Deep-Learning-Aided Detection for Reconfigurable Intelligent Surfaces

This paper presents a deep learning (DL) approach for estimating and detecting symbols in signals transmitted through reconfigurable intelligent surfaces (RIS). The proposed network utilizes fully connected layers to estimate channels and phase angles from a reflected signal received through an RIS....

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Veröffentlicht in:	arXiv.org 2020-07
Hauptverfasser:	Khan, Saud, Khan, Komal S, Haider, Noman, Soo Young Shin
Format:	Artikel
Sprache:	eng
Schlagworte:	Angle of reflection Bit error rate Deep learning Error detection Reconfigurable intelligent surfaces Symbols
Online-Zugang:	Volltext
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