A Novel Eye-Diagram Estimation Method for Pulse Amplitude Modulation With N-Level (PAM-N) on Stacked Through-Silicon Vias
This paper, for the first time, proposed a novel eye-diagram estimation method for pulse amplitude modulation with N-level (PAM-N) signaling. For verification, a through-silicon via (TSV) channel was fabricated. Because the input of the proposed method is an insertion loss, the loss of the fabricate...
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Veröffentlicht in: | IEEE transactions on electromagnetic compatibility 2019-08, Vol.61 (4), p.1198-1206 |
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creator | Park, Junyong Jung, Daniel H. Kim, Byunggon Choi, Sumin Kim, Youngwoo Park, Shinyoung Park, Gapyeol Cho, Kyungjun Lee, Seongsoo Kim, Joungho |
description | This paper, for the first time, proposed a novel eye-diagram estimation method for pulse amplitude modulation with N-level (PAM-N) signaling. For verification, a through-silicon via (TSV) channel was fabricated. Because the input of the proposed method is an insertion loss, the loss of the fabricated TSV channel was measured up to 110 GHz. The estimated eye diagrams and measured eye diagrams were compared for the same TSV channel. The proposed method and measurements have nearly the same eye-height and eye-width values at data rates of 2, 4, and 8 Gb/s. Therefore, the proposed method successfully provides PAM-N's eye diagram with the insertion loss. Furthermore, bathtub curves were compared for the proposed method and measurements. The proposed method provides a bathtub curve up to 10-12, but in contrast, the measurements only provide a bathtub curve up to 10-5 due to a limited number of samples. Both of the bathtub curves are nearly the same up to 10-5 in amplitude. In conclusion, the eye-diagram estimation method for PAM-N signaling is successfully proposed and verified. |
doi_str_mv | 10.1109/TEMC.2018.2843813 |
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For verification, a through-silicon via (TSV) channel was fabricated. Because the input of the proposed method is an insertion loss, the loss of the fabricated TSV channel was measured up to 110 GHz. The estimated eye diagrams and measured eye diagrams were compared for the same TSV channel. The proposed method and measurements have nearly the same eye-height and eye-width values at data rates of 2, 4, and 8 Gb/s. Therefore, the proposed method successfully provides PAM-N's eye diagram with the insertion loss. Furthermore, bathtub curves were compared for the proposed method and measurements. The proposed method provides a bathtub curve up to 10-12, but in contrast, the measurements only provide a bathtub curve up to 10-5 due to a limited number of samples. Both of the bathtub curves are nearly the same up to 10-5 in amplitude. In conclusion, the eye-diagram estimation method for PAM-N signaling is successfully proposed and verified.</description><identifier>ISSN: 0018-9375</identifier><identifier>EISSN: 1558-187X</identifier><identifier>DOI: 10.1109/TEMC.2018.2843813</identifier><identifier>CODEN: IEMCAE</identifier><language>eng</language><publisher>New York: IEEE</publisher><subject><![CDATA[Amplitudes ; Estimation ; Eye diagram ; eye-diagram estimation ; Insertion loss ; Integrated circuits ; Interconnections ; multilevel signaling ; Optical signal processing ; PAM with <named-content xmlns:xlink="http://www.w3.org/1999/xlink" xmlns:ali="http://www.niso.org/schemas/ali/1.0/" xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xsi="http://www.w3.org/2001/XMLSchema-instance" content-type="math" xlink:type="simple"> <inline-formula> <tex-math notation="LaTeX"> N</tex-math> </inline-formula> </named-content>-level (PAM-N) ; Probability density function ; Pulse amplitude modulation ; pulse amplitude modulation (PAM) ; Signaling ; Silicon ; single bit response (SBR) ; through-silicon via (TSV) ; Through-silicon vias ; Throughput ; Time-domain analysis]]></subject><ispartof>IEEE transactions on electromagnetic compatibility, 2019-08, Vol.61 (4), p.1198-1206</ispartof><rights>Copyright The Institute of Electrical and Electronics Engineers, Inc. (IEEE) 2019</rights><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c293t-1e69c232d69af03972647035b69b3024130d4225860a6a3c773e07374a00c6513</citedby><cites>FETCH-LOGICAL-c293t-1e69c232d69af03972647035b69b3024130d4225860a6a3c773e07374a00c6513</cites><orcidid>0000-0001-9060-6687 ; 0000-0003-2720-7573 ; 0000-0002-5446-1799 ; 0000-0003-4589-8099 ; 0000-0001-7508-9626 ; 0000-0001-6920-0332 ; 0000-0003-1376-0781 ; 0000-0003-1344-0665 ; 0000-0003-0096-2296</orcidid></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://ieeexplore.ieee.org/document/8390482$$EHTML$$P50$$Gieee$$H</linktohtml><link.rule.ids>314,777,781,793,27905,27906,54739</link.rule.ids><linktorsrc>$$Uhttps://ieeexplore.ieee.org/document/8390482$$EView_record_in_IEEE$$FView_record_in_$$GIEEE</linktorsrc></links><search><creatorcontrib>Park, Junyong</creatorcontrib><creatorcontrib>Jung, Daniel H.</creatorcontrib><creatorcontrib>Kim, Byunggon</creatorcontrib><creatorcontrib>Choi, Sumin</creatorcontrib><creatorcontrib>Kim, Youngwoo</creatorcontrib><creatorcontrib>Park, Shinyoung</creatorcontrib><creatorcontrib>Park, Gapyeol</creatorcontrib><creatorcontrib>Cho, Kyungjun</creatorcontrib><creatorcontrib>Lee, Seongsoo</creatorcontrib><creatorcontrib>Kim, Joungho</creatorcontrib><title>A Novel Eye-Diagram Estimation Method for Pulse Amplitude Modulation With N-Level (PAM-N) on Stacked Through-Silicon Vias</title><title>IEEE transactions on electromagnetic compatibility</title><addtitle>TEMC</addtitle><description>This paper, for the first time, proposed a novel eye-diagram estimation method for pulse amplitude modulation with N-level (PAM-N) signaling. For verification, a through-silicon via (TSV) channel was fabricated. Because the input of the proposed method is an insertion loss, the loss of the fabricated TSV channel was measured up to 110 GHz. The estimated eye diagrams and measured eye diagrams were compared for the same TSV channel. The proposed method and measurements have nearly the same eye-height and eye-width values at data rates of 2, 4, and 8 Gb/s. Therefore, the proposed method successfully provides PAM-N's eye diagram with the insertion loss. Furthermore, bathtub curves were compared for the proposed method and measurements. The proposed method provides a bathtub curve up to 10-12, but in contrast, the measurements only provide a bathtub curve up to 10-5 due to a limited number of samples. Both of the bathtub curves are nearly the same up to 10-5 in amplitude. In conclusion, the eye-diagram estimation method for PAM-N signaling is successfully proposed and verified.</description><subject>Amplitudes</subject><subject>Estimation</subject><subject>Eye diagram</subject><subject>eye-diagram estimation</subject><subject>Insertion loss</subject><subject>Integrated circuits</subject><subject>Interconnections</subject><subject>multilevel signaling</subject><subject>Optical signal processing</subject><subject><![CDATA[PAM with <named-content xmlns:xlink="http://www.w3.org/1999/xlink" xmlns:ali="http://www.niso.org/schemas/ali/1.0/" xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xsi="http://www.w3.org/2001/XMLSchema-instance" content-type="math" xlink:type="simple"> <inline-formula> <tex-math notation="LaTeX"> N</tex-math> </inline-formula> </named-content>-level (PAM-N)]]></subject><subject>Probability density function</subject><subject>Pulse amplitude modulation</subject><subject>pulse amplitude modulation (PAM)</subject><subject>Signaling</subject><subject>Silicon</subject><subject>single bit response (SBR)</subject><subject>through-silicon via (TSV)</subject><subject>Through-silicon vias</subject><subject>Throughput</subject><subject>Time-domain analysis</subject><issn>0018-9375</issn><issn>1558-187X</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2019</creationdate><recordtype>article</recordtype><sourceid>RIE</sourceid><recordid>eNo9kEtPwzAQhC0EEqXwAxAXS1zg4OJHEifHqoSH1JRKLY-b5SZO45LWxXGQ-u9xlIrTamdnZqUPgGuCR4Tg5GGZZpMRxSQe0ThgMWEnYEDCMEYk5l-nYID9CSWMh-fgomk2fg1CygbgMIYz86tqmB4UetRybeUWpo3TW-m02cFMucoUsDQWztu6UXC83dfatYWCmSnaund9alfBGZqqruluPs7Q7B56feFk_q0KuKysadcVWuha517_0LK5BGel9I1XxzkE70_pcvKCpm_Pr5PxFOU0YQ4RFSU5ZbSIEllilnAaBRyzcBUlK4ZpQBguAkrDOMIykiznnCnMGQ8kxnkUEjYEt33v3pqfVjVObExrd_6loJR7RL6vc5HelVvTNFaVYm89A3sQBIuOsOgIi46wOBL2mZs-o5VS__6YJTiIKfsD2Bh0Zw</recordid><startdate>20190801</startdate><enddate>20190801</enddate><creator>Park, Junyong</creator><creator>Jung, Daniel H.</creator><creator>Kim, Byunggon</creator><creator>Choi, Sumin</creator><creator>Kim, Youngwoo</creator><creator>Park, Shinyoung</creator><creator>Park, Gapyeol</creator><creator>Cho, Kyungjun</creator><creator>Lee, Seongsoo</creator><creator>Kim, Joungho</creator><general>IEEE</general><general>The Institute of Electrical and Electronics Engineers, Inc. (IEEE)</general><scope>97E</scope><scope>RIA</scope><scope>RIE</scope><scope>AAYXX</scope><scope>CITATION</scope><scope>7SP</scope><scope>8FD</scope><scope>L7M</scope><orcidid>https://orcid.org/0000-0001-9060-6687</orcidid><orcidid>https://orcid.org/0000-0003-2720-7573</orcidid><orcidid>https://orcid.org/0000-0002-5446-1799</orcidid><orcidid>https://orcid.org/0000-0003-4589-8099</orcidid><orcidid>https://orcid.org/0000-0001-7508-9626</orcidid><orcidid>https://orcid.org/0000-0001-6920-0332</orcidid><orcidid>https://orcid.org/0000-0003-1376-0781</orcidid><orcidid>https://orcid.org/0000-0003-1344-0665</orcidid><orcidid>https://orcid.org/0000-0003-0096-2296</orcidid></search><sort><creationdate>20190801</creationdate><title>A Novel Eye-Diagram Estimation Method for Pulse Amplitude Modulation With N-Level (PAM-N) on Stacked Through-Silicon Vias</title><author>Park, Junyong ; Jung, Daniel H. ; Kim, Byunggon ; Choi, Sumin ; Kim, Youngwoo ; Park, Shinyoung ; Park, Gapyeol ; Cho, Kyungjun ; Lee, Seongsoo ; Kim, Joungho</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c293t-1e69c232d69af03972647035b69b3024130d4225860a6a3c773e07374a00c6513</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2019</creationdate><topic>Amplitudes</topic><topic>Estimation</topic><topic>Eye diagram</topic><topic>eye-diagram estimation</topic><topic>Insertion loss</topic><topic>Integrated circuits</topic><topic>Interconnections</topic><topic>multilevel signaling</topic><topic>Optical signal processing</topic><topic><![CDATA[PAM with <named-content xmlns:xlink="http://www.w3.org/1999/xlink" xmlns:ali="http://www.niso.org/schemas/ali/1.0/" xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xsi="http://www.w3.org/2001/XMLSchema-instance" content-type="math" xlink:type="simple"> <inline-formula> <tex-math notation="LaTeX"> N</tex-math> </inline-formula> </named-content>-level (PAM-N)]]></topic><topic>Probability density function</topic><topic>Pulse amplitude modulation</topic><topic>pulse amplitude modulation (PAM)</topic><topic>Signaling</topic><topic>Silicon</topic><topic>single bit response (SBR)</topic><topic>through-silicon via (TSV)</topic><topic>Through-silicon vias</topic><topic>Throughput</topic><topic>Time-domain analysis</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Park, Junyong</creatorcontrib><creatorcontrib>Jung, Daniel H.</creatorcontrib><creatorcontrib>Kim, Byunggon</creatorcontrib><creatorcontrib>Choi, Sumin</creatorcontrib><creatorcontrib>Kim, Youngwoo</creatorcontrib><creatorcontrib>Park, Shinyoung</creatorcontrib><creatorcontrib>Park, Gapyeol</creatorcontrib><creatorcontrib>Cho, Kyungjun</creatorcontrib><creatorcontrib>Lee, Seongsoo</creatorcontrib><creatorcontrib>Kim, Joungho</creatorcontrib><collection>IEEE All-Society Periodicals Package (ASPP) 2005-present</collection><collection>IEEE All-Society Periodicals Package (ASPP) 1998-Present</collection><collection>IEEE Electronic Library (IEL)</collection><collection>CrossRef</collection><collection>Electronics & Communications Abstracts</collection><collection>Technology Research Database</collection><collection>Advanced Technologies Database with Aerospace</collection><jtitle>IEEE transactions on electromagnetic compatibility</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>Park, Junyong</au><au>Jung, Daniel H.</au><au>Kim, Byunggon</au><au>Choi, Sumin</au><au>Kim, Youngwoo</au><au>Park, Shinyoung</au><au>Park, Gapyeol</au><au>Cho, Kyungjun</au><au>Lee, Seongsoo</au><au>Kim, Joungho</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>A Novel Eye-Diagram Estimation Method for Pulse Amplitude Modulation With N-Level (PAM-N) on Stacked Through-Silicon Vias</atitle><jtitle>IEEE transactions on electromagnetic compatibility</jtitle><stitle>TEMC</stitle><date>2019-08-01</date><risdate>2019</risdate><volume>61</volume><issue>4</issue><spage>1198</spage><epage>1206</epage><pages>1198-1206</pages><issn>0018-9375</issn><eissn>1558-187X</eissn><coden>IEMCAE</coden><abstract>This paper, for the first time, proposed a novel eye-diagram estimation method for pulse amplitude modulation with N-level (PAM-N) signaling. For verification, a through-silicon via (TSV) channel was fabricated. Because the input of the proposed method is an insertion loss, the loss of the fabricated TSV channel was measured up to 110 GHz. The estimated eye diagrams and measured eye diagrams were compared for the same TSV channel. The proposed method and measurements have nearly the same eye-height and eye-width values at data rates of 2, 4, and 8 Gb/s. Therefore, the proposed method successfully provides PAM-N's eye diagram with the insertion loss. Furthermore, bathtub curves were compared for the proposed method and measurements. The proposed method provides a bathtub curve up to 10-12, but in contrast, the measurements only provide a bathtub curve up to 10-5 due to a limited number of samples. Both of the bathtub curves are nearly the same up to 10-5 in amplitude. In conclusion, the eye-diagram estimation method for PAM-N signaling is successfully proposed and verified.</abstract><cop>New York</cop><pub>IEEE</pub><doi>10.1109/TEMC.2018.2843813</doi><tpages>9</tpages><orcidid>https://orcid.org/0000-0001-9060-6687</orcidid><orcidid>https://orcid.org/0000-0003-2720-7573</orcidid><orcidid>https://orcid.org/0000-0002-5446-1799</orcidid><orcidid>https://orcid.org/0000-0003-4589-8099</orcidid><orcidid>https://orcid.org/0000-0001-7508-9626</orcidid><orcidid>https://orcid.org/0000-0001-6920-0332</orcidid><orcidid>https://orcid.org/0000-0003-1376-0781</orcidid><orcidid>https://orcid.org/0000-0003-1344-0665</orcidid><orcidid>https://orcid.org/0000-0003-0096-2296</orcidid></addata></record> |
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subjects | Amplitudes Estimation Eye diagram eye-diagram estimation Insertion loss Integrated circuits Interconnections multilevel signaling Optical signal processing PAM with <named-content xmlns:xlink="http://www.w3.org/1999/xlink" xmlns:ali="http://www.niso.org/schemas/ali/1.0/" xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xsi="http://www.w3.org/2001/XMLSchema-instance" content-type="math" xlink:type="simple"> <inline-formula> <tex-math notation="LaTeX"> N</tex-math> </inline-formula> </named-content>-level (PAM-N) Probability density function Pulse amplitude modulation pulse amplitude modulation (PAM) Signaling Silicon single bit response (SBR) through-silicon via (TSV) Through-silicon vias Throughput Time-domain analysis |
title | A Novel Eye-Diagram Estimation Method for Pulse Amplitude Modulation With N-Level (PAM-N) on Stacked Through-Silicon Vias |
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