High‐recoverable energy‐storage density and dielectric tunability in Eu3+‐doped NBT‐xSTO binary solid solution films

The Eu3+‐doped (1 − x)Na0.5Bi0.5TiO3‐xSrTiO3 (Eu‐NBT‐xSTO) thin films were prepared on Pt/Ti/SiO2/Si substrates. Raman analysis reveals that the phase structure may undergo a phase evolution of rhombohedral → rhombohedral + tetragonal (morphotropic phase boundary) → tetragonal with increasing conten...

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Veröffentlicht in:	Journal of the American Ceramic Society 2020-02, Vol.103 (2), p.999-1009
Hauptverfasser:	Huang, Wenhua, Thatikonda, Santhosh Kumar, Ke, Yifu, Du, Xingru, Qin, Ni, Hao, Aize, Bao, Dinghua
Format:	Artikel
Sprache:	eng
Schlagworte:	binary solid solution Bismuth titanate Density Energy storage Europium Eu‐NBT‐xSTO thin films high phase transition diffuseness Phase transitions Raman spectroscopy recoverable energy storage density Silicon dioxide Silicon substrates Solid phases Solid solutions Thermal stability Thin films
Online-Zugang:	Volltext
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