Operational Testing of 4H-SiC JFET ICs for 60 Days Directly Exposed to Venus Surface Atmospheric Conditions

Prolonged Venus surface missions (lasting months instead of hours) have proven infeasible to date in the absence of a complete suite of electronics able to function for such durations without protection from the planet's extreme conditions of ~460°C, ~9.3 MPa (~92 Earth atmospheres) chemically...

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Veröffentlicht in:	IEEE journal of the Electron Devices Society 2019-01, Vol.7, p.100-110
Hauptverfasser:	Neudeck, Philip G., Chen, Liangyu, Meredith, Roger D., Lukco, Dorothy, Spry, David J., Nakley, Leah M., Hunter, Gary W.
Format:	Artikel
Sprache:	eng
Schlagworte:	Circuit protection Complexity Cooling effects Electronics Electronics And Electrical Engineering Field effect transistors high-temperature techniques Integrated circuits JFET JFET integrated circuits JFETs Lander vehicles NASA Organic chemistry Reactive environments Semiconductor devices Silicon carbide space technology Spacecraft Instrumentation And Astrionics Terrestrial atmosphere Test chambers Testing Transistors Venus Venus atmosphere Venus surface
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