Macroscopic Study on Current Transport Path in Front‐Side Contacts of Crystalline Silicon Solar Cells

Double rectangular transmission line model and contact‐end voltage measurement are used to study the variation in sheet resistance and current transfer length of the contact interface between the front‐side electrode and the emitter of crystalline silicon solar cells during metallization. The curren...

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Veröffentlicht in:	Physica status solidi. A, Applications and materials science Applications and materials science, 2019-12, Vol.216 (23), p.n/a
Hauptverfasser:	Xiong, Shenghu, Yuan, Xiao, Yang, Yunxia, Zhang, Jiefeng, Tong, Hua, Liu, Cui, Ye, Xiaojun, Li, Shengyong, Luo, Lan, Wang, Xianhao
Format:	Artikel
Sprache:	eng
Schlagworte:	contact resistivities contact-end voltages Crystal structure Crystallinity Crystallites Current distribution current transport paths Electrical measurement Electrical resistivity Electrodes Emitters Metallizing Photovoltaic cells Silicon Silicon substrates Silver solar cell metallization Solar cells transfer lengths Transmission lines
Online-Zugang:	Volltext
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