High-throughput screening of printed carbon nanotube circuits using radio frequency heating
In this paper, we demonstrate a high-throughput technique for screening carbon nanotube (CNT) circuits using radio frequency (RF) heating. It has become increasingly common to integrate carbon nanotubes into electronic devices because of their superior electrical and mechanical properties, and CNT-b...
Gespeichert in:
Veröffentlicht in: | Carbon (New York) 2019-11, Vol.152, p.444-450 |
---|---|
Hauptverfasser: | , , , |
Format: | Artikel |
Sprache: | eng |
Schlagworte: | |
Online-Zugang: | Volltext |
Tags: |
Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
|
container_end_page | 450 |
---|---|
container_issue | |
container_start_page | 444 |
container_title | Carbon (New York) |
container_volume | 152 |
creator | Hicks, Victoria K. Anas, Muhammad Porter, Erin B. Green, Micah J. |
description | In this paper, we demonstrate a high-throughput technique for screening carbon nanotube (CNT) circuits using radio frequency (RF) heating. It has become increasingly common to integrate carbon nanotubes into electronic devices because of their superior electrical and mechanical properties, and CNT-based circuits can be screen printed in mass quantities. Currently, the process for screening the quality of these circuits requires that the 2-point resistance of every circuit be measured individually; this metric is tedious, slow, and prone to false positives. We recently reported that CNTs experience heating when exposed to RF fields. Since the heating response is correlated with the conductivity of the printed structure, RF heating and thermal imaging allows us to quickly assess circuit quality. This new technique screens CNT circuits ten times faster than conventional methods, and it identifies faulty circuits more reliably. This process is not limited to CNT-based circuits, and it can be used to rapidly image any 2D structure made from an RF responsive material.
[Display omitted] |
doi_str_mv | 10.1016/j.carbon.2019.06.039 |
format | Article |
fullrecord | <record><control><sourceid>proquest_cross</sourceid><recordid>TN_cdi_proquest_journals_2311911943</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><els_id>S0008622319306037</els_id><sourcerecordid>2311911943</sourcerecordid><originalsourceid>FETCH-LOGICAL-c334t-d7efcc27caa0aeaf3a2ad1afc3eed4e872871f33450827093679b044150e97dc3</originalsourceid><addsrcrecordid>eNp9UE1LxDAQDaLguvoPPAQ8t-Zrm_YiyOIXLHjRk4eQTSfbFE3WJBX235ulnoWBYYb33sx7CF1TUlNCm9uxNjpug68ZoV1Nmprw7gQtaCt5xduOnqIFIaStGsb4ObpIaSyjaKlYoI9ntxuqPMQw7Yb9lHEyEcA7v8PB4n10PkOPZ3nstQ952gI2LprJ5YSndERG3buAbYTvCbw54AF0LvtLdGb1Z4Krv75E748Pb-vnavP69LK-31SGc5GrXoI1hkmjNdGgLddM91RbwwF6Aa1kraS2QFekZZJ0vJHdlghBVwQ62Ru-RDez7j6G8kHKagxT9OWkYpzSrpTgBSVmlIkhpQhWFXdfOh4UJeoYoxrV7FMdY1SkUSXGQrubaVAc_DiIKhlXXELvIpis-uD-F_gF2jF_HA</addsrcrecordid><sourcetype>Aggregation Database</sourcetype><iscdi>true</iscdi><recordtype>article</recordtype><pqid>2311911943</pqid></control><display><type>article</type><title>High-throughput screening of printed carbon nanotube circuits using radio frequency heating</title><source>Elsevier ScienceDirect Journals</source><creator>Hicks, Victoria K. ; Anas, Muhammad ; Porter, Erin B. ; Green, Micah J.</creator><creatorcontrib>Hicks, Victoria K. ; Anas, Muhammad ; Porter, Erin B. ; Green, Micah J.</creatorcontrib><description>In this paper, we demonstrate a high-throughput technique for screening carbon nanotube (CNT) circuits using radio frequency (RF) heating. It has become increasingly common to integrate carbon nanotubes into electronic devices because of their superior electrical and mechanical properties, and CNT-based circuits can be screen printed in mass quantities. Currently, the process for screening the quality of these circuits requires that the 2-point resistance of every circuit be measured individually; this metric is tedious, slow, and prone to false positives. We recently reported that CNTs experience heating when exposed to RF fields. Since the heating response is correlated with the conductivity of the printed structure, RF heating and thermal imaging allows us to quickly assess circuit quality. This new technique screens CNT circuits ten times faster than conventional methods, and it identifies faulty circuits more reliably. This process is not limited to CNT-based circuits, and it can be used to rapidly image any 2D structure made from an RF responsive material.
[Display omitted]</description><identifier>ISSN: 0008-6223</identifier><identifier>EISSN: 1873-3891</identifier><identifier>DOI: 10.1016/j.carbon.2019.06.039</identifier><language>eng</language><publisher>New York: Elsevier Ltd</publisher><subject>Carbon ; Carbon nanotube ; Carbon nanotubes ; Circuit ; Circuit reliability ; Electrical resistivity ; Electronic devices ; Faulty ; Heating ; Identification methods ; Mechanical properties ; Nanotubes ; Quality assessment ; Radio frequency ; Radio frequency heating ; Screening ; Thermal imaging</subject><ispartof>Carbon (New York), 2019-11, Vol.152, p.444-450</ispartof><rights>2019 Elsevier Ltd</rights><rights>Copyright Elsevier BV Nov 2019</rights><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c334t-d7efcc27caa0aeaf3a2ad1afc3eed4e872871f33450827093679b044150e97dc3</citedby><cites>FETCH-LOGICAL-c334t-d7efcc27caa0aeaf3a2ad1afc3eed4e872871f33450827093679b044150e97dc3</cites><orcidid>0000-0001-5691-0861</orcidid></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://www.sciencedirect.com/science/article/pii/S0008622319306037$$EHTML$$P50$$Gelsevier$$H</linktohtml><link.rule.ids>314,776,780,3537,27901,27902,65306</link.rule.ids></links><search><creatorcontrib>Hicks, Victoria K.</creatorcontrib><creatorcontrib>Anas, Muhammad</creatorcontrib><creatorcontrib>Porter, Erin B.</creatorcontrib><creatorcontrib>Green, Micah J.</creatorcontrib><title>High-throughput screening of printed carbon nanotube circuits using radio frequency heating</title><title>Carbon (New York)</title><description>In this paper, we demonstrate a high-throughput technique for screening carbon nanotube (CNT) circuits using radio frequency (RF) heating. It has become increasingly common to integrate carbon nanotubes into electronic devices because of their superior electrical and mechanical properties, and CNT-based circuits can be screen printed in mass quantities. Currently, the process for screening the quality of these circuits requires that the 2-point resistance of every circuit be measured individually; this metric is tedious, slow, and prone to false positives. We recently reported that CNTs experience heating when exposed to RF fields. Since the heating response is correlated with the conductivity of the printed structure, RF heating and thermal imaging allows us to quickly assess circuit quality. This new technique screens CNT circuits ten times faster than conventional methods, and it identifies faulty circuits more reliably. This process is not limited to CNT-based circuits, and it can be used to rapidly image any 2D structure made from an RF responsive material.
[Display omitted]</description><subject>Carbon</subject><subject>Carbon nanotube</subject><subject>Carbon nanotubes</subject><subject>Circuit</subject><subject>Circuit reliability</subject><subject>Electrical resistivity</subject><subject>Electronic devices</subject><subject>Faulty</subject><subject>Heating</subject><subject>Identification methods</subject><subject>Mechanical properties</subject><subject>Nanotubes</subject><subject>Quality assessment</subject><subject>Radio frequency</subject><subject>Radio frequency heating</subject><subject>Screening</subject><subject>Thermal imaging</subject><issn>0008-6223</issn><issn>1873-3891</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2019</creationdate><recordtype>article</recordtype><recordid>eNp9UE1LxDAQDaLguvoPPAQ8t-Zrm_YiyOIXLHjRk4eQTSfbFE3WJBX235ulnoWBYYb33sx7CF1TUlNCm9uxNjpug68ZoV1Nmprw7gQtaCt5xduOnqIFIaStGsb4ObpIaSyjaKlYoI9ntxuqPMQw7Yb9lHEyEcA7v8PB4n10PkOPZ3nstQ952gI2LprJ5YSndERG3buAbYTvCbw54AF0LvtLdGb1Z4Krv75E748Pb-vnavP69LK-31SGc5GrXoI1hkmjNdGgLddM91RbwwF6Aa1kraS2QFekZZJ0vJHdlghBVwQ62Ru-RDez7j6G8kHKagxT9OWkYpzSrpTgBSVmlIkhpQhWFXdfOh4UJeoYoxrV7FMdY1SkUSXGQrubaVAc_DiIKhlXXELvIpis-uD-F_gF2jF_HA</recordid><startdate>201911</startdate><enddate>201911</enddate><creator>Hicks, Victoria K.</creator><creator>Anas, Muhammad</creator><creator>Porter, Erin B.</creator><creator>Green, Micah J.</creator><general>Elsevier Ltd</general><general>Elsevier BV</general><scope>AAYXX</scope><scope>CITATION</scope><scope>7SR</scope><scope>8FD</scope><scope>JG9</scope><orcidid>https://orcid.org/0000-0001-5691-0861</orcidid></search><sort><creationdate>201911</creationdate><title>High-throughput screening of printed carbon nanotube circuits using radio frequency heating</title><author>Hicks, Victoria K. ; Anas, Muhammad ; Porter, Erin B. ; Green, Micah J.</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c334t-d7efcc27caa0aeaf3a2ad1afc3eed4e872871f33450827093679b044150e97dc3</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2019</creationdate><topic>Carbon</topic><topic>Carbon nanotube</topic><topic>Carbon nanotubes</topic><topic>Circuit</topic><topic>Circuit reliability</topic><topic>Electrical resistivity</topic><topic>Electronic devices</topic><topic>Faulty</topic><topic>Heating</topic><topic>Identification methods</topic><topic>Mechanical properties</topic><topic>Nanotubes</topic><topic>Quality assessment</topic><topic>Radio frequency</topic><topic>Radio frequency heating</topic><topic>Screening</topic><topic>Thermal imaging</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Hicks, Victoria K.</creatorcontrib><creatorcontrib>Anas, Muhammad</creatorcontrib><creatorcontrib>Porter, Erin B.</creatorcontrib><creatorcontrib>Green, Micah J.</creatorcontrib><collection>CrossRef</collection><collection>Engineered Materials Abstracts</collection><collection>Technology Research Database</collection><collection>Materials Research Database</collection><jtitle>Carbon (New York)</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Hicks, Victoria K.</au><au>Anas, Muhammad</au><au>Porter, Erin B.</au><au>Green, Micah J.</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>High-throughput screening of printed carbon nanotube circuits using radio frequency heating</atitle><jtitle>Carbon (New York)</jtitle><date>2019-11</date><risdate>2019</risdate><volume>152</volume><spage>444</spage><epage>450</epage><pages>444-450</pages><issn>0008-6223</issn><eissn>1873-3891</eissn><abstract>In this paper, we demonstrate a high-throughput technique for screening carbon nanotube (CNT) circuits using radio frequency (RF) heating. It has become increasingly common to integrate carbon nanotubes into electronic devices because of their superior electrical and mechanical properties, and CNT-based circuits can be screen printed in mass quantities. Currently, the process for screening the quality of these circuits requires that the 2-point resistance of every circuit be measured individually; this metric is tedious, slow, and prone to false positives. We recently reported that CNTs experience heating when exposed to RF fields. Since the heating response is correlated with the conductivity of the printed structure, RF heating and thermal imaging allows us to quickly assess circuit quality. This new technique screens CNT circuits ten times faster than conventional methods, and it identifies faulty circuits more reliably. This process is not limited to CNT-based circuits, and it can be used to rapidly image any 2D structure made from an RF responsive material.
[Display omitted]</abstract><cop>New York</cop><pub>Elsevier Ltd</pub><doi>10.1016/j.carbon.2019.06.039</doi><tpages>7</tpages><orcidid>https://orcid.org/0000-0001-5691-0861</orcidid></addata></record> |
fulltext | fulltext |
identifier | ISSN: 0008-6223 |
ispartof | Carbon (New York), 2019-11, Vol.152, p.444-450 |
issn | 0008-6223 1873-3891 |
language | eng |
recordid | cdi_proquest_journals_2311911943 |
source | Elsevier ScienceDirect Journals |
subjects | Carbon Carbon nanotube Carbon nanotubes Circuit Circuit reliability Electrical resistivity Electronic devices Faulty Heating Identification methods Mechanical properties Nanotubes Quality assessment Radio frequency Radio frequency heating Screening Thermal imaging |
title | High-throughput screening of printed carbon nanotube circuits using radio frequency heating |
url | https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-02-03T10%3A51%3A06IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-proquest_cross&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.genre=article&rft.atitle=High-throughput%20screening%20of%20printed%20carbon%20nanotube%20circuits%20using%20radio%20frequency%20heating&rft.jtitle=Carbon%20(New%20York)&rft.au=Hicks,%20Victoria%20K.&rft.date=2019-11&rft.volume=152&rft.spage=444&rft.epage=450&rft.pages=444-450&rft.issn=0008-6223&rft.eissn=1873-3891&rft_id=info:doi/10.1016/j.carbon.2019.06.039&rft_dat=%3Cproquest_cross%3E2311911943%3C/proquest_cross%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_pqid=2311911943&rft_id=info:pmid/&rft_els_id=S0008622319306037&rfr_iscdi=true |