances.•We found that it is important to take into account dispersions in the brick layer model for polycrystals with small grains.</description><subject>Bricklayer model</subject><subject>Capacitance</subject><subject>Dispersion</subject><subject>Effects</subject><subject>Electrical conduction</subject><subject>Grain size</subject><subject>Impedance</subject><subject>Intergranular barrier fluctuations</subject><subject>Numerical models</subject><subject>Polycrystalline semiconductors</subject><subject>Polycrystals</subject><subject>Tin oxides</subject><subject>Variations</subject><issn>0167-2738</issn><issn>1872-7689</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2019</creationdate><recordtype>article</recordtype><recordid>eNp9kE1LxDAQhoMouK7-AG8Bz13z0SYtnmTxCxa86DmkyURSuk1NWmH_vSn1LAwMM_O-M8mD0C0lO0qouO92KfkdI7TZUVoRKc7QhtaSFVLUzTnaZI0smOT1JbpKqSOECF6LDfJPzoGZEg4O-2GC-BX1MPc6YqNHbfykBwNYDxZHSD6tpfVphJh8GHCOMfQnE0951vd-AJzg6E0Y7GymELE_jmAX1zW6cLpPcPOXt-jz-elj_1oc3l_e9o-HwnBWTYWThJeSli1tq8a1pqlF2XAuwQpTWqdbSipRAjDXEsM0F0xaUVImyNLljG_R3bp3jOF7hjSpLsxxyCcV45wQxiohsoquKhNDShGcGqM_6nhSlKiFqOpUJqoWomolmj0Pqwfy8388RJWMh_w162NmqGzw_7h_Af2NgGY</recordid><startdate>20191215</startdate><enddate>20191215</enddate><creator>Buono, C.</creator><creator>Uriz, A.J.</creator><creator>Aldao, C.M.</creator><general>Elsevier B.V</general><general>Elsevier BV</general><scope>AAYXX</scope><scope>CITATION</scope><scope>7U5</scope><scope>8FD</scope><scope>L7M</scope></search><sort><creationdate>20191215</creationdate><title>Effects of intergranular capacitance and resistance dispersion on polycrystalline semiconductor impedance</title><author>Buono, C. ; Uriz, A.J. ; Aldao, C.M.</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c325t-f7034714b1b59fbc98649337ed6c4dfab10564ee2fb0c2a3627d64126064ee323</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2019</creationdate><topic>Bricklayer model</topic><topic>Capacitance</topic><topic>Dispersion</topic><topic>Effects</topic><topic>Electrical conduction</topic><topic>Grain size</topic><topic>Impedance</topic><topic>Intergranular barrier fluctuations</topic><topic>Numerical models</topic><topic>Polycrystalline semiconductors</topic><topic>Polycrystals</topic><topic>Tin oxides</topic><topic>Variations</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Buono, C.</creatorcontrib><creatorcontrib>Uriz, A.J.</creatorcontrib><creatorcontrib>Aldao, C.M.</creatorcontrib><collection>CrossRef</collection><collection>Solid State and Superconductivity Abstracts</collection><collection>Technology Research Database</collection><collection>Advanced Technologies Database with Aerospace</collection><jtitle>Solid state ionics</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Buono, C.</au><au>Uriz, A.J.</au><au>Aldao, C.M.</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Effects of intergranular capacitance and resistance dispersion on polycrystalline semiconductor impedance</atitle><jtitle>Solid state ionics</jtitle><date>2019-12-15</date><risdate>2019</risdate><volume>343</volume><spage>115076</spage><pages>115076-</pages><artnum>115076</artnum><issn>0167-2738</issn><eissn>1872-7689</eissn><abstract>In the present work we focused on the effects, often disregarded, of the intergranular barrier fluctuations on the total impedance of polycrystalline structures. These fluctuations come from the discreteness nature and random distribution of ionized donors at the polycrystal, which are responsible of forming the intergranular barriers. Firstly, we used a numerical model that takes into account the point character of the involved donors and found that resistances and capacitances present distributions that become narrower with the grain size. Secondly, we built a bricklayer model with capacitances and resistances taken from the found distributions and calculated the total impedance, focusing on tin oxide as an example. We found the total polycrystal capacitance and resistance dependence on the specific dispersions of intergranular capacitances and resistances.
•We studied the effect of intergranular barrier fluctuations in the polycrystalline semiconductor impedance.•We found the total polycrystal capacitance and resistance as a function of intergranular capacitances and resistances.•We found that it is important to take into account dispersions in the brick layer model for polycrystals with small grains.</abstract><cop>Amsterdam</cop><pub>Elsevier B.V</pub><doi>10.1016/j.ssi.2019.115076</doi></addata></record> |
fulltext | fulltext |
identifier | ISSN: 0167-2738 |
ispartof | Solid state ionics, 2019-12, Vol.343, p.115076, Article 115076 |
issn | 0167-2738 1872-7689 |
language | eng |
recordid | cdi_proquest_journals_2330022566 |
source | Elsevier ScienceDirect Journals Complete |
subjects | Bricklayer model Capacitance Dispersion Effects Electrical conduction Grain size Impedance Intergranular barrier fluctuations Numerical models Polycrystalline semiconductors Polycrystals Tin oxides Variations |
title | Effects of intergranular capacitance and resistance dispersion on polycrystalline semiconductor impedance |
url | https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-01-05T07%3A36%3A19IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-proquest_cross&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.genre=article&rft.atitle=Effects%20of%20intergranular%20capacitance%20and%20resistance%20dispersion%20on%20polycrystalline%20semiconductor%20impedance&rft.jtitle=Solid%20state%20ionics&rft.au=Buono,%20C.&rft.date=2019-12-15&rft.volume=343&rft.spage=115076&rft.pages=115076-&rft.artnum=115076&rft.issn=0167-2738&rft.eissn=1872-7689&rft_id=info:doi/10.1016/j.ssi.2019.115076&rft_dat=%3Cproquest_cross%3E2330022566%3C/proquest_cross%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_pqid=2330022566&rft_id=info:pmid/&rft_els_id=S016727381930801X&rfr_iscdi=true |