In Situ Measurement of Fluid Film Thickness in Machining
A novel method using luminescent molecule sensors is described for in situ measurement of fluid film thickness along the tool rake face in machining. The method uses an optically transparent sapphire tool to access the rake face, and measurement of radiation emitted by luminescing molecules disperse...
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Veröffentlicht in: | Tribology letters 2007-10, Vol.28 (1), p.39-44 |
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creator | Huang, Chihyung Lee, Seongeyl Sullivan, John P. Chandrasekar, Srinivasan |
description | A novel method using luminescent molecule sensors is described for in situ measurement of fluid film thickness along the tool rake face in machining. The method uses an optically transparent sapphire tool to access the rake face, and measurement of radiation emitted by luminescing molecules dispersed in a machining fluid. By measuring the intensity of the emission, the film thickness is estimated. Implications for tool-chip contact boundary conditions and near-dry machining are discussed. |
doi_str_mv | 10.1007/s11249-007-9245-6 |
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The method uses an optically transparent sapphire tool to access the rake face, and measurement of radiation emitted by luminescing molecules dispersed in a machining fluid. By measuring the intensity of the emission, the film thickness is estimated. Implications for tool-chip contact boundary conditions and near-dry machining are discussed.</description><identifier>ISSN: 1023-8883</identifier><identifier>EISSN: 1573-2711</identifier><identifier>DOI: 10.1007/s11249-007-9245-6</identifier><language>eng</language><publisher>Dordrecht: Springer Nature B.V</publisher><subject>Boundary conditions ; Dry machining ; Film thickness ; In situ measurement ; Sapphire ; Tribology</subject><ispartof>Tribology letters, 2007-10, Vol.28 (1), p.39-44</ispartof><rights>Tribology Letters is a copyright of Springer, (2007). 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The method uses an optically transparent sapphire tool to access the rake face, and measurement of radiation emitted by luminescing molecules dispersed in a machining fluid. By measuring the intensity of the emission, the film thickness is estimated. Implications for tool-chip contact boundary conditions and near-dry machining are discussed.</description><subject>Boundary conditions</subject><subject>Dry machining</subject><subject>Film thickness</subject><subject>In situ measurement</subject><subject>Sapphire</subject><subject>Tribology</subject><issn>1023-8883</issn><issn>1573-2711</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2007</creationdate><recordtype>article</recordtype><sourceid>AFKRA</sourceid><sourceid>BENPR</sourceid><sourceid>CCPQU</sourceid><sourceid>DWQXO</sourceid><recordid>eNotkL1OwzAUhS0EEqXwAGyWmA2-_veIKgqVWjFQZstJbOrSOiVOBt6GZ-HJSFWm8w3n3iN9CN0CvQdK9UMBYMKSEYllQhJ1hiYgNSdMA5yPTBknxhh-ia5K2VI6Xhk5QXaRf3_eUj_gVfBl6MI-5B63Ec93Q2rwPO32eL1J9WcOpeCU8crXm5RT_rhGF9HvSrj5zyl6nz-tZy9k-fq8mD0uSc007wkIH4UBWsVGmIpZKppga8mUV5zbyEYyVVRMyegrCk1TVY0RWoG2gsrI-BTdnf4euvZrCKV323bo8jjpGDPANVdcji04tequLaUL0R26tPfdtwPqjobcyZA74tGQU_wPKO9Xuw</recordid><startdate>20071001</startdate><enddate>20071001</enddate><creator>Huang, Chihyung</creator><creator>Lee, Seongeyl</creator><creator>Sullivan, John P.</creator><creator>Chandrasekar, Srinivasan</creator><general>Springer Nature B.V</general><scope>AAYXX</scope><scope>CITATION</scope><scope>8FE</scope><scope>8FG</scope><scope>ABJCF</scope><scope>AFKRA</scope><scope>BENPR</scope><scope>BGLVJ</scope><scope>CCPQU</scope><scope>D1I</scope><scope>DWQXO</scope><scope>HCIFZ</scope><scope>KB.</scope><scope>L6V</scope><scope>M7S</scope><scope>PDBOC</scope><scope>PQEST</scope><scope>PQQKQ</scope><scope>PQUKI</scope><scope>PTHSS</scope></search><sort><creationdate>20071001</creationdate><title>In Situ Measurement of Fluid Film Thickness in Machining</title><author>Huang, Chihyung ; Lee, Seongeyl ; Sullivan, John P. ; Chandrasekar, Srinivasan</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c273t-14af4810bfd48b2904de9c526a6339f25268bf6265fab01ddbbd8476179405f23</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2007</creationdate><topic>Boundary conditions</topic><topic>Dry machining</topic><topic>Film thickness</topic><topic>In situ measurement</topic><topic>Sapphire</topic><topic>Tribology</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Huang, Chihyung</creatorcontrib><creatorcontrib>Lee, Seongeyl</creatorcontrib><creatorcontrib>Sullivan, John P.</creatorcontrib><creatorcontrib>Chandrasekar, Srinivasan</creatorcontrib><collection>CrossRef</collection><collection>ProQuest SciTech Collection</collection><collection>ProQuest Technology Collection</collection><collection>Materials Science & Engineering Collection</collection><collection>ProQuest Central UK/Ireland</collection><collection>ProQuest Central</collection><collection>Technology Collection</collection><collection>ProQuest One Community College</collection><collection>ProQuest Materials Science Collection</collection><collection>ProQuest Central Korea</collection><collection>SciTech Premium Collection</collection><collection>Materials Science Database</collection><collection>ProQuest Engineering Collection</collection><collection>Engineering Database</collection><collection>Materials Science Collection</collection><collection>ProQuest One Academic Eastern Edition (DO NOT USE)</collection><collection>ProQuest One Academic</collection><collection>ProQuest One Academic UKI Edition</collection><collection>Engineering Collection</collection><jtitle>Tribology letters</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Huang, Chihyung</au><au>Lee, Seongeyl</au><au>Sullivan, John P.</au><au>Chandrasekar, Srinivasan</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>In Situ Measurement of Fluid Film Thickness in Machining</atitle><jtitle>Tribology letters</jtitle><date>2007-10-01</date><risdate>2007</risdate><volume>28</volume><issue>1</issue><spage>39</spage><epage>44</epage><pages>39-44</pages><issn>1023-8883</issn><eissn>1573-2711</eissn><abstract>A novel method using luminescent molecule sensors is described for in situ measurement of fluid film thickness along the tool rake face in machining. 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subjects | Boundary conditions Dry machining Film thickness In situ measurement Sapphire Tribology |
title | In Situ Measurement of Fluid Film Thickness in Machining |
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