Comparison of low damage sputter deposition techniques to enable the application of very thin a-Si passivation films

Sputtering on passivating layers of silicon solar cells is often reported as a process that can harm the c-Si surface passivation quality. The loss of minority carrier lifetime and decrease in iVoc are related to a “sputter damage” of the passivation layer or more probably to the interface to the si...

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Bibliographische Detailangaben
Hauptverfasser: Linss, Volker, Bivour, Martin, Iwata, Hiroshi, Ortner, Kai
Format: Tagungsbericht
Sprache:eng
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