Nanoscale fretting wear study by scanning probe microscopy

Nanoscale fretting wear was studied by using scanning probe microscopy (SPM) and a newly proposed unified approach of slip index. The production of SiO2 colloidal probes and the SPM calibration are described. Partial and gross slip fretting with displacement amplitudes from 5 to 500 nm were used for...

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Veröffentlicht in:	Tribology letters 2005-04, Vol.18 (4), p.493-498
Hauptverfasser:	Varenberg, M., Etsion, I., Halperin, G.
Format:	Artikel
Sprache:	eng
Schlagworte:	Coefficient of friction Fretting Instrumentation industry Microscopes Microscopy Scanning probe microscopy Silicon dioxide Slip Tribology Wear
Online-Zugang:	Volltext
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