Runaway electrons diagnostics using segmented semiconductor detectors
A novel application of strip and pixel silicon radiation detectors for study and characterization of run-away electron events in tokamaks is presented. Main goal was to monitor runaway electrons both directly and indirectly. The strip detector was placed inside the tokamak vacuum chamber in order to...
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| Veröffentlicht in: | Fusion engineering and design 2019-09, Vol.146, p.316-319 |
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| creator | Svihra, Peter Bren, David Casolari, Andrea Cerovsky, Jaroslav Dhyani, Pravesh Farnik, Michal Ficker, Ondrej Havranek, Miroslav Hejtmanek, Martin Janoska, Zdenko Kafka, Vladimir Kulhanek, Petr Linhart, Vladimir Macusova, Eva Marcisovska, Maria Marcisovsky, Michal Mlynar, Jan Neue, Gordon Novotny, Lukas Svoboda, Vojtech Tomasek, Lukas Urban, Jakub Vancura, Pavel Varju, Jozef Vrba, Vaclav Weinzettl, Vladimir |
| description | A novel application of strip and pixel silicon radiation detectors for study and characterization of run-away electron events in tokamaks is presented. Main goal was to monitor runaway electrons both directly and indirectly. The strip detector was placed inside the tokamak vacuum chamber in order to monitor the run-away electrons directly. Whereas the pixel detector was placed outside the tokamak chamber behind a pin hole for monitoring the run-away electrons indirectly via radiation produce by interaction of the electrons with the plasma facing material. Results obtained using the silicon detectors are compared with already existing diagnostic methods consisting of scintillation devices detecting X-rays and photo-neutrons, providing the same results in the observable comparisons. Tests with the pixel detector proved that the pinhole camera is able to extract spatial information of interaction point (a place where the runaway electrons hit on the facing material) and the strip detectors indicate presence of additional signal from throughout the discharge. The performed experiments are innovative, illustrating possible development of new and easy to use diagnostic method. |
| doi_str_mv | 10.1016/j.fusengdes.2018.12.054 |
| format | Article |
| fullrecord | <record><control><sourceid>proquest_cross</sourceid><recordid>TN_cdi_proquest_journals_2307137349</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><els_id>S0920379618308196</els_id><sourcerecordid>2307137349</sourcerecordid><originalsourceid>FETCH-LOGICAL-c343t-693101908123e4ee28152ef34056d80be573d4d6dae75d5e73db2d42aa01ef3e3</originalsourceid><addsrcrecordid>eNqFUF1Lw0AQPETBWv0NBnxOvI8klzyWUq1QEESfj-vdJlxo7-ptovTfe6Xiq7CwuzAzuzOE3DNaMMrqx6HoJgTfW8CCU9YUjBe0Ki_IjDVS5JK19SWZ0ZbTXMi2viY3iAOlTKaakdXb5PW3PmawAzPG4DGzTvc-4OgMZhM632cI_R78CDZNe2eCt5MZQ8wsjHAa8JZcdXqHcPfb5-TjafW-XOeb1-eX5WKTG1GKMa9bkV5uacO4gBKAN6zi0ImSVrVt6BYqKWxpa6tBVraCtG25LbnWlCUYiDl5OOseYvicAEc1hCn6dFJxQSUTUpRtQskzysSAGKFTh-j2Oh4Vo-qUmRrUX2bqlJliXKXMEnNxZkIy8eUgKjQOvAHrYnKqbHD_avwAUEp6hQ</addsrcrecordid><sourcetype>Aggregation Database</sourcetype><iscdi>true</iscdi><recordtype>article</recordtype><pqid>2307137349</pqid></control><display><type>article</type><title>Runaway electrons diagnostics using segmented semiconductor detectors</title><source>Elsevier ScienceDirect Journals Complete</source><creator>Svihra, Peter ; Bren, David ; Casolari, Andrea ; Cerovsky, Jaroslav ; Dhyani, Pravesh ; Farnik, Michal ; Ficker, Ondrej ; Havranek, Miroslav ; Hejtmanek, Martin ; Janoska, Zdenko ; Kafka, Vladimir ; Kulhanek, Petr ; Linhart, Vladimir ; Macusova, Eva ; Marcisovska, Maria ; Marcisovsky, Michal ; Mlynar, Jan ; Neue, Gordon ; Novotny, Lukas ; Svoboda, Vojtech ; Tomasek, Lukas ; Urban, Jakub ; Vancura, Pavel ; Varju, Jozef ; Vrba, Vaclav ; Weinzettl, Vladimir</creator><creatorcontrib>Svihra, Peter ; Bren, David ; Casolari, Andrea ; Cerovsky, Jaroslav ; Dhyani, Pravesh ; Farnik, Michal ; Ficker, Ondrej ; Havranek, Miroslav ; Hejtmanek, Martin ; Janoska, Zdenko ; Kafka, Vladimir ; Kulhanek, Petr ; Linhart, Vladimir ; Macusova, Eva ; Marcisovska, Maria ; Marcisovsky, Michal ; Mlynar, Jan ; Neue, Gordon ; Novotny, Lukas ; Svoboda, Vojtech ; Tomasek, Lukas ; Urban, Jakub ; Vancura, Pavel ; Varju, Jozef ; Vrba, Vaclav ; Weinzettl, Vladimir</creatorcontrib><description>A novel application of strip and pixel silicon radiation detectors for study and characterization of run-away electron events in tokamaks is presented. Main goal was to monitor runaway electrons both directly and indirectly. The strip detector was placed inside the tokamak vacuum chamber in order to monitor the run-away electrons directly. Whereas the pixel detector was placed outside the tokamak chamber behind a pin hole for monitoring the run-away electrons indirectly via radiation produce by interaction of the electrons with the plasma facing material. Results obtained using the silicon detectors are compared with already existing diagnostic methods consisting of scintillation devices detecting X-rays and photo-neutrons, providing the same results in the observable comparisons. Tests with the pixel detector proved that the pinhole camera is able to extract spatial information of interaction point (a place where the runaway electrons hit on the facing material) and the strip detectors indicate presence of additional signal from throughout the discharge. The performed experiments are innovative, illustrating possible development of new and easy to use diagnostic method.</description><identifier>ISSN: 0920-3796</identifier><identifier>EISSN: 1873-7196</identifier><identifier>DOI: 10.1016/j.fusengdes.2018.12.054</identifier><language>eng</language><publisher>Amsterdam: Elsevier B.V</publisher><subject>Diagnostic systems ; Electrons ; Pinhole cameras ; Pinholes ; Pixels ; Radiation detectors ; Runaway electrons ; Semiconductor detectors ; Sensors ; Silicon radiation detectors ; Spatial data ; Strip ; Tokamak devices ; Tokamaks ; Vacuum chambers</subject><ispartof>Fusion engineering and design, 2019-09, Vol.146, p.316-319</ispartof><rights>2018 Elsevier B.V.</rights><rights>Copyright Elsevier Science Ltd. Sep 2019</rights><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c343t-693101908123e4ee28152ef34056d80be573d4d6dae75d5e73db2d42aa01ef3e3</citedby><cites>FETCH-LOGICAL-c343t-693101908123e4ee28152ef34056d80be573d4d6dae75d5e73db2d42aa01ef3e3</cites><orcidid>0000-0002-1796-3597 ; 0000-0001-8936-7578 ; 0000-0002-7811-2147</orcidid></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://dx.doi.org/10.1016/j.fusengdes.2018.12.054$$EHTML$$P50$$Gelsevier$$H</linktohtml><link.rule.ids>314,780,784,3550,27924,27925,45995</link.rule.ids></links><search><creatorcontrib>Svihra, Peter</creatorcontrib><creatorcontrib>Bren, David</creatorcontrib><creatorcontrib>Casolari, Andrea</creatorcontrib><creatorcontrib>Cerovsky, Jaroslav</creatorcontrib><creatorcontrib>Dhyani, Pravesh</creatorcontrib><creatorcontrib>Farnik, Michal</creatorcontrib><creatorcontrib>Ficker, Ondrej</creatorcontrib><creatorcontrib>Havranek, Miroslav</creatorcontrib><creatorcontrib>Hejtmanek, Martin</creatorcontrib><creatorcontrib>Janoska, Zdenko</creatorcontrib><creatorcontrib>Kafka, Vladimir</creatorcontrib><creatorcontrib>Kulhanek, Petr</creatorcontrib><creatorcontrib>Linhart, Vladimir</creatorcontrib><creatorcontrib>Macusova, Eva</creatorcontrib><creatorcontrib>Marcisovska, Maria</creatorcontrib><creatorcontrib>Marcisovsky, Michal</creatorcontrib><creatorcontrib>Mlynar, Jan</creatorcontrib><creatorcontrib>Neue, Gordon</creatorcontrib><creatorcontrib>Novotny, Lukas</creatorcontrib><creatorcontrib>Svoboda, Vojtech</creatorcontrib><creatorcontrib>Tomasek, Lukas</creatorcontrib><creatorcontrib>Urban, Jakub</creatorcontrib><creatorcontrib>Vancura, Pavel</creatorcontrib><creatorcontrib>Varju, Jozef</creatorcontrib><creatorcontrib>Vrba, Vaclav</creatorcontrib><creatorcontrib>Weinzettl, Vladimir</creatorcontrib><title>Runaway electrons diagnostics using segmented semiconductor detectors</title><title>Fusion engineering and design</title><description>A novel application of strip and pixel silicon radiation detectors for study and characterization of run-away electron events in tokamaks is presented. Main goal was to monitor runaway electrons both directly and indirectly. The strip detector was placed inside the tokamak vacuum chamber in order to monitor the run-away electrons directly. Whereas the pixel detector was placed outside the tokamak chamber behind a pin hole for monitoring the run-away electrons indirectly via radiation produce by interaction of the electrons with the plasma facing material. Results obtained using the silicon detectors are compared with already existing diagnostic methods consisting of scintillation devices detecting X-rays and photo-neutrons, providing the same results in the observable comparisons. Tests with the pixel detector proved that the pinhole camera is able to extract spatial information of interaction point (a place where the runaway electrons hit on the facing material) and the strip detectors indicate presence of additional signal from throughout the discharge. The performed experiments are innovative, illustrating possible development of new and easy to use diagnostic method.</description><subject>Diagnostic systems</subject><subject>Electrons</subject><subject>Pinhole cameras</subject><subject>Pinholes</subject><subject>Pixels</subject><subject>Radiation detectors</subject><subject>Runaway electrons</subject><subject>Semiconductor detectors</subject><subject>Sensors</subject><subject>Silicon radiation detectors</subject><subject>Spatial data</subject><subject>Strip</subject><subject>Tokamak devices</subject><subject>Tokamaks</subject><subject>Vacuum chambers</subject><issn>0920-3796</issn><issn>1873-7196</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2019</creationdate><recordtype>article</recordtype><recordid>eNqFUF1Lw0AQPETBWv0NBnxOvI8klzyWUq1QEESfj-vdJlxo7-ptovTfe6Xiq7CwuzAzuzOE3DNaMMrqx6HoJgTfW8CCU9YUjBe0Ki_IjDVS5JK19SWZ0ZbTXMi2viY3iAOlTKaakdXb5PW3PmawAzPG4DGzTvc-4OgMZhM632cI_R78CDZNe2eCt5MZQ8wsjHAa8JZcdXqHcPfb5-TjafW-XOeb1-eX5WKTG1GKMa9bkV5uacO4gBKAN6zi0ImSVrVt6BYqKWxpa6tBVraCtG25LbnWlCUYiDl5OOseYvicAEc1hCn6dFJxQSUTUpRtQskzysSAGKFTh-j2Oh4Vo-qUmRrUX2bqlJliXKXMEnNxZkIy8eUgKjQOvAHrYnKqbHD_avwAUEp6hQ</recordid><startdate>201909</startdate><enddate>201909</enddate><creator>Svihra, Peter</creator><creator>Bren, David</creator><creator>Casolari, Andrea</creator><creator>Cerovsky, Jaroslav</creator><creator>Dhyani, Pravesh</creator><creator>Farnik, Michal</creator><creator>Ficker, Ondrej</creator><creator>Havranek, Miroslav</creator><creator>Hejtmanek, Martin</creator><creator>Janoska, Zdenko</creator><creator>Kafka, Vladimir</creator><creator>Kulhanek, Petr</creator><creator>Linhart, Vladimir</creator><creator>Macusova, Eva</creator><creator>Marcisovska, Maria</creator><creator>Marcisovsky, Michal</creator><creator>Mlynar, Jan</creator><creator>Neue, Gordon</creator><creator>Novotny, Lukas</creator><creator>Svoboda, Vojtech</creator><creator>Tomasek, Lukas</creator><creator>Urban, Jakub</creator><creator>Vancura, Pavel</creator><creator>Varju, Jozef</creator><creator>Vrba, Vaclav</creator><creator>Weinzettl, Vladimir</creator><general>Elsevier B.V</general><general>Elsevier Science Ltd</general><scope>AAYXX</scope><scope>CITATION</scope><scope>7TB</scope><scope>8FD</scope><scope>FR3</scope><scope>H8D</scope><scope>KR7</scope><scope>L7M</scope><orcidid>https://orcid.org/0000-0002-1796-3597</orcidid><orcidid>https://orcid.org/0000-0001-8936-7578</orcidid><orcidid>https://orcid.org/0000-0002-7811-2147</orcidid></search><sort><creationdate>201909</creationdate><title>Runaway electrons diagnostics using segmented semiconductor detectors</title><author>Svihra, Peter ; Bren, David ; Casolari, Andrea ; Cerovsky, Jaroslav ; Dhyani, Pravesh ; Farnik, Michal ; Ficker, Ondrej ; Havranek, Miroslav ; Hejtmanek, Martin ; Janoska, Zdenko ; Kafka, Vladimir ; Kulhanek, Petr ; Linhart, Vladimir ; Macusova, Eva ; Marcisovska, Maria ; Marcisovsky, Michal ; Mlynar, Jan ; Neue, Gordon ; Novotny, Lukas ; Svoboda, Vojtech ; Tomasek, Lukas ; Urban, Jakub ; Vancura, Pavel ; Varju, Jozef ; Vrba, Vaclav ; Weinzettl, Vladimir</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c343t-693101908123e4ee28152ef34056d80be573d4d6dae75d5e73db2d42aa01ef3e3</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2019</creationdate><topic>Diagnostic systems</topic><topic>Electrons</topic><topic>Pinhole cameras</topic><topic>Pinholes</topic><topic>Pixels</topic><topic>Radiation detectors</topic><topic>Runaway electrons</topic><topic>Semiconductor detectors</topic><topic>Sensors</topic><topic>Silicon radiation detectors</topic><topic>Spatial data</topic><topic>Strip</topic><topic>Tokamak devices</topic><topic>Tokamaks</topic><topic>Vacuum chambers</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Svihra, Peter</creatorcontrib><creatorcontrib>Bren, David</creatorcontrib><creatorcontrib>Casolari, Andrea</creatorcontrib><creatorcontrib>Cerovsky, Jaroslav</creatorcontrib><creatorcontrib>Dhyani, Pravesh</creatorcontrib><creatorcontrib>Farnik, Michal</creatorcontrib><creatorcontrib>Ficker, Ondrej</creatorcontrib><creatorcontrib>Havranek, Miroslav</creatorcontrib><creatorcontrib>Hejtmanek, Martin</creatorcontrib><creatorcontrib>Janoska, Zdenko</creatorcontrib><creatorcontrib>Kafka, Vladimir</creatorcontrib><creatorcontrib>Kulhanek, Petr</creatorcontrib><creatorcontrib>Linhart, Vladimir</creatorcontrib><creatorcontrib>Macusova, Eva</creatorcontrib><creatorcontrib>Marcisovska, Maria</creatorcontrib><creatorcontrib>Marcisovsky, Michal</creatorcontrib><creatorcontrib>Mlynar, Jan</creatorcontrib><creatorcontrib>Neue, Gordon</creatorcontrib><creatorcontrib>Novotny, Lukas</creatorcontrib><creatorcontrib>Svoboda, Vojtech</creatorcontrib><creatorcontrib>Tomasek, Lukas</creatorcontrib><creatorcontrib>Urban, Jakub</creatorcontrib><creatorcontrib>Vancura, Pavel</creatorcontrib><creatorcontrib>Varju, Jozef</creatorcontrib><creatorcontrib>Vrba, Vaclav</creatorcontrib><creatorcontrib>Weinzettl, Vladimir</creatorcontrib><collection>CrossRef</collection><collection>Mechanical & Transportation Engineering Abstracts</collection><collection>Technology Research Database</collection><collection>Engineering Research Database</collection><collection>Aerospace Database</collection><collection>Civil Engineering Abstracts</collection><collection>Advanced Technologies Database with Aerospace</collection><jtitle>Fusion engineering and design</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Svihra, Peter</au><au>Bren, David</au><au>Casolari, Andrea</au><au>Cerovsky, Jaroslav</au><au>Dhyani, Pravesh</au><au>Farnik, Michal</au><au>Ficker, Ondrej</au><au>Havranek, Miroslav</au><au>Hejtmanek, Martin</au><au>Janoska, Zdenko</au><au>Kafka, Vladimir</au><au>Kulhanek, Petr</au><au>Linhart, Vladimir</au><au>Macusova, Eva</au><au>Marcisovska, Maria</au><au>Marcisovsky, Michal</au><au>Mlynar, Jan</au><au>Neue, Gordon</au><au>Novotny, Lukas</au><au>Svoboda, Vojtech</au><au>Tomasek, Lukas</au><au>Urban, Jakub</au><au>Vancura, Pavel</au><au>Varju, Jozef</au><au>Vrba, Vaclav</au><au>Weinzettl, Vladimir</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Runaway electrons diagnostics using segmented semiconductor detectors</atitle><jtitle>Fusion engineering and design</jtitle><date>2019-09</date><risdate>2019</risdate><volume>146</volume><spage>316</spage><epage>319</epage><pages>316-319</pages><issn>0920-3796</issn><eissn>1873-7196</eissn><abstract>A novel application of strip and pixel silicon radiation detectors for study and characterization of run-away electron events in tokamaks is presented. Main goal was to monitor runaway electrons both directly and indirectly. The strip detector was placed inside the tokamak vacuum chamber in order to monitor the run-away electrons directly. Whereas the pixel detector was placed outside the tokamak chamber behind a pin hole for monitoring the run-away electrons indirectly via radiation produce by interaction of the electrons with the plasma facing material. Results obtained using the silicon detectors are compared with already existing diagnostic methods consisting of scintillation devices detecting X-rays and photo-neutrons, providing the same results in the observable comparisons. Tests with the pixel detector proved that the pinhole camera is able to extract spatial information of interaction point (a place where the runaway electrons hit on the facing material) and the strip detectors indicate presence of additional signal from throughout the discharge. The performed experiments are innovative, illustrating possible development of new and easy to use diagnostic method.</abstract><cop>Amsterdam</cop><pub>Elsevier B.V</pub><doi>10.1016/j.fusengdes.2018.12.054</doi><tpages>4</tpages><orcidid>https://orcid.org/0000-0002-1796-3597</orcidid><orcidid>https://orcid.org/0000-0001-8936-7578</orcidid><orcidid>https://orcid.org/0000-0002-7811-2147</orcidid></addata></record> |
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| ispartof | Fusion engineering and design, 2019-09, Vol.146, p.316-319 |
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| language | eng |
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| source | Elsevier ScienceDirect Journals Complete |
| subjects | Diagnostic systems Electrons Pinhole cameras Pinholes Pixels Radiation detectors Runaway electrons Semiconductor detectors Sensors Silicon radiation detectors Spatial data Strip Tokamak devices Tokamaks Vacuum chambers |
| title | Runaway electrons diagnostics using segmented semiconductor detectors |
| url | https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-01-04T21%3A52%3A35IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-proquest_cross&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.genre=article&rft.atitle=Runaway%20electrons%20diagnostics%20using%20segmented%20semiconductor%20detectors&rft.jtitle=Fusion%20engineering%20and%20design&rft.au=Svihra,%20Peter&rft.date=2019-09&rft.volume=146&rft.spage=316&rft.epage=319&rft.pages=316-319&rft.issn=0920-3796&rft.eissn=1873-7196&rft_id=info:doi/10.1016/j.fusengdes.2018.12.054&rft_dat=%3Cproquest_cross%3E2307137349%3C/proquest_cross%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_pqid=2307137349&rft_id=info:pmid/&rft_els_id=S0920379618308196&rfr_iscdi=true |