Enhanced third order optical nonlinearity in ultrathin amorphous film of tetraphenyl-porphyrin in picosecond regime
[Display omitted] •Quality thin film of 5,10,15,20-Tetraphenyl-21H,23H-porphine (TPP) is fabricated.•The developed thin film exhibits excellent fluorescence emission.•TPP film depicts saturation absorption and self-defocusing optical nonlinearity.•The effective nonlinear absorption coefficient (βeff...
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creator | Clavian, L.M. Rajesh Kumar, P.C. Anil Kumar, K.V. Rao, D. Narayana Shihab, N.K. Ganesh, Sanjeev |
description | [Display omitted]
•Quality thin film of 5,10,15,20-Tetraphenyl-21H,23H-porphine (TPP) is fabricated.•The developed thin film exhibits excellent fluorescence emission.•TPP film depicts saturation absorption and self-defocusing optical nonlinearity.•The effective nonlinear absorption coefficient (βeff) is of the order of 10−6 m/W.•Thin film portrays enhanced NLR index (n2) of the order of 10−13 m2/W.
The third order optical nonlinearity of ultrathin 5, 10, 15, 20-Tetraphenyl-21H, 23H-porphine (TPP) films fabricated on an ultrasonically cleaned glass-substrate, by high vacuum thermal evaporation method is investigated. The powder X-ray diffraction (XRD) pattern demonstrates the amorphous nature of the fabricated thin film. The atomic force microscopy (AFM) and the field emission scanning electron microscope (FESEM) images show that the surface morphology of thin film composes of randomly oriented particles with the mean surface roughness of 17.73 nm. The structure of TPP thin film portrays a characteristic UV–Visible spectrum due to π-π* transitions in the porphyrin molecule. The photoluminescence spectroscopic study reveals that the TPP exhibits excellent fluorescence emission from S1 singlet excited state. The third order optical nonlinearity is studied using single beam Z-scan technique at 532 nm with picosecond pulsed (Δτ = 30 ps) laser. The TPP thin film exhibits saturation absorption property, with the effective two-photon absorption coefficient (βeff) of the order of 10−6 m/W. The observed nonlinear saturation absorption behavior is largely influenced by one-photon absorption due to the filling effect of the surface states and the localized defect states in the thin film. The closed aperture Z-scan study highlights the self-defocusing nature of the TPP thin film with negative nonlinear refractive index (n2) of the order of 10−13 m2/W. The enhanced n2 value is attributed to the highly polarizable structure of free base TPP molecule and modified electronic band structure due to the strong intermolecular interactions observed in the condensed state. |
doi_str_mv | 10.1016/j.optlastec.2019.105642 |
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•Quality thin film of 5,10,15,20-Tetraphenyl-21H,23H-porphine (TPP) is fabricated.•The developed thin film exhibits excellent fluorescence emission.•TPP film depicts saturation absorption and self-defocusing optical nonlinearity.•The effective nonlinear absorption coefficient (βeff) is of the order of 10−6 m/W.•Thin film portrays enhanced NLR index (n2) of the order of 10−13 m2/W.
The third order optical nonlinearity of ultrathin 5, 10, 15, 20-Tetraphenyl-21H, 23H-porphine (TPP) films fabricated on an ultrasonically cleaned glass-substrate, by high vacuum thermal evaporation method is investigated. The powder X-ray diffraction (XRD) pattern demonstrates the amorphous nature of the fabricated thin film. The atomic force microscopy (AFM) and the field emission scanning electron microscope (FESEM) images show that the surface morphology of thin film composes of randomly oriented particles with the mean surface roughness of 17.73 nm. The structure of TPP thin film portrays a characteristic UV–Visible spectrum due to π-π* transitions in the porphyrin molecule. The photoluminescence spectroscopic study reveals that the TPP exhibits excellent fluorescence emission from S1 singlet excited state. The third order optical nonlinearity is studied using single beam Z-scan technique at 532 nm with picosecond pulsed (Δτ = 30 ps) laser. The TPP thin film exhibits saturation absorption property, with the effective two-photon absorption coefficient (βeff) of the order of 10−6 m/W. The observed nonlinear saturation absorption behavior is largely influenced by one-photon absorption due to the filling effect of the surface states and the localized defect states in the thin film. The closed aperture Z-scan study highlights the self-defocusing nature of the TPP thin film with negative nonlinear refractive index (n2) of the order of 10−13 m2/W. The enhanced n2 value is attributed to the highly polarizable structure of free base TPP molecule and modified electronic band structure due to the strong intermolecular interactions observed in the condensed state.</description><identifier>ISSN: 0030-3992</identifier><identifier>EISSN: 1879-2545</identifier><identifier>DOI: 10.1016/j.optlastec.2019.105642</identifier><language>eng</language><publisher>Kidlington: Elsevier Ltd</publisher><subject>Absorptivity ; Apertures ; Atomic force microscopes ; Atomic force microscopy ; Defocusing ; Diffraction patterns ; Emission analysis ; Field emission microscopy ; Fluorescence ; Glass substrates ; High vacuum ; Molecular structure ; Morphology ; Nonlinear refraction ; Nonlinear saturation absorption ; Nonlinearity ; Photoluminescence ; Photon absorption ; Photons ; Photovoltaic cells ; Picosecond pulsed Z-scan technique ; Porphyrin ; Refractivity ; Saturation ; Surface chemistry ; Surface roughness ; Thermal evaporation technique ; Thin films ; Vacuum thermal evaporation ; Visible spectrum ; X ray powder diffraction</subject><ispartof>Optics and laser technology, 2019-11, Vol.119, p.105642, Article 105642</ispartof><rights>2019 Elsevier Ltd</rights><rights>Copyright Elsevier BV Nov 2019</rights><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c273t-f4c9c162609c573628a928ad33d92c32cf559951f98c3afc13c4aaed7354295f3</citedby><cites>FETCH-LOGICAL-c273t-f4c9c162609c573628a928ad33d92c32cf559951f98c3afc13c4aaed7354295f3</cites></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://dx.doi.org/10.1016/j.optlastec.2019.105642$$EHTML$$P50$$Gelsevier$$H</linktohtml><link.rule.ids>314,776,780,3536,27903,27904,45974</link.rule.ids></links><search><creatorcontrib>Clavian, L.M.</creatorcontrib><creatorcontrib>Rajesh Kumar, P.C.</creatorcontrib><creatorcontrib>Anil Kumar, K.V.</creatorcontrib><creatorcontrib>Rao, D. Narayana</creatorcontrib><creatorcontrib>Shihab, N.K.</creatorcontrib><creatorcontrib>Ganesh, Sanjeev</creatorcontrib><title>Enhanced third order optical nonlinearity in ultrathin amorphous film of tetraphenyl-porphyrin in picosecond regime</title><title>Optics and laser technology</title><description>[Display omitted]
•Quality thin film of 5,10,15,20-Tetraphenyl-21H,23H-porphine (TPP) is fabricated.•The developed thin film exhibits excellent fluorescence emission.•TPP film depicts saturation absorption and self-defocusing optical nonlinearity.•The effective nonlinear absorption coefficient (βeff) is of the order of 10−6 m/W.•Thin film portrays enhanced NLR index (n2) of the order of 10−13 m2/W.
The third order optical nonlinearity of ultrathin 5, 10, 15, 20-Tetraphenyl-21H, 23H-porphine (TPP) films fabricated on an ultrasonically cleaned glass-substrate, by high vacuum thermal evaporation method is investigated. The powder X-ray diffraction (XRD) pattern demonstrates the amorphous nature of the fabricated thin film. The atomic force microscopy (AFM) and the field emission scanning electron microscope (FESEM) images show that the surface morphology of thin film composes of randomly oriented particles with the mean surface roughness of 17.73 nm. The structure of TPP thin film portrays a characteristic UV–Visible spectrum due to π-π* transitions in the porphyrin molecule. The photoluminescence spectroscopic study reveals that the TPP exhibits excellent fluorescence emission from S1 singlet excited state. The third order optical nonlinearity is studied using single beam Z-scan technique at 532 nm with picosecond pulsed (Δτ = 30 ps) laser. The TPP thin film exhibits saturation absorption property, with the effective two-photon absorption coefficient (βeff) of the order of 10−6 m/W. The observed nonlinear saturation absorption behavior is largely influenced by one-photon absorption due to the filling effect of the surface states and the localized defect states in the thin film. The closed aperture Z-scan study highlights the self-defocusing nature of the TPP thin film with negative nonlinear refractive index (n2) of the order of 10−13 m2/W. The enhanced n2 value is attributed to the highly polarizable structure of free base TPP molecule and modified electronic band structure due to the strong intermolecular interactions observed in the condensed state.</description><subject>Absorptivity</subject><subject>Apertures</subject><subject>Atomic force microscopes</subject><subject>Atomic force microscopy</subject><subject>Defocusing</subject><subject>Diffraction patterns</subject><subject>Emission analysis</subject><subject>Field emission microscopy</subject><subject>Fluorescence</subject><subject>Glass substrates</subject><subject>High vacuum</subject><subject>Molecular structure</subject><subject>Morphology</subject><subject>Nonlinear refraction</subject><subject>Nonlinear saturation absorption</subject><subject>Nonlinearity</subject><subject>Photoluminescence</subject><subject>Photon absorption</subject><subject>Photons</subject><subject>Photovoltaic cells</subject><subject>Picosecond pulsed Z-scan technique</subject><subject>Porphyrin</subject><subject>Refractivity</subject><subject>Saturation</subject><subject>Surface chemistry</subject><subject>Surface roughness</subject><subject>Thermal evaporation technique</subject><subject>Thin films</subject><subject>Vacuum thermal evaporation</subject><subject>Visible spectrum</subject><subject>X ray powder diffraction</subject><issn>0030-3992</issn><issn>1879-2545</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2019</creationdate><recordtype>article</recordtype><recordid>eNqFkE1LAzEQhoMoWKu_wYDnrfnY7DbHIn5BwYueQ5id2JRtsiap0H9vSsWrMMPAzDvvMA8ht5wtOOPd_XYRpzLaXBAWgnFdu6prxRmZ8WWvG6FadU5mjEnWSK3FJbnKecsYazslZyQ_ho0NgAMtG58GGtOAiVZHD3akIYbRB7TJlwP1ge7HkmwVBmp3MU2buM_U-XFHo6MF62zaYDiMzXQcHlLV1Zg8xIwQw0ATfvodXpMLZ8eMN791Tj6eHt8fXpr12_Prw2rdgOhlaVwLGngnOqZB9bITS6trDlIOWoAU4JTSWnGnlyCtAy6htRaHXqpWaOXknNydfKcUv_aYi9nGfQr1pBFiKSVn1bqq-pMKUsw5oTNT8jubDoYzcyRstuaPsDkSNifCdXN12sT6xLfHZDJ4PML0CaGYIfp_PX4AgECLeQ</recordid><startdate>201911</startdate><enddate>201911</enddate><creator>Clavian, L.M.</creator><creator>Rajesh Kumar, P.C.</creator><creator>Anil Kumar, K.V.</creator><creator>Rao, D. Narayana</creator><creator>Shihab, N.K.</creator><creator>Ganesh, Sanjeev</creator><general>Elsevier Ltd</general><general>Elsevier BV</general><scope>AAYXX</scope><scope>CITATION</scope><scope>7SP</scope><scope>7U5</scope><scope>8FD</scope><scope>F28</scope><scope>FR3</scope><scope>H8D</scope><scope>L7M</scope></search><sort><creationdate>201911</creationdate><title>Enhanced third order optical nonlinearity in ultrathin amorphous film of tetraphenyl-porphyrin in picosecond regime</title><author>Clavian, L.M. ; Rajesh Kumar, P.C. ; Anil Kumar, K.V. ; Rao, D. Narayana ; Shihab, N.K. ; Ganesh, Sanjeev</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c273t-f4c9c162609c573628a928ad33d92c32cf559951f98c3afc13c4aaed7354295f3</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2019</creationdate><topic>Absorptivity</topic><topic>Apertures</topic><topic>Atomic force microscopes</topic><topic>Atomic force microscopy</topic><topic>Defocusing</topic><topic>Diffraction patterns</topic><topic>Emission analysis</topic><topic>Field emission microscopy</topic><topic>Fluorescence</topic><topic>Glass substrates</topic><topic>High vacuum</topic><topic>Molecular structure</topic><topic>Morphology</topic><topic>Nonlinear refraction</topic><topic>Nonlinear saturation absorption</topic><topic>Nonlinearity</topic><topic>Photoluminescence</topic><topic>Photon absorption</topic><topic>Photons</topic><topic>Photovoltaic cells</topic><topic>Picosecond pulsed Z-scan technique</topic><topic>Porphyrin</topic><topic>Refractivity</topic><topic>Saturation</topic><topic>Surface chemistry</topic><topic>Surface roughness</topic><topic>Thermal evaporation technique</topic><topic>Thin films</topic><topic>Vacuum thermal evaporation</topic><topic>Visible spectrum</topic><topic>X ray powder diffraction</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Clavian, L.M.</creatorcontrib><creatorcontrib>Rajesh Kumar, P.C.</creatorcontrib><creatorcontrib>Anil Kumar, K.V.</creatorcontrib><creatorcontrib>Rao, D. Narayana</creatorcontrib><creatorcontrib>Shihab, N.K.</creatorcontrib><creatorcontrib>Ganesh, Sanjeev</creatorcontrib><collection>CrossRef</collection><collection>Electronics & Communications Abstracts</collection><collection>Solid State and Superconductivity Abstracts</collection><collection>Technology Research Database</collection><collection>ANTE: Abstracts in New Technology & Engineering</collection><collection>Engineering Research Database</collection><collection>Aerospace Database</collection><collection>Advanced Technologies Database with Aerospace</collection><jtitle>Optics and laser technology</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Clavian, L.M.</au><au>Rajesh Kumar, P.C.</au><au>Anil Kumar, K.V.</au><au>Rao, D. Narayana</au><au>Shihab, N.K.</au><au>Ganesh, Sanjeev</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Enhanced third order optical nonlinearity in ultrathin amorphous film of tetraphenyl-porphyrin in picosecond regime</atitle><jtitle>Optics and laser technology</jtitle><date>2019-11</date><risdate>2019</risdate><volume>119</volume><spage>105642</spage><pages>105642-</pages><artnum>105642</artnum><issn>0030-3992</issn><eissn>1879-2545</eissn><abstract>[Display omitted]
•Quality thin film of 5,10,15,20-Tetraphenyl-21H,23H-porphine (TPP) is fabricated.•The developed thin film exhibits excellent fluorescence emission.•TPP film depicts saturation absorption and self-defocusing optical nonlinearity.•The effective nonlinear absorption coefficient (βeff) is of the order of 10−6 m/W.•Thin film portrays enhanced NLR index (n2) of the order of 10−13 m2/W.
The third order optical nonlinearity of ultrathin 5, 10, 15, 20-Tetraphenyl-21H, 23H-porphine (TPP) films fabricated on an ultrasonically cleaned glass-substrate, by high vacuum thermal evaporation method is investigated. The powder X-ray diffraction (XRD) pattern demonstrates the amorphous nature of the fabricated thin film. The atomic force microscopy (AFM) and the field emission scanning electron microscope (FESEM) images show that the surface morphology of thin film composes of randomly oriented particles with the mean surface roughness of 17.73 nm. The structure of TPP thin film portrays a characteristic UV–Visible spectrum due to π-π* transitions in the porphyrin molecule. The photoluminescence spectroscopic study reveals that the TPP exhibits excellent fluorescence emission from S1 singlet excited state. The third order optical nonlinearity is studied using single beam Z-scan technique at 532 nm with picosecond pulsed (Δτ = 30 ps) laser. The TPP thin film exhibits saturation absorption property, with the effective two-photon absorption coefficient (βeff) of the order of 10−6 m/W. The observed nonlinear saturation absorption behavior is largely influenced by one-photon absorption due to the filling effect of the surface states and the localized defect states in the thin film. The closed aperture Z-scan study highlights the self-defocusing nature of the TPP thin film with negative nonlinear refractive index (n2) of the order of 10−13 m2/W. The enhanced n2 value is attributed to the highly polarizable structure of free base TPP molecule and modified electronic band structure due to the strong intermolecular interactions observed in the condensed state.</abstract><cop>Kidlington</cop><pub>Elsevier Ltd</pub><doi>10.1016/j.optlastec.2019.105642</doi></addata></record> |
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subjects | Absorptivity Apertures Atomic force microscopes Atomic force microscopy Defocusing Diffraction patterns Emission analysis Field emission microscopy Fluorescence Glass substrates High vacuum Molecular structure Morphology Nonlinear refraction Nonlinear saturation absorption Nonlinearity Photoluminescence Photon absorption Photons Photovoltaic cells Picosecond pulsed Z-scan technique Porphyrin Refractivity Saturation Surface chemistry Surface roughness Thermal evaporation technique Thin films Vacuum thermal evaporation Visible spectrum X ray powder diffraction |
title | Enhanced third order optical nonlinearity in ultrathin amorphous film of tetraphenyl-porphyrin in picosecond regime |
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