Electron paths and double-slit interference in the scanning gate microscopy

We analyze electron paths in a solid-state double-slit interferometer based on two-dimensional electron gas and mapping by scanning gate microscopy (SGM). A device with a quantum point source contact of a split exit and a drain contact for electron detection is considered. We study the SGM maps of s...

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Veröffentlicht in:	New journal of physics 2015-06, Vol.17 (6), p.63003
Hauptverfasser:	Kolasi ski, K, Szafran, B
Format:	Artikel
Sprache:	eng
Schlagworte:	Backscattering conductance maps double-slit interference Electron gas Electron trajectories Electrons Interference Mapping Microscopy Physics Resistance scanning gate microscopy
Online-Zugang:	Volltext
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