Denoising of crystal orientation maps
This paper compares several well known sliding‐window methods for denoising crystal orientation data with variational methods adapted from mathematical image analysis. The variational methods turn out to be much more powerful in terms of preserving low‐angle grain boundaries and filling holes of non...
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| Veröffentlicht in: | Journal of applied crystallography 2019-10, Vol.52 (5), p.984-996 |
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| container_title | Journal of applied crystallography |
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| creator | Hielscher, R. Silbermann, C. B. Schmidl, E. Ihlemann, Joern |
| description | This paper compares several well known sliding‐window methods for denoising crystal orientation data with variational methods adapted from mathematical image analysis. The variational methods turn out to be much more powerful in terms of preserving low‐angle grain boundaries and filling holes of non‐indexed orientations. The effect of denoising on the determination of the kernel average misorientation and the geometrically necessary dislocation density is also discussed. Synthetic as well as experimental data are considered for this comparison. The examples demonstrate that variational denoising techniques are capable of significantly improving the accuracy of properties derived from electron backscatter diffraction maps.
This paper compares several well known methods for denoising orientation data with methods adapted from mathematical image analysis. |
| doi_str_mv | 10.1107/S1600576719009075 |
| format | Article |
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This paper compares several well known methods for denoising orientation data with methods adapted from mathematical image analysis.</description><identifier>ISSN: 1600-5767</identifier><identifier>ISSN: 0021-8898</identifier><identifier>EISSN: 1600-5767</identifier><identifier>DOI: 10.1107/S1600576719009075</identifier><language>eng</language><publisher>5 Abbey Square, Chester, Cheshire CH1 2HU, England: International Union of Crystallography</publisher><subject>Crystal structure ; denoising ; Dislocation ; Dislocation density ; Electron backscatter diffraction ; geometrically necessary dislocations ; Grain boundaries ; Image analysis ; Image processing ; inpainting ; kernel average misorientation ; measurement errors ; Misalignment ; Noise reduction ; Silicon ; Variational methods</subject><ispartof>Journal of applied crystallography, 2019-10, Vol.52 (5), p.984-996</ispartof><rights>International Union of Crystallography, 2019</rights><rights>Copyright Blackwell Publishing Ltd. Oct 2019</rights><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c3899-72773c3e10a8cf0e82c11c28ad9fa2c1624e4824449626c8d15614dfd95edcc23</citedby><cites>FETCH-LOGICAL-c3899-72773c3e10a8cf0e82c11c28ad9fa2c1624e4824449626c8d15614dfd95edcc23</cites></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktopdf>$$Uhttps://onlinelibrary.wiley.com/doi/pdf/10.1107%2FS1600576719009075$$EPDF$$P50$$Gwiley$$H</linktopdf><linktohtml>$$Uhttps://onlinelibrary.wiley.com/doi/full/10.1107%2FS1600576719009075$$EHTML$$P50$$Gwiley$$H</linktohtml><link.rule.ids>314,776,780,1411,27903,27904,45553,45554</link.rule.ids></links><search><creatorcontrib>Hielscher, R.</creatorcontrib><creatorcontrib>Silbermann, C. B.</creatorcontrib><creatorcontrib>Schmidl, E.</creatorcontrib><creatorcontrib>Ihlemann, Joern</creatorcontrib><title>Denoising of crystal orientation maps</title><title>Journal of applied crystallography</title><description>This paper compares several well known sliding‐window methods for denoising crystal orientation data with variational methods adapted from mathematical image analysis. The variational methods turn out to be much more powerful in terms of preserving low‐angle grain boundaries and filling holes of non‐indexed orientations. The effect of denoising on the determination of the kernel average misorientation and the geometrically necessary dislocation density is also discussed. Synthetic as well as experimental data are considered for this comparison. The examples demonstrate that variational denoising techniques are capable of significantly improving the accuracy of properties derived from electron backscatter diffraction maps.
This paper compares several well known methods for denoising orientation data with methods adapted from mathematical image analysis.</description><subject>Crystal structure</subject><subject>denoising</subject><subject>Dislocation</subject><subject>Dislocation density</subject><subject>Electron backscatter diffraction</subject><subject>geometrically necessary dislocations</subject><subject>Grain boundaries</subject><subject>Image analysis</subject><subject>Image processing</subject><subject>inpainting</subject><subject>kernel average misorientation</subject><subject>measurement errors</subject><subject>Misalignment</subject><subject>Noise reduction</subject><subject>Silicon</subject><subject>Variational methods</subject><issn>1600-5767</issn><issn>0021-8898</issn><issn>1600-5767</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2019</creationdate><recordtype>article</recordtype><recordid>eNqFkM1LxDAQxYMouK7-Ad4K4rE6k6RJc5Tq-sHCih_nENJUunSbmnSR_ve21IPgwdM8Hu83wzxCzhGuEEFev6IAyKSQqAAUyOyALCYrnbzDX_qYnMS4BUAhKV2Qy1vX-jrW7Ufiq8SGIfamSXyoXdubvvZtsjNdPCVHlWmiO_uZS_K-unsrHtL15v6xuFmnluVKpZJKySxzCCa3FbicWkRLc1OqyoxaUO54TjnnSlBh8xIzgbysSpW50lrKluRi3tsF_7l3sddbvw_teFJTBqjo-CKOKZxTNvgYg6t0F-qdCYNG0FMb-k8bI6Nm5qtu3PA_oJ-KF_q8yZAp9g3hNmAZ</recordid><startdate>201910</startdate><enddate>201910</enddate><creator>Hielscher, R.</creator><creator>Silbermann, C. B.</creator><creator>Schmidl, E.</creator><creator>Ihlemann, Joern</creator><general>International Union of Crystallography</general><general>Blackwell Publishing Ltd</general><scope>AAYXX</scope><scope>CITATION</scope><scope>7SR</scope><scope>7U5</scope><scope>8BQ</scope><scope>8FD</scope><scope>JG9</scope><scope>L7M</scope></search><sort><creationdate>201910</creationdate><title>Denoising of crystal orientation maps</title><author>Hielscher, R. ; Silbermann, C. B. ; Schmidl, E. ; Ihlemann, Joern</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c3899-72773c3e10a8cf0e82c11c28ad9fa2c1624e4824449626c8d15614dfd95edcc23</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2019</creationdate><topic>Crystal structure</topic><topic>denoising</topic><topic>Dislocation</topic><topic>Dislocation density</topic><topic>Electron backscatter diffraction</topic><topic>geometrically necessary dislocations</topic><topic>Grain boundaries</topic><topic>Image analysis</topic><topic>Image processing</topic><topic>inpainting</topic><topic>kernel average misorientation</topic><topic>measurement errors</topic><topic>Misalignment</topic><topic>Noise reduction</topic><topic>Silicon</topic><topic>Variational methods</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Hielscher, R.</creatorcontrib><creatorcontrib>Silbermann, C. B.</creatorcontrib><creatorcontrib>Schmidl, E.</creatorcontrib><creatorcontrib>Ihlemann, Joern</creatorcontrib><collection>CrossRef</collection><collection>Engineered Materials Abstracts</collection><collection>Solid State and Superconductivity Abstracts</collection><collection>METADEX</collection><collection>Technology Research Database</collection><collection>Materials Research Database</collection><collection>Advanced Technologies Database with Aerospace</collection><jtitle>Journal of applied crystallography</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Hielscher, R.</au><au>Silbermann, C. B.</au><au>Schmidl, E.</au><au>Ihlemann, Joern</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Denoising of crystal orientation maps</atitle><jtitle>Journal of applied crystallography</jtitle><date>2019-10</date><risdate>2019</risdate><volume>52</volume><issue>5</issue><spage>984</spage><epage>996</epage><pages>984-996</pages><issn>1600-5767</issn><issn>0021-8898</issn><eissn>1600-5767</eissn><abstract>This paper compares several well known sliding‐window methods for denoising crystal orientation data with variational methods adapted from mathematical image analysis. The variational methods turn out to be much more powerful in terms of preserving low‐angle grain boundaries and filling holes of non‐indexed orientations. The effect of denoising on the determination of the kernel average misorientation and the geometrically necessary dislocation density is also discussed. Synthetic as well as experimental data are considered for this comparison. The examples demonstrate that variational denoising techniques are capable of significantly improving the accuracy of properties derived from electron backscatter diffraction maps.
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| ispartof | Journal of applied crystallography, 2019-10, Vol.52 (5), p.984-996 |
| issn | 1600-5767 0021-8898 1600-5767 |
| language | eng |
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| source | Wiley Online Library Journals Frontfile Complete; Alma/SFX Local Collection |
| subjects | Crystal structure denoising Dislocation Dislocation density Electron backscatter diffraction geometrically necessary dislocations Grain boundaries Image analysis Image processing inpainting kernel average misorientation measurement errors Misalignment Noise reduction Silicon Variational methods |
| title | Denoising of crystal orientation maps |
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