Postprocessing for Improved Accuracy and Resolution of Spread Spectrum Time-Domain Reflectometry
Reflectometry, which is commonly used for locating faults on electrical wires, produces sampled time domain signatures with peaks that are often missed due to this sampling. Resultant errors in these sampled peaks translate to errors in calculating the impedance and location of the fault. Typical si...
Gespeichert in:
| Veröffentlicht in: | IEEE sensors letters 2019-06, Vol.3 (6), p.1-4 |
|---|---|
| Hauptverfasser: | , , , , , , |
| Format: | Artikel |
| Sprache: | eng |
| Schlagworte: | |
| Online-Zugang: | Volltext bestellen |
| Tags: |
Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
|
| container_end_page | 4 |
|---|---|
| container_issue | 6 |
| container_start_page | 1 |
| container_title | IEEE sensors letters |
| container_volume | 3 |
| creator | Jayakumar, Naveen Kumar Tumkur Benoit, Evan Kingston, Samuel Saleh, Mashad Uddin Scarpulla, Michael Harley, Joel B Furse, Cynthia |
| description | Reflectometry, which is commonly used for locating faults on electrical wires, produces sampled time domain signatures with peaks that are often missed due to this sampling. Resultant errors in these sampled peaks translate to errors in calculating the impedance and location of the fault. Typical signal processing methods to improve the accuracy of these sampled peaks have complexity on the order of O(N 2 ). For embedded fault location applications, algorithms with lower complexity are desired. In this article, we introduce three algorithms for improving the accuracy of the peak with a complexity of O(N). We evaluate these algorithms on the practical case of calculating the velocity of propagation and the characteristic impedance of a photovoltaic (PV) cable using spread spectrum time-domain reflectometry. |
| doi_str_mv | 10.1109/LSENS.2019.2916636 |
| format | Article |
| fullrecord | <record><control><sourceid>proquest_RIE</sourceid><recordid>TN_cdi_proquest_journals_2296105593</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><ieee_id>8713593</ieee_id><sourcerecordid>2296105593</sourcerecordid><originalsourceid>FETCH-LOGICAL-c366t-a9c7e1a41e08a9d17ac9dc8c01aca292d0c98a4bc85b3fe68ffb32fca8190bb63</originalsourceid><addsrcrecordid>eNpNkEtPwzAQhCMEElXpH4BLBOcUP_Kwj1UpUKkCRMvZOJs1pGriYidI_fe4tEKcdrX6ZjQ7UXRJyZhSIm8Xy9nTcswIlWMmaZ7z_CQasLTIEpoW7PTffh6NvF8TQqhgBeFkEL2_WN9tnQX0vm4_YmNdPG_C4RureALQOw27WLdV_Irebvqutm1sTbzcOtRVGAid65t4VTeY3NlG120gzSacbYOd211EZ0ZvPI6Ocxi93c9W08dk8fwwn04WCfA87xItoUCqU4pEaFnRQoOsQAChGjSTrCIghU5LEFnJDebCmJIzA1pQScoy58Po-uAb_qmVh7pD-ATbtiGJYoynPGUBujlA4cGvHn2n1rZ3bcgVEJlTkmWSB4odKHDWe4dGbV3daLdTlKh94-q3cbVvXB0bD6Krg6hGxD-BKCjfW_4AFrZ-IA</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>article</recordtype><pqid>2296105593</pqid></control><display><type>article</type><title>Postprocessing for Improved Accuracy and Resolution of Spread Spectrum Time-Domain Reflectometry</title><source>IEEE Electronic Library (IEL)</source><creator>Jayakumar, Naveen Kumar Tumkur ; Benoit, Evan ; Kingston, Samuel ; Saleh, Mashad Uddin ; Scarpulla, Michael ; Harley, Joel B ; Furse, Cynthia</creator><creatorcontrib>Jayakumar, Naveen Kumar Tumkur ; Benoit, Evan ; Kingston, Samuel ; Saleh, Mashad Uddin ; Scarpulla, Michael ; Harley, Joel B ; Furse, Cynthia ; Univ. of Utah, Salt Lake City, UT (United States)</creatorcontrib><description>Reflectometry, which is commonly used for locating faults on electrical wires, produces sampled time domain signatures with peaks that are often missed due to this sampling. Resultant errors in these sampled peaks translate to errors in calculating the impedance and location of the fault. Typical signal processing methods to improve the accuracy of these sampled peaks have complexity on the order of O(N 2 ). For embedded fault location applications, algorithms with lower complexity are desired. In this article, we introduce three algorithms for improving the accuracy of the peak with a complexity of O(N). We evaluate these algorithms on the practical case of calculating the velocity of propagation and the characteristic impedance of a photovoltaic (PV) cable using spread spectrum time-domain reflectometry.</description><identifier>ISSN: 2475-1472</identifier><identifier>EISSN: 2475-1472</identifier><identifier>DOI: 10.1109/LSENS.2019.2916636</identifier><identifier>CODEN: ISLECD</identifier><language>eng</language><publisher>Piscataway: IEEE</publisher><subject>Accuracy ; Algorithms ; Complexity ; Complexity theory ; Fault location ; Impedance ; Interpolation ; Mathematical analysis ; OTHER INSTRUMENTATION ; Photovoltaic cells ; Propagation velocity ; Reflectometry ; resolution ; Sensor phenomena ; Signal processing ; Signal processing algorithms ; Solar cells ; Splines (mathematics) ; Spread spectrum ; spread spectrum time-domain reflectometry (SSTDR) ; Time domain analysis ; Wires</subject><ispartof>IEEE sensors letters, 2019-06, Vol.3 (6), p.1-4</ispartof><rights>Copyright The Institute of Electrical and Electronics Engineers, Inc. (IEEE) 2019</rights><lds50>peer_reviewed</lds50><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c366t-a9c7e1a41e08a9d17ac9dc8c01aca292d0c98a4bc85b3fe68ffb32fca8190bb63</citedby><cites>FETCH-LOGICAL-c366t-a9c7e1a41e08a9d17ac9dc8c01aca292d0c98a4bc85b3fe68ffb32fca8190bb63</cites><orcidid>0000-0001-8920-1498 ; 0000-0002-7139-7231 ; 0000-0002-4295-0851 ; 0000-0003-1286-5557 ; 0000000242950851 ; 0000000189201498 ; 0000000271397231 ; 0000000312865557</orcidid></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://ieeexplore.ieee.org/document/8713593$$EHTML$$P50$$Gieee$$H</linktohtml><link.rule.ids>230,314,776,780,792,881,27903,27904,54736</link.rule.ids><linktorsrc>$$Uhttps://ieeexplore.ieee.org/document/8713593$$EView_record_in_IEEE$$FView_record_in_$$GIEEE</linktorsrc><backlink>$$Uhttps://www.osti.gov/servlets/purl/2234342$$D View this record in Osti.gov$$Hfree_for_read</backlink></links><search><creatorcontrib>Jayakumar, Naveen Kumar Tumkur</creatorcontrib><creatorcontrib>Benoit, Evan</creatorcontrib><creatorcontrib>Kingston, Samuel</creatorcontrib><creatorcontrib>Saleh, Mashad Uddin</creatorcontrib><creatorcontrib>Scarpulla, Michael</creatorcontrib><creatorcontrib>Harley, Joel B</creatorcontrib><creatorcontrib>Furse, Cynthia</creatorcontrib><creatorcontrib>Univ. of Utah, Salt Lake City, UT (United States)</creatorcontrib><title>Postprocessing for Improved Accuracy and Resolution of Spread Spectrum Time-Domain Reflectometry</title><title>IEEE sensors letters</title><addtitle>LSENS</addtitle><description>Reflectometry, which is commonly used for locating faults on electrical wires, produces sampled time domain signatures with peaks that are often missed due to this sampling. Resultant errors in these sampled peaks translate to errors in calculating the impedance and location of the fault. Typical signal processing methods to improve the accuracy of these sampled peaks have complexity on the order of O(N 2 ). For embedded fault location applications, algorithms with lower complexity are desired. In this article, we introduce three algorithms for improving the accuracy of the peak with a complexity of O(N). We evaluate these algorithms on the practical case of calculating the velocity of propagation and the characteristic impedance of a photovoltaic (PV) cable using spread spectrum time-domain reflectometry.</description><subject>Accuracy</subject><subject>Algorithms</subject><subject>Complexity</subject><subject>Complexity theory</subject><subject>Fault location</subject><subject>Impedance</subject><subject>Interpolation</subject><subject>Mathematical analysis</subject><subject>OTHER INSTRUMENTATION</subject><subject>Photovoltaic cells</subject><subject>Propagation velocity</subject><subject>Reflectometry</subject><subject>resolution</subject><subject>Sensor phenomena</subject><subject>Signal processing</subject><subject>Signal processing algorithms</subject><subject>Solar cells</subject><subject>Splines (mathematics)</subject><subject>Spread spectrum</subject><subject>spread spectrum time-domain reflectometry (SSTDR)</subject><subject>Time domain analysis</subject><subject>Wires</subject><issn>2475-1472</issn><issn>2475-1472</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2019</creationdate><recordtype>article</recordtype><sourceid>RIE</sourceid><recordid>eNpNkEtPwzAQhCMEElXpH4BLBOcUP_Kwj1UpUKkCRMvZOJs1pGriYidI_fe4tEKcdrX6ZjQ7UXRJyZhSIm8Xy9nTcswIlWMmaZ7z_CQasLTIEpoW7PTffh6NvF8TQqhgBeFkEL2_WN9tnQX0vm4_YmNdPG_C4RureALQOw27WLdV_Irebvqutm1sTbzcOtRVGAid65t4VTeY3NlG120gzSacbYOd211EZ0ZvPI6Ocxi93c9W08dk8fwwn04WCfA87xItoUCqU4pEaFnRQoOsQAChGjSTrCIghU5LEFnJDebCmJIzA1pQScoy58Po-uAb_qmVh7pD-ATbtiGJYoynPGUBujlA4cGvHn2n1rZ3bcgVEJlTkmWSB4odKHDWe4dGbV3daLdTlKh94-q3cbVvXB0bD6Krg6hGxD-BKCjfW_4AFrZ-IA</recordid><startdate>20190601</startdate><enddate>20190601</enddate><creator>Jayakumar, Naveen Kumar Tumkur</creator><creator>Benoit, Evan</creator><creator>Kingston, Samuel</creator><creator>Saleh, Mashad Uddin</creator><creator>Scarpulla, Michael</creator><creator>Harley, Joel B</creator><creator>Furse, Cynthia</creator><general>IEEE</general><general>The Institute of Electrical and Electronics Engineers, Inc. (IEEE)</general><scope>97E</scope><scope>RIA</scope><scope>RIE</scope><scope>AAYXX</scope><scope>CITATION</scope><scope>7SP</scope><scope>8FD</scope><scope>L7M</scope><scope>OIOZB</scope><scope>OTOTI</scope><orcidid>https://orcid.org/0000-0001-8920-1498</orcidid><orcidid>https://orcid.org/0000-0002-7139-7231</orcidid><orcidid>https://orcid.org/0000-0002-4295-0851</orcidid><orcidid>https://orcid.org/0000-0003-1286-5557</orcidid><orcidid>https://orcid.org/0000000242950851</orcidid><orcidid>https://orcid.org/0000000189201498</orcidid><orcidid>https://orcid.org/0000000271397231</orcidid><orcidid>https://orcid.org/0000000312865557</orcidid></search><sort><creationdate>20190601</creationdate><title>Postprocessing for Improved Accuracy and Resolution of Spread Spectrum Time-Domain Reflectometry</title><author>Jayakumar, Naveen Kumar Tumkur ; Benoit, Evan ; Kingston, Samuel ; Saleh, Mashad Uddin ; Scarpulla, Michael ; Harley, Joel B ; Furse, Cynthia</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c366t-a9c7e1a41e08a9d17ac9dc8c01aca292d0c98a4bc85b3fe68ffb32fca8190bb63</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2019</creationdate><topic>Accuracy</topic><topic>Algorithms</topic><topic>Complexity</topic><topic>Complexity theory</topic><topic>Fault location</topic><topic>Impedance</topic><topic>Interpolation</topic><topic>Mathematical analysis</topic><topic>OTHER INSTRUMENTATION</topic><topic>Photovoltaic cells</topic><topic>Propagation velocity</topic><topic>Reflectometry</topic><topic>resolution</topic><topic>Sensor phenomena</topic><topic>Signal processing</topic><topic>Signal processing algorithms</topic><topic>Solar cells</topic><topic>Splines (mathematics)</topic><topic>Spread spectrum</topic><topic>spread spectrum time-domain reflectometry (SSTDR)</topic><topic>Time domain analysis</topic><topic>Wires</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Jayakumar, Naveen Kumar Tumkur</creatorcontrib><creatorcontrib>Benoit, Evan</creatorcontrib><creatorcontrib>Kingston, Samuel</creatorcontrib><creatorcontrib>Saleh, Mashad Uddin</creatorcontrib><creatorcontrib>Scarpulla, Michael</creatorcontrib><creatorcontrib>Harley, Joel B</creatorcontrib><creatorcontrib>Furse, Cynthia</creatorcontrib><creatorcontrib>Univ. of Utah, Salt Lake City, UT (United States)</creatorcontrib><collection>IEEE All-Society Periodicals Package (ASPP) 2005-present</collection><collection>IEEE All-Society Periodicals Package (ASPP) 1998-Present</collection><collection>IEEE Electronic Library (IEL)</collection><collection>CrossRef</collection><collection>Electronics & Communications Abstracts</collection><collection>Technology Research Database</collection><collection>Advanced Technologies Database with Aerospace</collection><collection>OSTI.GOV - Hybrid</collection><collection>OSTI.GOV</collection><jtitle>IEEE sensors letters</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>Jayakumar, Naveen Kumar Tumkur</au><au>Benoit, Evan</au><au>Kingston, Samuel</au><au>Saleh, Mashad Uddin</au><au>Scarpulla, Michael</au><au>Harley, Joel B</au><au>Furse, Cynthia</au><aucorp>Univ. of Utah, Salt Lake City, UT (United States)</aucorp><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Postprocessing for Improved Accuracy and Resolution of Spread Spectrum Time-Domain Reflectometry</atitle><jtitle>IEEE sensors letters</jtitle><stitle>LSENS</stitle><date>2019-06-01</date><risdate>2019</risdate><volume>3</volume><issue>6</issue><spage>1</spage><epage>4</epage><pages>1-4</pages><issn>2475-1472</issn><eissn>2475-1472</eissn><coden>ISLECD</coden><abstract>Reflectometry, which is commonly used for locating faults on electrical wires, produces sampled time domain signatures with peaks that are often missed due to this sampling. Resultant errors in these sampled peaks translate to errors in calculating the impedance and location of the fault. Typical signal processing methods to improve the accuracy of these sampled peaks have complexity on the order of O(N 2 ). For embedded fault location applications, algorithms with lower complexity are desired. In this article, we introduce three algorithms for improving the accuracy of the peak with a complexity of O(N). We evaluate these algorithms on the practical case of calculating the velocity of propagation and the characteristic impedance of a photovoltaic (PV) cable using spread spectrum time-domain reflectometry.</abstract><cop>Piscataway</cop><pub>IEEE</pub><doi>10.1109/LSENS.2019.2916636</doi><tpages>4</tpages><orcidid>https://orcid.org/0000-0001-8920-1498</orcidid><orcidid>https://orcid.org/0000-0002-7139-7231</orcidid><orcidid>https://orcid.org/0000-0002-4295-0851</orcidid><orcidid>https://orcid.org/0000-0003-1286-5557</orcidid><orcidid>https://orcid.org/0000000242950851</orcidid><orcidid>https://orcid.org/0000000189201498</orcidid><orcidid>https://orcid.org/0000000271397231</orcidid><orcidid>https://orcid.org/0000000312865557</orcidid><oa>free_for_read</oa></addata></record> |
| fulltext | fulltext_linktorsrc |
| identifier | ISSN: 2475-1472 |
| ispartof | IEEE sensors letters, 2019-06, Vol.3 (6), p.1-4 |
| issn | 2475-1472 2475-1472 |
| language | eng |
| recordid | cdi_proquest_journals_2296105593 |
| source | IEEE Electronic Library (IEL) |
| subjects | Accuracy Algorithms Complexity Complexity theory Fault location Impedance Interpolation Mathematical analysis OTHER INSTRUMENTATION Photovoltaic cells Propagation velocity Reflectometry resolution Sensor phenomena Signal processing Signal processing algorithms Solar cells Splines (mathematics) Spread spectrum spread spectrum time-domain reflectometry (SSTDR) Time domain analysis Wires |
| title | Postprocessing for Improved Accuracy and Resolution of Spread Spectrum Time-Domain Reflectometry |
| url | https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-01-26T06%3A30%3A06IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-proquest_RIE&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.genre=article&rft.atitle=Postprocessing%20for%20Improved%20Accuracy%20and%20Resolution%20of%20Spread%20Spectrum%20Time-Domain%20Reflectometry&rft.jtitle=IEEE%20sensors%20letters&rft.au=Jayakumar,%20Naveen%20Kumar%20Tumkur&rft.aucorp=Univ.%20of%20Utah,%20Salt%20Lake%20City,%20UT%20(United%20States)&rft.date=2019-06-01&rft.volume=3&rft.issue=6&rft.spage=1&rft.epage=4&rft.pages=1-4&rft.issn=2475-1472&rft.eissn=2475-1472&rft.coden=ISLECD&rft_id=info:doi/10.1109/LSENS.2019.2916636&rft_dat=%3Cproquest_RIE%3E2296105593%3C/proquest_RIE%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_pqid=2296105593&rft_id=info:pmid/&rft_ieee_id=8713593&rfr_iscdi=true |